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Interview | Why Tescan VEGA™ Remains a Practical SEM for Materials R&D and Quality Control
Discover how Tescan VEGA™ supports materials characterization, SEM-EDS analysis, industrial quality control and failure analysis.
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Explore knowledge.
Accelerate for Discovery
Scientific insights, technical resources and expert knowledge to help you get more from your research.
Choosing the Right Ion Species for Low-Damage TEM Sample Preparation
Download the application note to compare Ga⁺, Xe⁺ and Ar⁺ ion milling for low-damage TEM sample preparation and improved lamella quality.
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Tescan EXLO Speed Challenge: Fast TEM Specimen Manipulation Without a Long Learning Curve
See how Tescan EXLO enables fast ex-situ TEM lift-out, with novice users achieving specimen transfers in under three minutes at M&M 2026.
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Accessing Buried Semiconductor Structures: Inside an A15 Using a Correlative Workflow with Tescan FemtoChisel™
See how CT, laser delayering and SEM reveal buried structures in advanced semiconductor packages while preserving spatial context.
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Interview | How much research time do you spend just finding the right grain?
Discover how TIMA™ Geolite supports automated mineralogy, mineral identification and efficient analysis workflows for research samples.
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Beyond Imaging: How Electron Microscopy Is Helping to Understand Biology in Context
Explore how SEM, FIB-SEM, volume EM and cryo-EM reveal biological structures from surface morphology to cells, organelles and molecular detail.
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High-Temperature In Situ EBSD Analysis of 3D-Printed Steel
Download the application note to explore automated high-temperature in situ EBSD for tracking phase evolution and grain refinement in AM steel.
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The Science of Beer: How Brewing Transforms Barley, Hops, and Yeast
Explore the science of beer, from malting and hops to yeast fermentation, filtration and foam, revealed through electron microscopy.
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Correlative Cryo-EM Imaging of Bacteria–Biomaterial Interfaces
Download the application note on correlative cryo-EM and cryo-ET sample preparation for imaging bacteria–biomaterial interfaces.
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Tescan at IMC21: Four days of microscopy, discovery and collaboration
Explore Tescan highlights from IMC21 in Liverpool, including SEM, FIB-SEM, 4D-STEM, micro-CT, live demos and scientific presentations.
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SEM Imaging Is Not Just About Resolution: It Is About Contrast Control
Learn how SEM detectors use SE and BSE signals, angular filtering and energy filtering to control contrast and reveal material information.
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Why Multiscale Imaging Matters for Better Materials Characterization
Learn how multiscale imaging and electron microscopy improve materials characterization by revealing details from the macro to nanoscale.
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How Thermal Aging Changes Cork Stoppers: SEM Imaging Insights with Tescan CLARA™
See how Tescan CLARA™ SEM imaging reveals microstructural changes in cork stoppers after thermal aging in water and ethanol.
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Tescan MIRA XR: Ultra-High-Resolution SEM for Materials Characterization
Learn how ultra-high-resolution SEM enables nanoscale imaging, low-voltage analysis and advanced materials characterization with Tescan MIRA XR.
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Develop Offline. Preserve Microscope Time for Imaging and Analysis.
Explore how digital twin technology can support electron microscopy workflows, instrument understanding, training, and operational efficiency.
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The Ga⁺ FIB-SEM Ceiling: Why Ga⁺ FIB-SEM Milling Needs Ar⁺ Gentle Ion Beam Cleaning
Learn how argon ion polishing reduces gallium-induced damage and improves TEM lamella quality for reliable high-resolution analysis.
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Tescan FemtoChisel™ Receives Microscopy Innovation Award 2026
Tescan FemtoChisel™ receives the Microscopy Innovation Award 2026 for advancing fast, precise femtosecond laser sample preparation.
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Get More Insight from Beam-Sensitive Materials: Analytical Cryo-STEM Solution is now available on Tescan TENSOR™
Discover the new Cryo-EM solution for Tescan TENSOR™ with low-dose Cryo-STEM, Cryo-EDS, Cryo-4D STEM and Cryo-3D ED workflows.
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Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™
Watch the on-demand webinar to explore cryo-STEM, cryo-EDS, cryo-4D-STEM and cryo-3D ED workflows for beam-sensitive materials using Tescan TENSOR™.
