Ultra-High Resolution SEM for Confident, Multimodal Imaging

Tescan CLARA

Tescan CLARA is designed for researchers who need fast and reliable nanoscale imaging without compromising sample integrity. With BrightBeam™ field-free optics and In-Flight™ automation, CLARA delivers high-resolution, contrast-rich data across materials, battery, and life science applications. It simplifies complex imaging tasks and adapts to your workflow, so you can focus on results.

Ultra-high-resolution SEM with BrightBeam™ optics for enhanced low-keV performance

Multimodal contrast: topography and composition in one scan

In-Flight™ automation for fast, repeatable beam alignment and imaging

Wide Field Optics™ for seamless macro-to-nanoscale navigation

Integrated Raman or 3D volume imaging for correlative workflows

Where Tescan CLARA

Makes the Difference

High Resolution at Low Voltage

BrightBeam™ optics deliver field-free surface-sensitive imaging even below 1 keV, making them ideal for use with beam-sensitive, non-conductive, or magnetic samples.

Rich Contrast Selection

CLARA's in-column Multidetector and Axial detector capture topographic and material contrasts in a single scan. Energy-filtered BSE isolates surface-level material contrast, enhancing visibility of composition. Angular BSE filtering reveals contrast differences based on emission angle. This multimodal setup provides deeper insight into complex or layered materials.

Automation That Works for You

In-Flight™ Automated controls handle beam centering, focusing, and contrast optimization, reducing the number of manual steps required and improving consistency across sessions.

Correlative Imaging, Simplified

Combine SEM with Raman (TESCAN RISE) or Serial Block Face Imaging (SBFI) for integrated structural and spectral analysis without transferring your sample.

Built for Flexibility

CLARA's adaptable, user-friendly software GUI makes it easy for everyone to operate. Options like no-code workflow building, open scripting with full control, and a flexible, large analytical chamber make it a solution that can be adapted to emerging needs. It's an ideal solution for both industrial R&D and research laboratories.

Tescan CLARA Applications

Tescan CLARA in Materials Science

Precision imaging for structural and compositional insight

Image nanofibers and mesoporous materials without coating
Analyze fractured surfaces, grain orientation, and phase distribution
Perform EBSD and EDS for crystallographic and elemental analysis
Observe crack propagation and phase changes in real time
Correlate Raman and SEM data for deeper material understanding

Tescan CLARA in Battery Research

Surface-sensitive imaging for lithium and interface studies

Visualize lithium and SEI layers at low keV without damage
Assess separator pore structure and detect ionic transport defects
Analyze electrode interfaces and binder distribution with BSE
Identify post-cycling degradation: cracking, delamination, dendrites
Automate QA/QC with Image Snapper, VisualCoder™, and In-Flight™ Automated Controls

Tescan CLARA in Life Sciences

Sensitive imaging for hydrated and beam-sensitive samples

Capture ultra-high-resolution images at <1 keV without charging artefacts
Perform 3D ultrastructural analysis with SBFI and Array Tomography
Preserve native structure with cryo-compatible workflows
Use Essence™ software for guided or expert-level control

Tescan Imaging Software

Tescan ESSENCE™

Unified user interface for SEM control

Integrated imaging, navigation, and analytical routine
Task-focused workflows and multi-user layouts
Live 3D collision model for safe movements and collision protection
Automated beam alignments and autofocus

