Events & webinars

Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.

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Upcoming Events

Upcoming Webinars

Past webinars

Upcoming Events

Feb 17

San Francisco, CA

Join Tescan at Photonics West

Tescan is exhibiting for the first time at SPIE Photonics West 2026, the world’s leading stage for photonics, laser technologies, and breakthrough optical innovation. We’re bringing our latest advancement, FemtoChisel, a femtosecond laser platform designed for ultra-precise micromachining and advanced material processing, directly to the global photonics community.

Feb 10

Austria

Tescan at iCT conference 2026

The iCT Conference 2026 will showcase the latest developments and proven methods in computed tomography, including non-destructive testing, 3D material characterisation, geometry determination, data evaluation, new algorithms, advanced CT methods, and innovations in detectors and X-ray sources. The program also features a presentation by Michiel Krols titled “Advancing In-Situ Micro-CT: High-Resolution Imaging Integrated Into Dynamic Workflows,” highlighting new possibilities for real-time, dynamic material analysis.

Upcoming Webinars

Past Webinars

Nov 28

High-Throughput, Ultra-High-Resolution SEM for Multi-User Environments

Tescan experts introduce Tescan MIRA XR – a high-performance scanning electron microscope designed for rapid, precise materials analysis and very good imaging quality in multi-user labs.

Nov 28

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nov 20

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

Oct 14

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Aug 28

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

Jul 15

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

Apr 15

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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