Tescan MIRA XR supports SEM workflows that rely on clarity, consistency and confident decision-making. Its BrightBeam™ optics, Axial detector, Wide Field Optics™ and Essence™ SW give materials scientists and inspection teams the accuracy they need from first image to final check.
Achieve smoother daily imaging with stable performance, clear navigation and efficient shifts between imaging and microanalysis.
Unified Control for SEM Imaging and Microanalysis
Essence™ brings imaging, navigation and analytical tools into one environment, supporting clear, consistent SEM workflows for materials scientists and inspection teams. Its streamlined layout and automation features help users move efficiently from first navigation to final verification.
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High-resolution SEM imaging across diverse material classes
Researchers rely on MIRA XR for precise imaging of microstructures, interfaces and defects in metals, ceramics, polymers and composites. The system maintains consistent beam performance and integrates SEM–EDS in one workspace, helping you move efficiently from first inspection to clear insight.
Fast, confident surface and compositional assessment
Inspection teams use MIRA XR to verify components, monitor manufacturing variation and identify failure modes. Reliable variable pressure imaging and short transitions between imaging and EDS support faster, more consistent evaluations.
SEM accessibility for shared environments
Universities and research centres choose MIRA XR for its balanced combination of usability, stability and analytical flexibility. It helps teams progress varied projects without compromising data quality or workflow efficiency.