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Tescan CLARA

Technical specification

Electron Optics & Imaging
	Electron source	Schottky Field Emission Gun (FEG)
	Column	BrightBeam™ SEM column with in-column potential tube
	Resolution	8 nm @ 30 keV (STEM) 9 nm @ 15 keV 3 nm @ 1 keV 2 nm @ 1 keV with Beam Deceleration Technology 1.5 nm @ 500 eV
	Accelerating voltage	50 eV to 30 kV (<50 eV with Beam Deceleration Technology)
	Magnification	1× to 2,000,000
	Detectors	In-column Energy-filtered Multidetector In-column Axial Detector Everhart-Thornley chamber detector (E-T) Retractable BSE HADF R-STEM Chamber view (IR) camera Other optional detectors
	Vacuum System	High vacuum mode MultiVac™ for low vacuum mode (N₂ and H₂O up to 500 Pa) Automated aperture insertion
	Stage & Chamber	5-axis motorized stage (X, Y, Z, rotation, tilt) Max sample size: up to 335 × 280 × 133 mm Max load: up to 8 kg 20+ chamber ports for detector integration
	Software & Automation	TESCAN Essence™ interface with multi-user support In-Flight™ Automated Controls package In-Flight™ Beam Tracing for alignment Automated SEM column and Objective alignment (overnight automatics) Image Snapper VisualCoder™ (no-code automation) SEM Expert PI (Python scripting) Integrated workflows for imaging and analytics Other SW modules
	Navigation & Protection	Wide Field Optics™ for distortion-free navigation from 1× Essence™ 3D Collision Model for safe stage and detectors movement
	Analytical Integration	EDS (Energy Dispersive Spectroscopy) EBSD (Electron Backscatter Diffraction) Tensile and heating stages Raman spectroscopy
	Cryo-preparation and inert gas transfer systems Accessories	pA meter Integrated plasma cleaner (Decontaminator) Beam deceleration technology (BDT)* Active suspension Load locks* Chamber extensions for up to 12” wafers* Uninterruptible Power Supply (UPS) Electrostatic Beam Blanker * Tescan Essence™ EBL kit* Tescan Flow™EBL offline* Other devices upon request

Electron Optics & Imaging
Electron source	Schottky Field Emission Gun (FEG)
Column	BrightBeam™ SEM column with in-column potential tube
Resolution	8 nm @ 30 keV (STEM) 9 nm @ 15 keV 3 nm @ 1 keV 2 nm @ 1 keV with Beam Deceleration Technology 1.5 nm @ 500 eV
Accelerating voltage	50 eV to 30 kV (<50 eV with Beam Deceleration Technology)
Magnification	1× to 2,000,000
Detectors	In-column Energy-filtered Multidetector In-column Axial Detector Everhart-Thornley chamber detector (E-T) Retractable BSE HADF R-STEM Chamber view (IR) camera Other optional detectors
Vacuum System	High vacuum mode MultiVac™ for low vacuum mode (N₂ and H₂O up to 500 Pa) Automated aperture insertion
Stage & Chamber	5-axis motorized stage (X, Y, Z, rotation, tilt) Max sample size: up to 335 × 280 × 133 mm Max load: up to 8 kg 20+ chamber ports for detector integration
Software & Automation	TESCAN Essence™ interface with multi-user support In-Flight™ Automated Controls package In-Flight™ Beam Tracing for alignment Automated SEM column and Objective alignment (overnight automatics) Image Snapper VisualCoder™ (no-code automation) SEM Expert PI (Python scripting) Integrated workflows for imaging and analytics Other SW modules
Navigation & Protection	Wide Field Optics™ for distortion-free navigation from 1× Essence™ 3D Collision Model for safe stage and detectors movement
Analytical Integration	EDS (Energy Dispersive Spectroscopy) EBSD (Electron Backscatter Diffraction) Tensile and heating stages Raman spectroscopy
Cryo-preparation and inert gas transfer systems Accessories	pA meter Integrated plasma cleaner (Decontaminator) Beam deceleration technology (BDT)* Active suspension Load locks* Chamber extensions for up to 12” wafers* Uninterruptible Power Supply (UPS) Electrostatic Beam Blanker * Tescan Essence™ EBL kit* Tescan Flow™EBL offline* Other devices upon request

GET IN Touch

Where you can find us:

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic 

info@Tescan.com

Tescan CLARA

Where Tescan CLARA

Tescan CLARA Applications

Tescan Imaging Software

Tescan ESSENCE™

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Tescan CLARA

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