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INTERVIEW | “The hardest part was finding the right spot on the sample.” How FIB-SEM expands cryo-FIB workflows in the life sciences
Explore cryo-FIB-SEM, cryo lift-out and correlative microscopy workflows for targeting and preparing beam-sensitive biological samples.
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Interview | One Instrument, Many Questions: Dr. Jamie Ford on Plasma FIB-SEM (PFIB-SEM) in an Open User Facility
Discover how Tescan AMBER™ X supports diverse research workflows in an open-access microscopy facility using plasma FIB-SEM.
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Interview | Dr. Kati Valtonen on Materials Characterization and the Tescan CLARA™
Discover how Dr. Kati Valtonen uses Tescan CLARA™ for wear research, materials characterization, EBSD, and in situ SEM analysis.
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The New Generation of Tescan CLARA™, An Ultra-High-Resolution SEM Designed to Reveal More Information from Every Sample
Discover the new Tescan CLARA™ Ultra-High-Resolution SEM with advanced SEM contrast for deeper materials characterization and nanoscale imaging.
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Revealing Fine Precipitates in Aluminum Alloys by Reducing Ga+ FIB Polishing Artifacts
Download the application note to learn how Ar⁺ ion beam polishing reduces Ga⁺ FIB artifacts for reliable TEM sample preparation.
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What Is FIB-SEM? From Seeing Materials to Engineering Them at the Nanoscale
Learn what FIB-SEM is, how it works, and why it is essential for nanoscale imaging, sample preparation, and advanced materials characterization.
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Tescan Launches New CLARA™, an Ultra-High-Resolution SEM Designed to Reveal More Information from Every Sample
Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
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How Micro-CT Revealed New Insights into the 2,400-Year-Old Tollund Man
Discover how non-destructive micro-CT imaging revealed new insights into the 2,400-year-old Tollund Man and archaeological research.
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See More. Understand More. Introducing The New Tescan CLARA™
Watch the Tescan CLARA™ webinar on demand and explore ultra-high-resolution SEM imaging, advanced contrast, intelligent detection, and automated workflows.
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2,000 Swings, Zero Cracks: A Japanese Baseball Story Seen Through Science in Brno
Discover how Micro-CT revealed the internal condition of a baseball bat after 2,000 swings using non-destructive 3D X-ray imaging.
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35 Years of Discovery: From Brno Roots to a Global Future
Discover how Tescan grew from a small team in Brno into a global leader in electron microscopy and scientific instrumentation.
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TIMA™ Helps Rethink the Moon’s Farside Story
Discover how Tescan TIMA™ automated mineralogy helped researchers analyze Chang'e-6 lunar samples and refine our understanding of the Moon.
Read moreInfluence of In-Situ Heat Treatment on the Microstructure of LPBF Processed PM23
Watch how baseplate heating, build height and carbide networks influence cracking, porosity and microstructure in LPBF-processed PM23 high-speed steel.
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Tescan Joins Shimadzu Group to Accelerate Innovation and Deliver Greater Value to Customers
Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.
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How 4D Micro-CT Improves Freeze-Drying Analysis
Learn how 4D micro-CT reveals freeze-drying dynamics and helps researchers study structural changes non-destructively.
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TEM Lamella Preparation in FIB-SEM: Why Full Automation of TEM Lamella Prep Alone Is Not Enough
Discover how integrated argon polishing improves TEM lamella preparation, repeatability, and FIB-SEM specimen quality.
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High-Resolution Imaging of a Large Natural History Specimen - A Baleen Whale Fetus
Download the application note to discover high-resolution micro-CT imaging of a baleen whale fetus for museum and anatomy research.
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Dynamic Micro-CT Analysis of Dough Rising in Real-Time During Bread Baking
Download the application note to explore dynamic micro-CT imaging of dough rising, pore formation, and bread baking in real time.
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Heating of Li-Ion Battery and Visualization of Electrolyte Dynamics
Download the application note to explore dynamic micro-CT imaging of Li-ion battery heating, electrolyte movement, and gas formation.
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4D Metal Leaching Analysis Using Tescan Spectral CT
Discover how Tescan Spectral CT enables real-time 4D analysis of metal leaching, elemental quantification, and hydrometallurgical processes.
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Identifying Multi-Polymer Composites Using SPECTRAL CT
Learn how Tescan SPECTRAL CT with True Contrast enables accurate identification and analysis of multi-polymer composites using spectral micro-CT imaging.
