
Modern nanoscale characterization requires more than resolution alone.
CLARA™ is designed to help researchers extract multiple complementary contrasts from the same region of interest, revealing information that conventional imaging workflows can miss.
Through simultaneous ultra-high-resolution secondary electron (SE) and backscattered electron (BSE) imaging, combined with energy-filtered and angle-selective BSE detection, CLARA™ enables researchers to:
- Reveal fine surface topography
- Differentiate material phases and composition
- Detect near-surface contamination and buried structures
- Visualize orientation-sensitive features
- Reduce rescans and repeated measurements
- Move more quickly from imaging to interpretation
Unlike conventional UHR SEM workflows that require repeated acquisitions or detector switching, CLARA™ combines multiple complementary signals within a single platform and workflow.
True Multimodal Contrast at the Nanoscale
The redesigned MultiDetector™ and Axial detector enable flexible contrast selection for both surface-sensitive and material-sensitive imaging.
Energy-filtered BSE imaging helps reveal near-surface material differences and contamination that may remain hidden in conventional BSE workflows. Angular contrast selection further enhances the interpretation of topographic and compositional variation.
The result is richer nanoscale characterization from every acquisition.










