
Scanning Electron Microscopes (SEM)
Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.
From the surface to the atomic scale—and deep inside complex materials—Tescan gives you the tools to see more, understand faster, and go further. Our imaging and analytical systems empower breakthroughs across materials science, semiconductors, batteries, life sciences, and natural resources.
Tescan’s SEM platforms provide high-resolution imaging and surface analysis with exceptional contrast, detail, and ease of use—ideal for materials research, quality control, and analytical applications.
Tescan FIB-SEM systems combine fast, precise milling with high-resolution imaging and advanced automation. Choose from Ga or Xe plasma FIB sources to match your needs in sample prep, prototyping, or failure analysis.
Tescan’s X-ray micro-CT systems deliver fast, high-resolution 3D and 4D imaging for non-destructive internal analysis. Dynamic in-situ capabilities and modular designs make them ideal for advanced research across materials, life sciences, and energy storage.
Tescan's TENSOR is the first 4D-STEM platform built for intuitive multimodal nanocharacterization, combining structural, morphological, and chemical insights in every scan. Real-time data processing, automation, and scripting support make it ideal for both routine and advanced research.
Tescan instruments are built to solve your research challenges - fast. Let’s find the right solution together.
Talk to a Tescan expert about your goals - we’ll help you pinpoint the system and workflow that move your work forward.
Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic
info@tescan.com