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Interview | A One-of-Its-Kind 4D-STEM Implementation in Scanning Electron Microscopy
An interview with Stanislav Haviar on 4D-STEM in SEM, thin-film materials research, and how Tescan AMBER 2 supports advanced characterization workflows.
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Tescan Announces Winner of the UniTOM XL Dynamic CT Beam Time Competition
Tescan announces the winner of the UniTOM® XL Dynamic CT Beam Time Competition 2026 and the selected carbonate dissolution research project.
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Food Process Engineering with Tescan Micro-CT
Learn how researchers at TUM use micro-CT to study food drying, plant-based foods, root-soil interactions, and dynamic processes.
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What Is micro-CT? A Practical Guide to 3D and 4D Imaging
Learn how micro-CT enables non-destructive 3D and 4D imaging, helping researchers visualize internal structures and dynamic processes.
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Why FIB Has Become the Gold Standard for TEM Specimen Preparation
Learn why FIB-SEM is the preferred method for TEM specimen preparation, enabling site-specific targeting, faster workflows, and reliable results.
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Dynamic Micro-CT Imaging of Cooling-Induced Crystallization
Visualize cooling-induced crystallization in porous materials with Tescan UniTOM HR. Capture crystal growth, dissolution, and pore-scale changes in real time.
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4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization - Ben Britton
Watch the on-demand webinar to learn how event-based 4D-STEM in SEM improves sample screening, diffraction analysis, and TEM workflow efficiency.
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Interview | Materials Remember Everything: Reading the History of Metals with Electron Microscopy
Discover how researchers at the University of Žilina use electron microscopy and Tescan MIRA XR to study metallic materials, fractography, structural changes, and industrial failures
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How Does a Scanning Electron Microscope Work? Imagine the Board Game Battleship
Learn how a scanning electron microscope (SEM) works using the simple analogy of the Battleship game. Explore SEM signals, raster scanning, and FIB-SEM workflows.
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Integrated 4D-STEM Detector for SEM & FIB-SEM | Tescan
Discover how Tescan’s integrated retractable 4D-STEM detector enables diffraction-based analysis directly in SEM and FIB-SEM workflows for advanced materials characterization.
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From Micro-CT to Laser and to FIB-SEM: A Smarter Failure Analysis Workflow for Advanced Packaging
Discover how Micro-CT, ultrafast laser processing, and FIB-SEM create a faster, more reliable failure analysis workflow for advanced semiconductor packaging.
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Sample Preparation in Electron Microscopy
Learn the fundamentals of sample preparation in electron microscopy, including cleaning, coating, mounting, TEM lamella preparation, and cryo-EM workflows.
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Practical Tip | TEM lamella thickness vs. width
Learn how TEM lamella thickness and window width influence stability during FIB preparation. Practical guidance for reducing bending, uneven polishing, and punch-through risk.
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Dairy Microstructure with Cryogenic Scanning Electron Microscopy
Download App Note and discover how cryogenic SEM enables high-resolution imaging of dairy microstructure, preserving native morphology to support formulation, processing, and food research.
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APT specimen preparation with Tescan AMBER X™ 2
Accelerate APT specimen preparation with Tescan AMBER X 2. Combine fast Xe plasma FIB milling with high-precision site-specific targeting for high-quality atom probe tomography workflows.
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FemtoChisel™ Explained: Clean Ultrafast Laser Processing for Semiconductor Sample Preparation
Discover how FemtoChisel™ laser solutions enable precise and efficient sample preparation workflows, supporting advanced microscopy and materials analysis.
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Why Integrating Argon Ions with a Ga+ FIB SEM Is Essential for Modern (S)TEM Specimen Preparation
Learn how integrating low-energy argon ion beam cleaning with Ga+ FIB-SEM improves (S)TEM sample preparation by reducing damage and enabling high-quality nanoscale analysis.
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Study of Gold Geometallurgy with Tescan TIMA™
Optimize gold recovery with TIMA automated mineralogy. Analyze grain size, mineral associations, and refractory gold for better geometallurgical decisions.
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Metallurgical Ore Textural Analysis using Tescan TIMA™
Analyze ore texture and mineral liberation with Tescan TIMA™. Gain quantitative insights for grind optimization, flowsheet design, and ore processing.
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Understanding Electron Microscopy Fundamentals
Learn the fundamentals of electron microscopy, including how SEM, TEM, and STEM work, how images are formed, and what signals reveal about materials at the nanoscale.
