WEBINAR | Up to 40% Faster Automated TEM Lamella Preparation with new Ga⁺ FIB Column

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TESCAN ORAGE 2 in Action: Smarter, Faster, and More Reliable TEM Lamella Preparation.

Discover how the new TESCAN ORAGE 2 FIB and its smarter, fully automated workflow turn challenging TEM lamella preparation into a simple, reliable routine.

The new TESCAN ORAGE 2 FIB is the next generation of TESCAN’s Ga⁺ FIB technology, delivering outstanding precision and significantly faster TEM lamella preparation without compromise in quality — now fully integrated into the SOLARIS 2 FIB-SEM platform.

Register for our webinar and learn how the new TESCAN ORAGE 2 FIB combines advanced automation and optimized Ga⁺ ion optics to overcome the challenges of preparing high-quality TEM lamellae from complex semiconductor structures such as 3D NAND and FinFET devices.

Time and Date

  • December 12,  AM and PM Session

Ideal for

  • Failure Analysis Engineers and Researchers working with advanced logic and memory devices face the challenge of localizing nanometer-scale defects across multiple layers and projections. 
  • Experts involved in TEM lamella preparation for complex 3D structures such as 3D NAND or the latest FinFET architectures 
  • FIB-SEM users eager to explore the latest innovations in automation and throughput for cutting-edge semiconductor sample preparation. 

What will you learn? 

  • Discover how the new TESCAN ORAGE 2 Ga⁺ FIB column delivers the precision and performance required to confidently prepare lamellae from complex 3D NAND and the latest FinFET structures. 
  • Explore how the advanced new Orage 2 achieves up to 40% faster TEM specimen preparation, boosting throughput and overall productivity.
  • Learn how the AI-driven TEM AutoPrep™ Pro streamlines the entire TEM workflow, saving operator time and ensuring consistent, high-quality results.
  • See how low-kv image clarity at 500 V ensures confident final polishing and reliable lamella quality

Time and Date

  • December 12,  AM and PM Session

About Webinar Host

Lukas Hladik 

Obsah obrázku Lidská tvář, osoba, košile/tričko, Brada

Popis byl vytvořen automaticky

Lukas is a Product Marketing Manager for FIB-SEM, characterization, and delayering/probing solutions for FA semiconductor R&D labs. He joined Tescan in 2012 as an application specialist for Plasma FIB-SEM platforms. All his work Tescan has been connected extensively with the worldwide semiconductor industry. Lukas has a Master’s degree in Physical Engineering and Nanotechnology from Brno University of Technology, Brno, Czech Republic. 

ORAGE 2 combines speed, precision, and automation to make advanced TEM lamella preparation faster, more accessible, and consistently reliable — helping every lab achieve more with less effort and downtime. 

 

 

 

Register For The Webinar

Download Whitepaper

Pairing Laser Ablation and Xe Plasma FIB-SEM: An Approach for Precise End-Pointing in Large-Scale Physical Failure Analysis in the Semiconductor Industry