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Tescan TIMA™

 

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Tescan TIMA
TIMA

Enhance mineralogical SEM analysis with Tescan TIMA™, a system for routine characterization in exploration, geometallurgy, and mineral processing. Multi-EDS acquisition, stable imaging, and built-in control deliver consistent quantitative data on mineral liberation, associations, and elemental distribution across diverse sample sets.

  • Achieve unattended, automated mineralogical acquisition with TIMA Online
  • Characterize particle and grain populations using adaptive analytical modes and multiple EDS detectors
  • Quantify mineral liberation, associations, and locking for process optimization
  • Evaluate elemental and mineralogical variability across size fractions and streams
  • Classify minerals accurately using robust mineral libraries
  • Streamline review and reporting with TIMA Offline and customizable workflows

HOW TESCAN TIMA™

ENHANCES SEM WORKFLOWS FOR MINERALOGY AND PROCESS ANALYSIS

Effortless Data Collection Through Automation

TIMA Online automates mineralogical acquisition, calibration, beam setup, and particle detection. This minimizes manual intervention and ensures that large batches of epoxy blocks or thin sections can be analyzed with consistent parameters.

High Throughput for Large Sample Sets

Advanced scanning modes, multi-EDS configurations, and spectral summing support rapid assessment of particle sizes, mineral phases, and distributions. This is suited for plant monitoring, variability studies, and high-volume testwork campaigns.

Accurate Mineral Identification Using Robust Spectral Data

Real-time EDS evaluation and extensive mineral library support enable confident recognition of trace and light-element-bearing phases. Adaptive analysis tools tailor acquisition to each mineral, improving classification accuracy.

Flexible Analysis Across Complex Textures

TIMA™’s particle and grain categorization tools quantify complex textural features, including rims, inclusions, veinlets, and disseminated mineral grains. These workflows support decision-making in grinding, separation, and concentration processes.

Consistent Reporting and Quality Assurance

Built-in QA/QC tools, automated calibration, and template-based workflows help maintain reproducibility across campaigns. This consistency is vital for reconciliation, metallurgical balancing, and comparative dataset evaluation.

Extensive Sample Capacity for Operational Efficiency

The optional extended chamber accommodates high-capacity holder, enabling users to process over 40 epoxy blocks in a single run. This supports continuous operation and reduces per-sample analysis time.

 

ESSENCE – MICROSCOPE CONTROL SOFTWARE

Unified Control for SEM Imaging and Microanalysis

Essence™ brings imaging, navigation and analytical tools into one environment, supporting clear, consistent SEM workflows for materials scientists and inspection teams. Its streamlined layout and automation features help users move efficiently from first navigation to final verification.

  • Access spectra, maps, and profiles directly in the SEM window using integrated Essence™ EDS.
  • Maintain stable imaging conditions with In-Flight™ automated routines
  • Protect detectors and samples using the real-time 3D Collision Model
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Tescan TIMA™

SELECTED TECHNICAL SPECIFICATIONS

Electron Optics 

Electron Beam Column 

FEG-SEM Column  

Electron Source 

Schottky field electron emitter 

Electron Beam Resolution 

1.2 nm @ 30 kV 

Magnification 

2x to 1,000,000x 

Electron Beam Landing Energy Range 

200 eV - 30 keV  

Probe Current 

2 pA – 400 nA (continuosly adjustable) 

Detectors 

Standard Detectors 

  • SE detector (Everhart-Thornley chamber detector)

  • Retractable scintillator-based BSE detector

  • Chamber View (IR) Camera

Optional Detectors* 

  • CL detectors

  • In-Beam SE 

  • In-Beam LE-BSE 

Optional Analyzers* 

  • Essence EDS

  • 3rd party EDS

  • 3rd party EBSD

  • 3rd party WDS

  • Confocal Raman microscope with spectrometer (RISETM)

Chamber type 

LM chamber version 
  • Standard holder for 7 x 30mm samples
  • Additional holder options available upon request

GM chamber version 

  • Standard holder for 15 x 30mm samples

  • Additional holder options available upon request
Tescan TIMA™ software

Licenses - standard package 
  • 1 online acquisition license installed on the SEM control PC
  • 2 offline data processing licenses for compatible external PCs

Core TIMA™ software capabilities 

  • Automated particle detection

  • Automated phase recognition and classification

  • Mineral association and liberation analysis

  • Element distribution maps

  • Particle and grain size distribution

  • Mineral mass and elemental deportment evaluation

  • Particle texture mapping

  • Automated bright phase detection
*Optional and other detectors, analyzers and accessories available upon request

Electron Optics 

Electron Beam Column 

FEG-SEM Column  

Electron Source 

Schottky field electron emitter 

Electron Beam Resolution 

1.2 nm @ 30 kV 

Magnification 

2x to 1,000,000x 

Electron Beam Landing Energy Range 

200 eV - 30 keV  

Probe Current 

2 pA – 400 nA (continuosly adjustable) 

Detectors 

Standard Detectors 

  • SE detector (Everhart-Thornley chamber detector)

  • Retractable scintillator-based BSE detector

  • Chamber View (IR) Camera

Optional Detectors* 

  • CL detectors

  • In-Beam SE 

  • In-Beam LE-BSE 

Optional Analyzers* 

  • Essence EDS

  • 3rd party EDS

  • 3rd party EBSD

  • 3rd party WDS

  • Confocal Raman microscope with spectrometer (RISETM)

Chamber type 

LM chamber version 
  • Standard holder for 7 x 30mm samples
  • Additional holder options available upon request

GM chamber version 

  • Standard holder for 15 x 30mm samples

  • Additional holder options available upon request

Tescan TIMA™ software

Licenses - standard package 
  • 1 online acquisition license installed on the SEM control PC
  • 2 offline data processing licenses for compatible external PCs

Core TIMA™ software capabilities 

  • Automated particle detection

  • Automated phase recognition and classification

  • Mineral association and liberation analysis

  • Element distribution maps

  • Particle and grain size distribution

  • Mineral mass and elemental deportment evaluation

  • Particle texture mapping

  • Automated bright phase detection
*Optional and other detectors, analyzers and accessories available upon request
TIMA 2

GET IN Touch

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Where can you find us: 

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 30.052597 48.1485965 58.375799 54.663142 19.195447 56.975106 47.916997 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 33.600194 -12.08688 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.566531 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928

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