Accelerating the Art
of Discovery
Accelerating the Art of Discovery
APPLICATIONS
Explore Material Science at Micro and Nano Scale with Precision
Analyze structure, defects and interfaces using FIB-SEM, STEM and micro-CT systems built to support every stage from R&D to production. Use these tools to ensure consistency throughout your workflow.
Accelerating science
SGS in Chile Celebrates Installation of the 100th Tescan TIMA Mineral Analyzer in high throughput configuration
SGS, a global leader in testing, inspection, and certification, has reached a major milestone in Automated Mineralogy. The company recently inaugurated Tescan TIMA #100 at its Santiago laboratory in Chile, reinforcing its position at the forefront of mineral characterization.
National CEMS Conference 2025: Tescan Highlights Innovation in Electron Microscopy
The 2025 National Conference on Electron Microscopy of China (National CEMS 2025), held from September 27–29, brought together more than 2,000 experts and scholars to discuss the latest advances in electron microscopy. Across 15 specialized sub-forums, participants explored topics ranging from foundational imaging principles to emerging interdisciplinary applications.
Accelerating Battery Innovation with Advanced Analytics
Accelerating Battery Innovation with Advanced Analytics, Tescan joined industry leaders to discuss how advanced microscopy technologies can drive innovation and scalability in lithium-ion battery manufacturing. Tescan and Dragonfly Energy are using advanced microscopy to accelerate lithium-ion battery innovation, watch the full recording from the Volta Foundation Battery Forum.
Tescan and Mikrolux at the 32nd Annual Meeting of the Croatian Microscopy Society
Tescan will join our Southeast Europe distributor Mikrolux at the Croatian Microscopy Society’s annual meeting in Zagreb. Hosted by the Faculty of Science, the event brings together microscopy professionals from across the region to exchange knowledge, explore new technologies, and strengthen collaboration.
Tescan On-Demand webinars
Let’s talk science. Watch our webinars to explore new ideas.
Discover the power
Scanning Electron Microscopes (SEM)
Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.
Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM)
Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Micro-computed tomography (microCT)
Tescan’s X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.
4D STEM
Tescan's TENSOR is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research.
Laser solutions
FemtoChisel is the next-generation femtosecond laser solution built specifically for semiconductor sample preparation and failure analysis. For too long, the industry has had to compromise between throughput, precision, and Surface Quality. Now all are delivered on one integrated platform.
Ex Situ Lift-Out Solutions
Tescan EXLO is designed for laboratories where TEM throughput, reproducibility, and cost efficiency matter. By moving specimen lift-out outside the FIB-SEM, EXLO keeps valuable beam time focused on milling, while parallelizing lamella transfer and grid mounting. The result: higher output, lower cost per specimen, and a more efficient workflow.
About Tescan
Decades of Progress, Just Getting Started
Since 1991, Tescan systems have been designed to feel seamless, intuitive, and built for real research. Think of us as reducing the coefficient of friction between question and discovery.
GET IN Touch
Explore the tool that helps you get answers
Tescan instruments are built to solve your research challenges - fast. Let’s find the right solution together.
Let’s find the right fit for your research
Talk to a Tescan expert about your goals - we’ll help you pinpoint the system and workflow that move your work forward.
Where can
you find us:
Tescan
Libušina třída 21
623 00 Brno
Czech Republic
info@tescan.com
