Tescan at IMC21: Four days of microscopy, discovery and collaboration

Tescan joined more than 3,000 researchers, microscopy specialists, and industry representatives at the 21st International Microscopy Congress in Liverpool. During four exhibition days at IMC21, the Tescan team shared advances in SEM, FIB-SEM, STEM, micro-CT, and femtosecond laser sample preparation, while learning more about the scientific questions and practical challenges shaping microscopy today. 

A Global Meeting Point for Microscopy 

Held every four years since 1954, the International Microscopy Congress is one of the major global events for microscopy and imaging. IMC21 marked the congress’s return to the UK for the first time since the 1950s.

Across seven days of congress and pre-congress activity, the event combined scientific symposia, workshops, poster sessions, the IFSM Young Scientist Assembly, and an exhibition featuring more than 100 organizations.

The program brought together researchers and speakers from institutions across the globe. This international perspective created valuable opportunities to exchange knowledge, explore emerging microscopy techniques, and identify new directions for scientific collaboration. 

More Than 200 Researchers Join Tescan Demonstrations 

The Tescan booth remained busy throughout the exhibition, with more than 200 people attending live demonstrations over four days. Many visitors returned to explore additional workflows, continue technical discussions or examine how different imaging and sample preparation methods could support their research. 

The demonstrations introduced advances across the Tescan portfolio: 

• Tescan FemtoChisel™ for rapid, site-specific femtosecond laser sample preparation before downstream FIB-SEM, TEM and analytical microscopy. 

• Tescan AMBER X™ 2 for high-throughput plasma FIB-SEM workflows, including large-volume 3D characterization and TEM specimen preparation. 

• Tescan CLARA™ for ultra-high-resolution, field-free SEM imaging across challenging materials and sample types. 

• Tescan UniTOM® HR 2 for non-destructive, high-resolution, and dynamic 4D micro-CT characterization. 

• Advanced 4D-STEM workflows for connecting imaging, diffraction and analytical information. 

Each demonstration created space for practical discussion. Researchers could bring their own questions, examine relevant applications and explore how connected workflows can help them move from sample preparation and data acquisition to clearer scientific insight.

Tescan Contributes to the IMC21 Scientific Program 

Tescan colleagues also contributed directly to the scientific exchange through presentations covering nanoprototyping, laser sample preparation and analytical 4D-STEM.

Petr Klímek presented “SEM as a Surface-Engineering Platform for Nanoprototyping: In Situ FEBID/FEBIE, Scripted Workflows, and Digital-Twin Process Control.” His contribution explored how SEM can extend beyond imaging to support controlled nanoscale fabrication and automated experimental workflows.

Sina Shahbazmohamadi presented “High-Throughput TEM and NanoCT Specimen Preparation by Femtosecond Laser Micromachining.” The presentation examined how femtosecond laser processing can accelerate the preparation of analysis-ready specimens for subsequent microscopy workflows.

Daniel Němeček shared an advanced analytical 4D-STEM approach through a case study of AA2099 aluminium alloy, demonstrating how richer structural information can support more efficient materials development.

Tescan also presented posters covering multiscale porosity characterization, Xe plasma FIB sample preparation, dynamic micro-CT of tablet dissolution, lead halide perovskite nanocrystals, lithium-ion battery electrodes, and laser-based preparation workflows for consumer electronics.

Seeing Tescan Instruments Support Scientific Progress 

IMC21 also provided an opportunity to see how researchers are applying Tescan instruments to complex scientific questions.

Contributions from Dr. Tatiana Gorelik and Prof. Ben Britton highlighted developments in electron diffraction, crystallographic analysis and EBSD. Prof. Britton and colleagues shared how EBSD can reveal subtle crystallographic details in complex material phases.

Researchers from the University of Leeds presented work spanning soft nanomaterials, industrial polymers, optoelectronic semiconductors, topological thin films, biomaterials and cryogenic microscopy.

Poster contributions included work from Dr. Natalia Koniuch, Tiantian Chai, Ben Muggleton, Daniel Hopper, Prof. Nicole Hondow, and Rebecca Hughes. Their research demonstrated how techniques including 4D-STEM, EELS, scanning electron diffraction, and cryo-FIB-SEM can reveal structures and processes that are difficult to access through conventional approaches.

These presentations showed the value of connecting advanced instrumentation with practical workflows, application knowledge, and continued collaboration.

Building Connections Across the Microscopy Community 

Beyond the scientific program and demonstrations, IMC21 created valuable opportunities to strengthen relationships across the microscopy community.

The Tescan team welcomed representatives from the Embassy in London, participated in the Brno Region Microscopy Quiz, and brought teams from different countries together, supporting the exchange of expertise across technologies, applications, and regions. 

Most importantly, conversations with researchers provided direct insight into the questions they are asking, the limitations they encounter, and the discoveries they are working towards. This exchange helps Tescan continue developing accessible, reliable workflows around real scientific needs. 

From Liverpool to Berlin 

IMC21 demonstrated what becomes possible when researchers, technology specialists, and scientific organizations come together with a shared commitment to discovery.

Tescan thanks everyone who visited the booth, attended a demonstration, shared their research, or contributed to the scientific program. The conversations and connections established in Liverpool will continue to guide new collaborations and microscopy workflows.

The international microscopy community will meet again at IMC22 in Berlin, where the congress will mark 100 years since the invention of the electron microscope.  

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