Events & webinars

Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.

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Upcoming Events

Upcoming Webinars

Past webinars

Upcoming Events

Feb 11

Seoul, South Korea

Visit Tescan at SEMICON Korea 2026

Tescan will exhibit at SEMICON Korea 2026 in Seoul, showcasing advanced solutions for semiconductor failure analysis and advanced packaging. Visit us at Booth D904 to explore how our integrated workflows accelerate time-to-data and improve yield

Feb 04

Czechia

Workshop on Advancing Materials Characterization: Integrating Electron Microscopy and Micro-CT Techniques

Společnost Tescan, přední výrobce elektronových mikroskopů, Vás ve spolupráci s Českým vysokým učením technickým v Praze srdečně zve na odborný workshop zaměřený na sdílení vědeckých zkušeností z akademického prostředí a propojení výzkumu s průmyslovou praxí.

Feb 10

Austria

Tescan at iCT conference 2026

The iCT Conference 2026 will showcase the latest developments and proven methods in computed tomography, including non-destructive testing, 3D material characterisation, geometry determination, data evaluation, new algorithms, advanced CT methods, and innovations in detectors and X-ray sources.

Upcoming Webinars

Jan 28

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Explore how leading European core facilities are leveraging advanced characterization workflows; From Plasma FIB-SEM analysis to computed (x-ray) tomography, to solve various research challenges.

Past Webinars

Dec 16

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.

Nov 28

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nov 20

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

Oct 14

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Aug 28

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

Jul 15

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

Apr 15

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

Discover more webinars

Events & webinars

Never miss a thing

Upcoming Events

Visit Tescan at SEMICON Korea 2026

Workshop on Advancing Materials Characterization: Integrating Electron Microscopy and Micro-CT Techniques

Tescan at iCT conference 2026

Upcoming Webinars

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Past Webinars

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Nanoscale Prototyping with Advanced SEM Capabilities

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

TESCAN TIMA Integration with Geometallurgy Test Programs

From Routine to Remarkable: Meet TESCAN MIRA XR

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