Events & webinars

Sep 02

Influence of In-Situ Heat Treatment on the Microstructure of Laser Powder Bed Fusion (LPBF) Processed PM23

Watch the on-demand webinar to explore how in-situ heat treatment and build conditions influence cracking, porosity, and microstructure in LPBF-processed PM23.

Aug 13

Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™

Access the on-demand webinar to discover how Tescan TENSOR™ enables low-dose cryo-STEM, cryo-EDS and cryo-4D-STEM analysis while helping preserve sensitive samples.

Jun 24

4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization

Watch the on-demand webinar to discover how event-based 4D-STEM helps improve sample screening, validate lamella quality before TEM transfer, and support faster, more confident microscopy workflows.

May 27

Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

In this on-demand webinar, Professor William Rickard presents correlated microanalytical workflows combining Automated Mineralogy, TIMA, FIB-SEM and SIMS for comprehensive particle characterization and isotopic analysis.

Apr 29

FemtoChisel™: Redefining Ultrafast Laser Processing

In the fast-paced semiconductor industry, the "time-to-data" bottleneck often lies in the transition from defect localization to high-resolution analysis. Traditional sample preparation can be slow, messy, and prone to heat damage - until now.

Apr 14

Improved TEM Specimen Quality and Lab Throughput with New AMBER 2 Ga⁺ FIB-SEM

Watch the recording to learn how improved beam performance, automation, and integrated gentle ion beam polishing support more consistent TEM specimen preparation, lower damage, and higher lab throughput.

Mar 31

Tailored Cryo-EM and Correlative Workflows for Challenging Biological Projects

In this on-demand webinar, the team from the Electron Microscopy Core Facility at IMG (Institute of Molecular Genetics of the Academy of Sciences) Prague shows how they approach technically demanding projects that require more than routine sample preparation and imaging.

Mar 17

Dynamic-to-Detail Micro-CT with Tescan UniTOM® HR 2

Tescan specialists show how Tescan UniTOM® HR 2 enables Dynamic-to-Detail micro-CT, allowing you to capture fast structural evolution and then investigate the same region in higher resolution without removing the sample.

Feb 26

Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies

Diamond is rapidly emerging as a key material for quantum technologies, driven by nitrogen-vacancy (NV) centers that enable optical readout and spin control with long coherence times at room temperature.

Feb 16

Sample Preparation Perfected: Reproducible Ultra-Thin TEM Lamellae with AMBER 2 and fully FIB-SEM integrated Aura™ Gentle Ion Beam

This webinar demonstrates how Tescan AMBERTM 2 FIB-SEM, combined with the fully integrated Aura™ Gentle Ion Beam, enables automated, high-quality TEM lamella preparation with reduced amorphization and improved consistency.

Jan 28

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Core facilities support many departments on the same instruments, often without growing staff or budgets. This session brings together SpinLab Katowice and TU Graz to share practical approaches to running multi-user microscopy and micro-CT environments with faster time to data, efficient training, and consistent performance.

Dec 16

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.

Nov 28

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nov 20

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

Oct 14

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Aug 28

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

Jul 15

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

Apr 15

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.