Analytical STEM for Precession Assisted 4D STEM

Tescan TENSOR

Tescan TENSOR delivers fast, multimodal characterization of nanoscale morphological, chemical, and structural properties. It uses STEM imaging, EDS analysis, and advanced 4D-STEM as well as 3D-ED and STEM/EDS tomography workflows. Fully integrated beam precession provides enhanced quality of diffraction data that results in higher accuracy and precision of strain analysis and phase-orientation mapping measurements. With Tescan TENSOR you can make confident decisions with data you can trust.

Characterize samples by multiple modalities using BF/DF STEM imaging, EDS analysis, 3D STEM/EDS tomography, and advanced 4D-STEM and/or 3D-ED workflows.

Increase yield and reproducibility with automatic microscope alignments that are done in the background with no user intervention.

Boost productivity with high-speed, high-sensitivity detectors that maintain fast acquisition across all modalities.

Speed up 4D-STEM workflows with fast beam precession and on-the-fly data processing and analysis.

Improve diffraction data quality through fully integrated and synchronized beam precession.

Minimize contamination and preserve signal integrity in the near-UHV vacuum environment of the microscope.

Support users at every experience level with automation and guided workflows that optimize key parameters.

How TENSOR

Accelerates Productivity and Scientific Output

Navigate Samples Easily with the Specimen Overview Map

Begin every session with a clear view of your specimen. The overview map helps you locate regions of interest quickly and intuitively, so you can move across complex samples with confidence.

Work Seamlessly with Automatic Background Alignments

Maintain stable microscope conditions at all analytical modes without interruption. TENSOR performs alignments in the background, allowing you to focus on your analysis rather than manual setup.

Enhance Diffraction Data with One-Click Beam Precession

Improve diffraction pattern quality instantly. Beam precession is fully integrated and activated in a single click, including very robust automatic alignments, giving you cleaner, richer, and more interpretable data.

Streamline Experiments with Guided Measurement Workflows

Use predefined optical settings, automated alignments, and simple parameter controls to keep your workflow consistent. On-the-fly processing and analysis help you reach results faster.

Increase Throughput with High-Speed Acquisition

Collect data up to ten times faster and shorten your time to multimodal results by a factor of four. TENSOR helps you progress through demanding studies without delay.

Train New Users Quickly with Sample-Analysis Oriented Workflows

Support new researchers with intuitive and sample-analysis workflows with microscope setting presets, while microscope alignments and tuning are done automatically in the background. TENSOR reduces the learning curve so your team can become productive much sooner.

TENSOR Applications

for Characterization of Nanoparticles

TENSOR Applications for Characterization of Nanoparticles

Accurate structural and chemical insight at the nanoscale

Identify nanoscale structure and chemistry with combined STEM imaging, 4D-STEM mapping, and EDS elemental analysis
Resolve crystallographic grains and their orientation using nanobeam diffraction and precession-assisted 4D-STEM
Map elemental distributions within complex materials and nanoparticle systems using high-sensitivity EDX

Support advanced materials research across academic and industrial environments

TENSOR gives you the clarity needed to understand the underlying structural and compositional characteristics of materials and relate them to their physical and functional properties. Its multimodal analytical STEM workflows help you bring structure, chemistry, and crystallography together in one sample analysis session.

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Tescan TENSOR

Technical specification

TESCAN Tensor
	Acceleration voltage	100 kV for increased STEM contrast, higher EDX signal, and better dose-limited resolution in 30-120 nm thick samples.
	Beam blanking rate	1 MHz for clean separation of analytical signals in each pixel during fast beam scanning and data readout.
	Beam precession rate	72,000 Hz for unconstrained speed of precession-assisted 4D-STEM data acquisition enabling interactive sample analysis.
	Diffraction detector frame rate	4,500 fps for fast 4D-STEM and electron diffraction measurements.
	Beam precession angle	0.1°–3.0° to support and optimally enhance a wide range of electron diffraction measurements.
	Camera dynamic range	10⁷ for accurate detection of both weak and strong diffraction signals and increased ease-of-use without an otherwise needed beam stopper.
	Camera DQE(0) at 100 kV	>90% for high sensitivity and efficient electron detection using the counting mode.
	STEM resolution	2.8 Å for resolving atomic lattice and facilitate precise metrology calibration.
	Total EDS solid angle	2.0 srad for high-quality of acquired EDS data and elemental analysis.
	Vacuum in the sample area	~10⁻⁶ Pa (near-UHV) to minimize sample contamination and preserve the quality of acquired data.

TESCAN Tensor
Acceleration voltage	100 kV for increased STEM contrast, higher EDX signal, and better dose-limited resolution in 30-120 nm thick samples.
Beam blanking rate	1 MHz for clean separation of analytical signals in each pixel during fast beam scanning and data readout.
Beam precession rate	72,000 Hz for unconstrained speed of precession-assisted 4D-STEM data acquisition enabling interactive sample analysis.
Diffraction detector frame rate	4,500 fps for fast 4D-STEM and electron diffraction measurements.
Beam precession angle	0.1°–3.0° to support and optimally enhance a wide range of electron diffraction measurements.
Camera dynamic range	10⁷ for accurate detection of both weak and strong diffraction signals and increased ease-of-use without an otherwise needed beam stopper.
Camera DQE(0) at 100 kV	>90% for high sensitivity and efficient electron detection using the counting mode.
STEM resolution	2.8 Å for resolving atomic lattice and facilitate precise metrology calibration.
Total EDS solid angle	2.0 srad for high-quality of acquired EDS data and elemental analysis.
Vacuum in the sample area	~10⁻⁶ Pa (near-UHV) to minimize sample contamination and preserve the quality of acquired data.

GET IN Touch

Where you can find us:

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic 

info@Tescan.com

Tescan TENSOR

How TENSOR

TENSOR Applications

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Tescan TENSOR

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