Events & webinars

Join Tescan and Dragonfly Energy at the Volta Foundation’s Battery Forum to discover how advanced imaging and micro-CT accelerate lithium-ion battery innovation.

FemtoChisel the first system where speed, quality, and correlation converge — accelerating inspection, failure analysis and targeted internal access, lowering cost-per-sample while handling the most heterogeneous materials in todays and tomorrow’s microelectronics. One platform, any sample, pristine results.

Learn how the new Tescan Orage™ 2 Ga⁺ FIB column combines higher milling speed, beam stability, and superior low keV image clarity to turn challenging TEM lamella preparation into a simple, reliable routine.

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.