Ultra-High Resolution SEM for Confident, Multimodal Imaging

Tescan CLARA^™

Tescan CLARA^™ is designed for researchers who need fast and reliable nanoscale imaging without compromising sample integrity. With BrightBeam™ field-free optics and In-Flight™ automation, CLARA^™ delivers high-resolution, contrast-rich data across materials, battery, and life science applications. It simplifies complex imaging tasks and adapts to your workflow, so you can focus on results.

Ultra-high-resolution SEM with BrightBeam™ optics for enhanced low-keV performance

Multimodal contrast: topography and composition in one scan

In-Flight™ automation for fast, repeatable beam alignment and imaging

Wide Field Optics® for seamless macro-to-nanoscale navigation

Integrated Raman or 3D volume imaging for correlative workflows

Where Tescan CLARA™

Makes the Difference

High Resolution at Low Voltage

BrightBeam™ optics deliver field-free surface-sensitive imaging even below 1 keV, making them ideal for use with beam-sensitive, non-conductive, or magnetic samples.

Rich Contrast Selection

CLARA^™'s in-column Multidetector and Axial detector capture topographic and material contrasts in a single scan. Energy-filtered BSE isolates surface-level material contrast, enhancing visibility of composition. Angular BSE filtering reveals contrast differences based on take-off angle. This multimodal setup provides deeper insight into complex or layered materials.

Automation That Works for You

In-Flight™ Automated controls handle beam centering, focusing, and contrast optimization, reducing the number of manual steps required and improving consistency across sessions.

Correlative Imaging, Simplified

Combine SEM with Raman (Tescan RISE) or Serial Block Face Imaging (SBFI) for integrated spectral and structural analysis without transferring your sample.

Built for Flexibility

CLARA^™'s adaptable, user-friendly software GUI makes it easy for everyone to operate. Options like no-code workflow building, open scripting with full control, and a flexible, large analytical chamber make it a solution that can be adapted to emerging needs. It's an ideal solution for both industrial R&D and research laboratories.

Tescan CLARA Applications

Tescan CLARA in Materials Science

Precision imaging for structural and compositional insight

Image nanofibers and mesoporous materials without coating
Analyze fractured surfaces, grain orientation, and phase distribution
Perform EBSD and EDS for crystallographic and elemental analysis
Observe crack propagation and phase changes in real time
Correlate Raman and SEM data for deeper material understanding

Tescan CLARA in Battery Research

Surface-sensitive imaging for lithium and interface studies

Visualize lithium and SEI layers at low keV without damage
Assess separator pore structure and detect ionic transport defects
Analyze electrode interfaces and binder distribution with BSE
Identify post-cycling degradation: cracking, delamination, dendrites
Automate QA/QC with Image Snapper, VisualCoder™, and In-Flight™ Automated Controls

Tescan CLARA in Life Sciences

Sensitive imaging for hydrated and beam-sensitive samples

Capture ultra-high-resolution images at <1 keV without charging artefacts
Perform 3D ultrastructural analysis with SBFI and Array Tomography
Preserve native structure with cryo-compatible workflows
Use Essence™ software for guided or expert-level control

Tescan Imaging Software

Tescan ESSENCE™

Unified user interface for SEM control

Integrated imaging, navigation, and analytical routine
Task-focused workflows and multi-user layouts
Live 3D collision model for safe movements and collision protection
Automated beam alignments and autofocus

