Discover how integrating micro-CT and plasma FIB-SEM enables multiscale 3D characterization of heterogeneous materials, linking structure, chemistry, and performance.
Learn how to reduce EBL stitching errors on a standard SEM using technological layers and smart write-field placement in a GDSII workflow.
Learn practical methods to estimate lamella thickness for TEM, including FIB-SEM transparency, EELS-based measurement, and X-mark polishing techniques.
An interview with Riley Tejcek on performance and safety, including how non-destructive X-ray CT supports materials inspection in demanding environments.
Dr. Tatiana Gorelik shares insights on 3D electron diffraction, data acquisition strategies, and how new instrumentation shapes crystallography research.
Carlyle and Shimadzu Corporation have signed an agreement under which Tescan would become part of Shimadzu, subject to regulatory and customary approvals. The transaction has not yet closed.
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