New CLARA™ SEM for Nanoscale Materials Characterization
Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
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Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.
Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
Carlyle and other shareholders have entered into an agreement with Shimadzu Corporation that may result in a change in Tescan’s shareholding structure, subject to approvals.
Discover the new Cryo-EM solution for Tescan TENSOR™ with low-dose Cryo-STEM, Cryo-EDS, Cryo-4D STEM and Cryo-3D ED workflows.
Explore cryo-FIB-SEM, cryo lift-out and correlative microscopy workflows for targeting and preparing beam-sensitive biological samples.
Explore Tescan highlights from M&M 2026, including CLARA, AMBER X 2, TENSOR, UniTOM HR 2 and the FemtoChisel Innovation Award.
Discover how Tescan AMBER™ X supports diverse research workflows in an open-access microscopy facility using plasma FIB-SEM.
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