Micro-CT add-on | Built for Dynamic Quality
Own the Dynamic Quality standard
Panthera AI applies AI denoising to both 3D and 4D micro-CT datasets, reducing the noise penalty that typically accompanies fast or low-dose acquisitions. Whether operating on a single 3D volume or a full 3D + time dataset, Panthera AI selectively suppresses noise while preserving structural information, improving the signal-to-noise ratio (SNR) to support interpretation and quantification.
In dynamic (4D) experiments, Panthera AI can additionally leverage the time dimension to better differentiate true signals from random noise, keeping high-frame-rate scans clear enough for interpretation and quantification. In static (3D) imaging, this capability allows for shorter scans, lower doses, or higher throughput without sacrificing data quality. This means you can move from acquisition to decisions faster, without spending your time rescuing noisy datasets.
Panthera AI is available as an optional module in eligible configurations and upgrade packages, supporting both high-speed dynamic workflows and high-quality 3D micro-CT acquisitions.
Panthera AI is designed for researchers working with demanding datasets, whether capturing time-dependent phenomena where there is only one chance to observe the event, or accelerating conventional 3D scans where time, dose, or throughput is critical. In both cases, higher speed typically introduces noise that limits interpretability, weakens measurement confidence, and slows downstream analysis. Panthera AI directly addresses this trade-off by filtering noise at the data level, keeping fast acquisitions trustworthy.
This marks the shift from fast images to usable evidence. With Panthera AI, you can scan faster without the resulting data becoming noisy or unreliable. The result is speed that still supports visual interpretation, quantitative analysis, and reporting.
In doing so, Panthera AI strengthens continuity across the Dynamic-to-Detail workflow. By delivering cleaner dynamic datasets, it supports volume-of-interest-guided detector switching in multiple-detector architectures. This lets you capture a noise-reduced movie of the event and transition seamlessly to high-resolution inspection of the root cause, without removing the sample or breaking the in-situ chain.
Typical applications
In-situ mechanical testing: crack initiation, propagation, deformation
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Non-destructive spectral imaging for material verification and internal inspection of advanced electronic assemblies.
TrueContrast™ multi-energy imaging for differentiating polymers, metals, and encapsulants
K-edge detection for accurate identification of high-Z elements
Non-destructive visualization of interfaces and buried defects in electronic packages
Spectrum comparison tools for verifying material uniformity and contamination sources
Tescan Spectral CT delivers compositional insight where conventional micro-CT cannot. Engineers can distinguish packaging materials, solder alloys, and internal structures without sectioning or coating—supporting reliable failure analysis, design validation, and quality assurance across next-generation electronic devices.
Multi-energy micro-CT for elemental and structural differentiation in complex, multi-phase materials.
Elemental mapping for identifying fillers, dopants, or additives in polymer composites
Spectral contrast for distinguishing polymers, ceramics, and metals with similar densities
Non-destructive 3D analysis of internal interfaces and phase boundaries
Integrated Spectral Suite for correlating elemental and structural data in one workflow
In materials research, Spectral CT enables scientists to explore the relationship between structure and composition without destroying samples. Researchers can visualize distribution of additives, analyze composite uniformity, and study degradation pathways—supporting more reliable material design and performance assessment.
Full-spectrum micro-CT for 3D elemental and structural insight into geological samples.
Non-destructive 3D elemental mapping of rocks, ores, and mineral inclusions
K-edge detection for locating and identifying high-value or trace elements like gold or rare earth elements
Enhanced contrast for complex mineral assemblages and pore networks
Large-volume spectral scanning for full-core or fragment-scale analysis
For geoscientists and mining professionals, Spectral CT provides simultaneous elemental and structural data from intact samples. It supports mineral identification, ore classification, and recovery assessment—reducing dependency on destructive assays while preserving geological material for further study.
Tescan Spectral CT works seamlessly with SPECTRAL Suite and Acquila™ micro-CT control software to streamline spectral imaging from acquisition to analysis. Used as an add-on with the UniTOM XL platform, users can target volumes of interest, capture full-spectrum data, and visualize structural and elemental information in one workflow.
Researchers benefit from intuitive controls, guided reconstruction, and automated spectral processing. Spectral Suite handles spectrum matching, K-edge detection, and compositional mapping with minimal setup. This delivers consistent, reproducible results across samples and accelerates multi-energy micro-CT analysis.
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