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Tescan CLARA™

Technical specification

Electron Optics
	Electron Beam Column	BrightBeam™ Field-Free UHR-SEM Column
	Electron Source	Schottky field electron emitter
	Electron Beam Resolution	1.5 nm @ 500 eV 1.3 nm @ 1 keV 1.2 nm @ 1 keV with sample bias (BDT) 0.9 nm @ 15 keV 0.8 nm @ 30 keV STEM
	Magnification	1x to 2,000,000x
	Electron Beam Landing Energy Range	50 eV - 30 keV (< 50 eV with BDT)
	Probe Current	2 pA – 400 nA (continuously adjustable)
Detectors
	Standard Detectors	E-T detector (Everhart-Thornley chamber detector) In-column Energy-Filtered Multidetector (MD) In-column Axial detector (Axial) Chamber View (IR) Camera
	Optional Detectors*	LE-BSE detector (low-energy, scintillator type, mot.) 4Q LE-BSE detector (low-energy, solid state, 4 quadrants, mot.) R-BSE detector (scintilator type, mot.) HADF R-STEM (BF, DF, HADF, mot.; holder for up to 8 grids) CL detectors Optical Navigation and Correlation Camera (ONCam) GSD (Gaseous Secondary Electron Detector)
	Optional Analyzers*	Tescan (Dual) Essence EDS (integrated) 3rd party EDS 3rd party EBSD 3rd party WDS Confocal Raman microscope with spectrometer (RISETM)
	Accessories	pA meter incl. touch alarm function Integrated Plasma Cleaner (Decontaminator)* Beam Deceleration Technology (BDT)* Electrostatic Beam Blanker* Electron Beam Lithography package* Load Lock (manual or motorized)* Stage Extensions and modifications*
Stage & Sample
	Chamber type	GM chamber (20+ ports)**
	Stage	Motorized, 5-axis compucentric stage
	X & Y axis travel range	130 mm
	Z-axis travel range	100 mm
	Rotation	Compucentric, 360° (continuous)
	Tilt range	Compucentric, -70° to +90°
	Max. specimen height	92 mm (133 mm without stage rotation)
	Max. specimen size	180 mm diameter with full XY moves, rotation, and no tilt (larger samples possible with limited stage travel and rotation)
	Maximum specimen weight	8,000 g (full XYZ moves) 1,000 g (full XYZRT moves)
Vacuum system
	Pump types	Oil-free
	Vacuum options	MultiVac mode (up to 500 Pa (N2 or H2O)
	*Optional and other detectors, analyzers and accessories available upon request	**Different chamber type available upon request

Electron Optics
Electron Beam Column	BrightBeam™ Field-Free UHR-SEM Column
Electron Source	Schottky field electron emitter
Electron Beam Resolution	1.5 nm @ 500 eV 1.3 nm @ 1 keV 1.2 nm @ 1 keV with sample bias (BDT) 0.9 nm @ 15 keV 0.8 nm @ 30 keV STEM
Magnification	1x to 2,000,000x
Electron Beam Landing Energy Range	50 eV - 30 keV (< 50 eV with BDT)
Probe Current	2 pA – 400 nA (continuously adjustable)
Detectors
Standard Detectors	E-T detector (Everhart-Thornley chamber detector) In-column Energy-Filtered Multidetector (MD) In-column Axial detector (Axial) Chamber View (IR) Camera
Optional Detectors*	LE-BSE detector (low-energy, scintillator type, mot.) 4Q LE-BSE detector (low-energy, solid state, 4 quadrants, mot.) R-BSE detector (scintilator type, mot.) HADF R-STEM (BF, DF, HADF, mot.; holder for up to 8 grids) CL detectors Optical Navigation and Correlation Camera (ONCam) GSD (Gaseous Secondary Electron Detector)
Optional Analyzers*	Tescan (Dual) Essence EDS (integrated) 3rd party EDS 3rd party EBSD 3rd party WDS Confocal Raman microscope with spectrometer (RISETM)
Accessories	pA meter incl. touch alarm function Integrated Plasma Cleaner (Decontaminator)* Beam Deceleration Technology (BDT)* Electrostatic Beam Blanker* Electron Beam Lithography package* Load Lock (manual or motorized)* Stage Extensions and modifications*
Stage & Sample
Chamber type	GM chamber (20+ ports)**
Stage	Motorized, 5-axis compucentric stage
X & Y axis travel range	130 mm
Z-axis travel range	100 mm
Rotation	Compucentric, 360° (continuous)
Tilt range	Compucentric, -70° to +90°
Max. specimen height	92 mm (133 mm without stage rotation)
Max. specimen size	180 mm diameter with full XY moves, rotation, and no tilt (larger samples possible with limited stage travel and rotation)
Maximum specimen weight	8,000 g (full XYZ moves) 1,000 g (full XYZRT moves)
Vacuum system
Pump types	Oil-free
Vacuum options	MultiVac mode (up to 500 Pa (N2 or H2O)
	*Optional and other detectors, analyzers and accessories available upon request	**Different chamber type available upon request

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Where can you find us:

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 30.052597 48.1485965 58.375799 54.663142 19.195447 56.975106 47.916997 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 33.600194 -12.08688 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.566531 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928

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Tescan CLARA™

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Tescan CLARA Applications

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Tescan ESSENCE™

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Tescan CLARA™

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Tescan CLARA^™

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