Tescan opens new Korea demo lab supporting semiconductor analysis
Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS
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Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
Carlyle and other shareholders have entered into an agreement with Shimadzu Corporation that may result in a change in Tescan’s shareholding structure, subject to approvals.
Tescan introduces the FemtoChisel femtosecond laser platform, delivering faster, more precise semiconductor sample preparation and integrated workflow performance.
Interview with Jean-Charles Chen, CEO of Tescan Group: Unveiling a New Era of Discovery
An interview on CEITEC Nano infrastructure, plasma FIB-SEM with SIMS, and advanced materials workflows using Tescan AMBER X 2.
Explore how Tescan TIMA™ enables automated mineral mapping and phase identification in geological samples from Kerguelen Island using advanced mineralogy workflows.
Learn how automated mineralogy and Tescan TIMA help mining teams make faster, decision-ready processing choices. Insights from mineralogist Braam Smit.
Discover how micro-CT supports embryology and fetal imaging in clinical environments. Insights from Bernadette de Bakker on 3D imaging, research, and care.
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