Sep 07
Serbia
ELMINA Conference
Covers electron microscopy applications in materials science and nanotechnology.
Events & webinars
Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.
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Upcoming Events
Sep 08
France
The European Focused Ion Beam Network (EU-FIB.net) 2026 workshop
Focused on FIB-SEM technologies, sample preparation, and nanoscale fabrication workflows.
Sep 13
Poland
Polish-Japanese Microscopy Seminar
A joint academic event focused on microscopy, imaging techniques, and materials analysis.
Sep 15
Croatia
Croatian Microscopy Congress
Regional microscopy conference covering SEM, TEM, and materials characterization.
Sep 21
Poland
Uni-Export Microscopy Event
Focused on electron microscopy solutions and applications for industrial and research users.
Sep 22
USA
2026 Tescan SEM User Schools
Get more from your Tescan scanning electron microscope with our 2026 Tescan SEM User Schools - immersive, hands-on training programs led by Tescan application experts.
Sep 23
Austria
Metallography Conference Leoben
Focused on metallography, materials analysis, and microstructure characterization techniques.
Oct 02
India
EMSI Conference – Electron Microscope Society of India
A key microscopy event focused on electron microscopy techniques, materials characterization, and imaging workflows across academic and industrial research.
Oct 04
USA
ISTFA 2026 (International Symposium for Testing and Failure Analysis)
Join us for the 52nd International Symposium for Testing and Failure Analysis (ISTFA) which is set to take place in San Antonio, Texas, from October 4-8, 2026.
Oct 07
Germany
13th Saxon TEM Preparation Meeting
Focused on TEM sample preparation techniques, workflows, and practical approaches for high-quality electron microscopy analysis.
Oct 13
Germany
IC User Symposium
A technical symposium for users working with microscopy and analytical systems, covering workflows, applications, and practical use cases in research and industry.
Oct 25
China
SIMS China Conference
Dedicated to secondary ion mass spectrometry (SIMS), surface analysis, and materials characterization, with applications in semiconductors and advanced materials.
Oct 27
Germany
Nano-BW Symposium – Nanotechnology Conference
Focus on nanotechnology research, nanoscale fabrication, and advanced materials, bringing together academia and industry experts.
Nov 03
USA
TUSA SEM User School – G4
A hands-on training focused on SEM operation, imaging techniques, and practical workflows for materials characterization and microscopy users.
Nov 30
France
GnMEBA Pédagogique Workshop
A workshop focused on electron microscopy education, sample preparation, and analytical techniques for academic and research environments.
Dec 06
United Kingdom
SEMT – Society of Electron Microscopy Technology
A microscopy-focused event covering electron microscopy techniques, imaging workflows, and applications in materials and life sciences.
Past Webinars
Aug 13
Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™
Access the on-demand webinar to discover how Tescan TENSOR™ enables low-dose cryo-STEM, cryo-EDS and cryo-4D-STEM analysis while helping preserve sensitive samples.
Jun 24
4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization
Watch the on-demand webinar to discover how event-based 4D-STEM helps improve sample screening, validate lamella quality before TEM transfer, and support faster, more confident microscopy workflows.
May 27
Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS
In this on-demand webinar, Professor William Rickard presents correlated microanalytical workflows combining Automated Mineralogy, TIMA, FIB-SEM and SIMS for comprehensive particle characterization and isotopic analysis.
Apr 29
FemtoChisel™: Redefining Ultrafast Laser Processing
In the fast-paced semiconductor industry, the "time-to-data" bottleneck often lies in the transition from defect localization to high-resolution analysis. Traditional sample preparation can be slow, messy, and prone to heat damage - until now.
Apr 14
Improved TEM Specimen Quality and Lab Throughput with New AMBER 2 Ga⁺ FIB-SEM
Watch the recording to learn how improved beam performance, automation, and integrated gentle ion beam polishing support more consistent TEM specimen preparation, lower damage, and higher lab throughput.
Mar 31
Tailored Cryo-EM and Correlative Workflows for Challenging Biological Projects
In this on-demand webinar, the team from the Electron Microscopy Core Facility at IMG (Institute of Molecular Genetics of the Academy of Sciences) Prague shows how they approach technically demanding projects that require more than routine sample preparation and imaging.
Mar 17
Dynamic-to-Detail Micro-CT with Tescan UniTOM® HR 2
Tescan specialists show how Tescan UniTOM® HR 2 enables Dynamic-to-Detail micro-CT, allowing you to capture fast structural evolution and then investigate the same region in higher resolution without removing the sample.
Feb 26
Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies
Diamond is rapidly emerging as a key material for quantum technologies, driven by nitrogen-vacancy (NV) centers that enable optical readout and spin control with long coherence times at room temperature.
Feb 16
Sample Preparation Perfected: Reproducible Ultra-Thin TEM Lamellae with AMBER 2 and fully FIB-SEM integrated Aura™ Gentle Ion Beam
This webinar demonstrates how Tescan AMBERTM 2 FIB-SEM, combined with the fully integrated Aura™ Gentle Ion Beam, enables automated, high-quality TEM lamella preparation with reduced amorphization and improved consistency.
Jan 28
From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials
Core facilities support many departments on the same instruments, often without growing staff or budgets. This session brings together SpinLab Katowice and TU Graz to share practical approaches to running multi-user microscopy and micro-CT environments with faster time to data, efficient training, and consistent performance.
Dec 16
Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column
Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.
Nov 28
Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2
Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.
Nov 20
Nanoscale Prototyping with Advanced SEM Capabilities
Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape
Oct 14
EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation
Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station
Aug 28
Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM
University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.
Jul 15
TESCAN TIMA Integration with Geometallurgy Test Programs
Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.
Apr 15
From Routine to Remarkable: Meet TESCAN MIRA XR
Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.