WEBINAR | Your TEM lamella is thin. So why isn't the image as good as you want?

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See Where Tescan Is Making Headlines

Get a closer look at what’s happening at Tescan through the latest news, media coverage, and stories from across our global community.

Press releases

July 23, 2026

New CLARA™ SEM for Nanoscale Materials Characterization

Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.

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PRESS RELEASE
clara new launch
July 9, 2026
PRESS RELEASE

Tescan Joins Shimadzu Group to Accelerate Innovation

Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.

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March 19, 2026
PRESS RELEASE

Tescan Opens Korea Demo Lab for Semiconductor Analysis

Explore on-site demos at Tescan’s new scanning electron microscopy lab in Korea, supporting semiconductor, research, and university users with FIB-SEM expertise.

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January 5, 2026
PRESS RELEASE

Tescan Announces Agreement with Shimadzu Corporation

Carlyle and other shareholders agree to a potential sale of Tescan to Shimadzu Corporation, subject to regulatory approvals.

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All press releases

IN THE News

NEWS

Automated TEM Lamella Preparation with FIB-SEM | Tescan

Learn how FIB-SEM automation and gentle argon ion polishing improve TEM lamella quality, reduce preparation damage and support high-resolution analysis.

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NEWS

Tescan Collaboration Network Meeting 2026 Highlights

Explore highlights from the TCN Meeting and Tescan Technology Day 2026 in Brno, featuring microscopy demonstrations, research and collaboration.

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Interview

Tescan VEGA™ SEM | 소재 분석 및 품질 관리

Tescan VEGA™ SEM이 소재 분석, 품질 관리 및 고장 분석에 어떻게 활용되는지 알아보세요. 연구실을 위한 효율적인 분석 워크플로우를 소개합니다.

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NEWS

ISTFA 2026: Semiconductor Failure Analysis Highlights | Tescan

Explore Tescan highlights from ISTFA 2026, including AI-driven semiconductor failure analysis, FemtoChisel, 4D-STEM and integrated workflows.

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Your contact

Jana Silarova

Marketing Director

+420 778 788 844

jana.silarova@tescan.com 

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Tescan Brno
Libušina třída 21
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Czech Republic

info@tescan.com

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