Tescan STEM Systems with Integrated 4D Imaging & Diffraction

Discover Tescan TENSOR
Our Core STEM Solution

Explore nanoscale structure with clarity, speed, and confidence.

Tescan’s STEM solutions are purpose-built for advanced materials research, semiconductor analysis, and detailed nanoscale characterization. With integrated 4D-STEM, precession-assisted diffraction, and synchronized EDS workflows, our instruments deliver actionable insight with unmatched usability—whether you're mapping strain, analyzing phases, or accelerating failure analysis and R&D.

Tescan TENSOR

Analytical STEM platform with integrated 4D-STEM and electron diffraction workflows for advanced materials and semiconductor characterization.

Tescan TENSOR delivers fast, automated multimodal STEM imaging with built-in beam precession to improve accuracy in strain, orientation, and phase analysis. It supports live 4D-STEM data processing, precession-assisted diffraction, and standard STEM/EDS imaging—all within automated, reproducible workflows.

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Key benefits

Increases precision in advanced node characterization using precession-assisted 4D-STEM for accurate strain and orientation mapping.
Reduces operator variability with fully automated column alignments and guided workflows—ensuring reproducibility across shifts and sites.
Speeds up decision-making with live 4D-STEM data acquisition and real-time processing—minimizing downtime and post-processing delays.