Tescan announces the launch of Tescan CLARA™, the new generation of its ultra-high-resolution scanning electron microscope (SEM) developed to help researchers reveal more information from complex materials and nanoscale structures.
Building on the proven CLARA platform, the new generation of Tescan CLARA combines an enhanced electron column, Tescan's BrightBeam™ field-free SEM column technology, with advanced contrast capabilities. It delivers ultra-high-resolution imaging together with detailed material, surface, and topographical information, helping researchers move from observation to deeper understanding within a streamlined workflow.
Advanced Contrast for Deeper Material Insight
At the core of the new CLARA is the ability to extract complementary information from every sample.
What is difficult to distinguish in one image may become obvious in another. Different contrast methods reveal different aspects of the same feature, helping scientists uncover subtle details that might otherwise be overlooked. To provide these complementary perspectives, CLARA combines advanced back-scattered electron detection, angular separation of BSE signals, and energy-filtered BSE imaging. These contrast methods help reveal subtle differences in materials, interfaces, coatings, contamination, and near-surface structures that may be difficult to distinguish using conventional SEM imaging alone.
By acquiring different signals from the same region of interest, researchers can investigate sample morphology, composition, and surface characteristics with greater confidence.
Ultra-High-Resolution Imaging Across Challenging Samples
CLARA is designed for demanding materials science, nanotechnology, and advanced research applications.
Its field-free imaging design supports ultra-high-resolution observation at low beam energies, including the analysis of non-conductive and magnetic materials. Multiple detection modes provide complementary views of the sample while intuitive automation and navigation tools help users reach reliable imaging conditions faster.
The result is a versatile nanoscale characterization platform that combines high-resolution performance, advanced contrast, and efficient analytical workflows.
Submit Your Sample
Be part of a collaborative imaging study exploring how advanced SEM contrast can reveal details that conventional imaging may miss. Researchers and engineers are invited to submit challenging samples for evaluation.
Suitable samples may include battery materials, nanocomposites, porous materials, coated surfaces, powders, or structures where conventional BSE imaging provides limited information.
Selected participants will receive advanced SEM images, signal comparisons, and a brief expert interpretation.
Want to see the difference for yourself?
See the new CLARA in action
Join the Launch Webinar
Register for the CLARA introduction webinar to see how advanced contrast methods reveal complementary information from the same sample area, including hidden material details through advanced BSE filtering. The webinar also shows how CLARA delivers ultra-high-resolution imaging at low voltages for sensitive and complex samples, supports efficient workflows with automation and intuitive navigation, and enables simultaneous UHR SE and BSE imaging for deeper insight in a single scan.
Visit Tescan at M&M
See advanced contrast imaging demonstrations and discover whether your sample could benefit from complementary detection and energy-filtered BSE imaging. Visit us at M&M
Meet Tescan at IMC21
Discuss your application challenges directly with Tescan specialists and explore how advanced SEM contrast could support your work. Meet us at IMC21
Whether you submit a sample, join the webinar, or meet our specialists at an event, we invite you to explore how CLARA can help you reveal more from every sample.
Explore Related Resources
Tescan CLARA™
Ultra-high-resolution SEM for advanced materials analysis.
Submit Your Sample for Advanced Contrast SEM Analysis
Improve sample analysis with advanced SEM contrast.
