New CLARA™ SEM for Nanoscale Materials Characterization
Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
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Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.
Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
Carlyle and other shareholders have entered into an agreement with Shimadzu Corporation that may result in a change in Tescan’s shareholding structure, subject to approvals.
Learn how SEM detectors use SE and BSE signals, angular filtering and energy filtering to control contrast and reveal material information.
Learn how multiscale imaging and electron microscopy improve materials characterization by revealing details from the macro to nanoscale.
See how Tescan CLARA™ SEM imaging reveals microstructural changes in cork stoppers after thermal aging in water and ethanol.
Learn how ultra-high-resolution SEM enables nanoscale imaging, low-voltage analysis and advanced materials characterization with Tescan MIRA XR.
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