Python-based extensibility layer for Tescan 3D Viewer™ and Tescan Picannto™
Compox™ is the Python-based extensibility layer for Tescan 3D Viewer™ and Tescan Picannto™. It enables advanced users to connect custom algorithms, AI models, and specialized data-processing workflows directly to the application environment.
Instead of acting as an embedded Python interpreter, Compox™ serves as a bridge between external Python development environment and Tescan 3D software. Algorithms can be developed in the user’s own Python environment, packaged for deployment, and called from inside the application with defined inputs, outputs, and controllable parameters.
This allows custom methods to be applied to datasets already loaded in Tescan 3D Viewer™ or Tescan Picannto™, helping users extend segmentation, denoising, artifact reduction, measurement, or other domain-specific analysis workflows without rebuilding their entire toolchain.
Compox supports a more maintainable approach to custom development: algorithms can be reused, updated, versioned, and deployed across supported workflows. This helps research and industrial teams keep pace with evolving AI methods, scientific repositories, proprietary algorithms, and customer-specific processing requirements.
The Compox™ code is publicly available on GitHub, helping lower the barrier of entry for advanced users and development teams who want to build, adapt, and deploy custom tools for Tescan 3D Viewer™ and Tescan Picannto™. See the repository on GitHub.
Typical applications
Custom AI Segmentation Workflows
Integrate proprietary AI models or specialized segmentation methods into supported Tescan 3D software workflows, for example to segment specific materials, phases, tissues, or structures.
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Non-destructive spectral imaging for material verification and internal inspection of advanced electronic assemblies.
TrueContrast™ multi-energy imaging for differentiating polymers, metals, and encapsulants
K-edge detection for accurate identification of high-Z elements
Non-destructive visualization of interfaces and buried defects in electronic packages
Spectrum comparison tools for verifying material uniformity and contamination sources
Tescan Spectral CT delivers compositional insight where conventional micro-CT cannot. Engineers can distinguish packaging materials, solder alloys, and internal structures without sectioning or coating—supporting reliable failure analysis, design validation, and quality assurance across next-generation electronic devices.
Multi-energy micro-CT for elemental and structural differentiation in complex, multi-phase materials.
Elemental mapping for identifying fillers, dopants, or additives in polymer composites
Spectral contrast for distinguishing polymers, ceramics, and metals with similar densities
Non-destructive 3D analysis of internal interfaces and phase boundaries
Integrated Spectral Suite for correlating elemental and structural data in one workflow
In materials research, Spectral CT enables scientists to explore the relationship between structure and composition without destroying samples. Researchers can visualize distribution of additives, analyze composite uniformity, and study degradation pathways—supporting more reliable material design and performance assessment.
Full-spectrum micro-CT for 3D elemental and structural insight into geological samples.
Non-destructive 3D elemental mapping of rocks, ores, and mineral inclusions
K-edge detection for locating and identifying high-value or trace elements like gold or rare earth elements
Enhanced contrast for complex mineral assemblages and pore networks
Large-volume spectral scanning for full-core or fragment-scale analysis
For geoscientists and mining professionals, Spectral CT provides simultaneous elemental and structural data from intact samples. It supports mineral identification, ore classification, and recovery assessment—reducing dependency on destructive assays while preserving geological material for further study.
Tescan Spectral CT works seamlessly with SPECTRAL Suite and Acquila™ micro-CT control software to streamline spectral imaging from acquisition to analysis. Used as an add-on with the UniTOM XL platform, users can target volumes of interest, capture full-spectrum data, and visualize structural and elemental information in one workflow.
Researchers benefit from intuitive controls, guided reconstruction, and automated spectral processing. Spectral Suite handles spectrum matching, K-edge detection, and compositional mapping with minimal setup. This delivers consistent, reproducible results across samples and accelerates multi-energy micro-CT analysis.
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