Navigate Samples Easily with Wide Field Optics™
Begin with a clear SEM overview at magnifications as low as 2×. Wide Field Optics™ supports fast, confident movement across large, complex, or tilted samples without switching to an optical camera.
Tescan VEGA SEM
Tescan VEGA Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and elemental composition analysis in a single window of TESCAN’s Essence™ software. This significantly simplifies acquisition of both morphological and elemental data from the sample, making VEGA SEM an efficient analytical solution for routine materials inspection in quality control,
failure analysis and research labs.
With intuitive navigation, dependable beam performance, and flexible detector options, VEGA provides reliable, user-friendly SEM for routine analytical work.
- Navigate large or complex samples effectively with Wide Field Optics™ providing a clear SEM overview at low magnification
- Correlate morphology and elemental composition with integrated Essence™ EDS.
- Maintain optimal imaging conditions automatically with In-Flight Beam Tracing™
- Image non-conductive or beam-sensitive samples using SingleVac™ or MultiVac with gaseous SE detection
- Protect detectors and samples with the Essence™ 3D Collision Model
Tescan VEGA in Materials Science
Reliable SEM imaging and microanalysis for diverse materials
- Perform detailed topography and morphology analysis using stable SE and BSE imaging
- Correlate morphology and composition instantly with fully integrated Essence™ EDS.
- Handle non-conductive or beam-sensitive samples using SingleVac™ or MultiVac low vacuum modes
- Support characterization across metals, ceramics, polymers, and composites with flexible detector configurations
Tescan VEGA enables researchers to investigate microstructures, defects, and composition efficiently across a wide range of materials. Consistent beam performance, intuitive navigation, and integrated EDS help users generate repeatable, actionable data for research and routine laboratory workflows.
Tescan VEGA in Industrial Inspection & Quality Control
Fast, dependable SEM workflows for routine inspection tasks
- Verify surface features and defects quickly with high-contrast SE/BSE imaging
- Assess coatings, interfaces, and fractures with stable imaging
- Perform rapid compositional checks using Essence™ EDS in the SEM window
- Inspect large or bulky samples supported by VEGA’s spacious GM chamber and wide stage travel
Quality control teams benefit from VEGA’s streamlined operation, rapid transitions between imaging and EDS, and dependable low-vacuum options for unprepared samples. VEGA supports repeatable inspections that reduce time-to-decision across manufacturing and failure-prevention workflows.
Tescan VEGA in Research & Multi-User Facilities
User-friendly SEM operation for shared environments
- Begin workflows easily with Wide Field Optics™ and low-magnification live navigation
- Simplify operation for all experience levels using customizable Essence™ software layouts
- Prevent hardware collisions with the real-time Essence™ 3D Collision Model
- Expand capabilities as research evolves with optional CL, advanced BSE detectors, and other extensions
VEGA supports academic, government, and institutional labs that require a reliable, flexible SEM for diverse projects and multiple users. Its balance of usability, analytical capability, and robust hardware makes it an ideal platform for teaching, training, and collaborative research.
UNIFIED CONTROL FOR IMAGING AND ANALYSIS
ESSENCE™ is the unified control graphical user interface for Tescan VEGA, bringing SEM imaging, EDS analysis, navigation, and system protection tools into a single interface. It keeps routine workflows efficient and consistent, whether used in materials research, industrial inspection, or multi-user facilities.
- Access spectra, elemental maps, and imaging data within a single integrated Essence™ contol interface
- Maintain consistent beam performance with In-Flight Beam Tracing™
- Navigate confidently using the real-time Essence™ 3D Collision Model to protect detectors and samples
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Technical specifications
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