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Sample Preparation Perfected: Reproducible Ultra-Thin TEM Lamellae with AMBER 2 and fully FIB-SEM integrated Aura™ Gentle Ion Beam
Watch the on-demand webinar on TEM lamella preparation using AMBER 2 and Aura™ Gentle Ion Beam to improve sample quality, reproducibility, and throughput.
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Automated TEM Sample Preparation with ORAGE™ 2
Improve lab efficiency with automated TEM sample preparation using Orage 2 Ga+ FIB. Achieve consistent lamella quality and faster workflows.
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High-Temperature Ion Implantation for NV Centers in Diamond
Download the application note to discover how high-temperature ion implantation increases diamond NV center density and improves photoluminescence.
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Interview | You Can Never Have Too Many FIB-SEM Systems: Insights from Ondrej Man
An interview on CEITEC Nano infrastructure, plasma FIB-SEM with SIMS, and advanced materials workflows using Tescan AMBER X 2.
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Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS
Watch the on-demand webinar on correlated particle analysis workflows using TIMA, FIB-SEM and SIMS for advanced microanalysis and isotopic characterization.
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TIMA™ helps illuminate the breakup of the Kerguelen Large Igneous Province
Explore how Tescan TIMA™ enables automated mineral mapping and phase identification in geological samples from Kerguelen Island using advanced mineralogy workflows.
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EBL Nanopatterning for Cell Behavior and Biomolecule Distribution
Discover how electron beam lithography enables precise nanopatterning of biomolecules to control cell behavior, receptor interactions, and nanoscale signaling in life sciences research.
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Interview | Automated Mineralogy for Decision-Ready Processing: Insights from Braam Smit
Learn how automated mineralogy and Tescan TIMA help mining teams make faster, decision-ready processing choices. Insights from mineralogist Braam Smit.
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Thermal Displacement in Semiconductor Packaging Using In-Situ Micro-CT
Explore how in-situ micro-CT enables non-destructive 3D analysis of thermally induced displacements in semiconductor packaging, improving reliability and failure analysis.
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From Surface to Species: SEM in Modern Plant Taxonomy and Functional Studies
Download the application note to explore how SEM identifies plant species through leaf surface morphology and large-area imaging.
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Delayering sub-20 nm nodes for in-situ nanoprobing with Tescan AMBER X 2
Download the application note to explore AMBER X FIB-SEM for precise sub-20nm node delayering and in-situ nanoprobing while preserving electrical properties.
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Interview | Bernadette de Bakker on Why Micro-CT Matters in Clinical Environments
Discover how micro-CT supports embryology and fetal imaging in clinical environments. Insights from Bernadette de Bakker on 3D imaging, research, and care.
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Multimodal Characterization of AA 2099 Aluminum Alloy Using 4D-STEM and EDX
Download application note showing how Tescan TENSOR enables multimodal 4D-STEM and EDX analysis of AA2099 Al–Li alloy to map precipitates and microstructure.
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Fluorescence-Guided Cryo-FIB Preparation of Protein Crystals
Download the application note to learn how fluorescence-guided cryo-FIB prepares intracellular protein crystals for high-resolution TEM imaging and diffraction.
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Scanning Transmission Electron Microscopy Explained
Learn what STEM is, how it works and how it compares to TEM. Explore 4D-STEM, electron diffraction and analytical techniques for materials and semiconductors.
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Tescan opens new Korea demo lab supporting semiconductor analysis
Tescan offers on‑site demos in a new scanning electron microscopy lab in Korea, supporting the semiconductor industry, research institutions and universities with FIB‑SEM expertise.
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INDICO Workshop | Digital Control for Reliable 3D Nanoprinting
The INDICO FEBID workshop in Frankfurt advanced digital control for reliable 3D nanoprinting. Tescan contributed expertise in SEM-based nanofabrication, FIBID and in situ process monitoring.
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Interview |Transforming Prenatal Care with Micro-CT Imaging: Dr. Bernadette de Bakker’s Research
Discover how micro-CT imaging is transforming prenatal care and early human development research through non-destructive, high-resolution 3D anatomical analysis.
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Automated TEM Sample Preparation for 3-nm FinFET STEM Analysis
Application note on automated Ga⁺ FIB-SEM TEM lamella preparation for high-throughput, reproducible multimodal STEM analysis of 3nm FinFET devices.
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Improved TEM Specimen Quality and Lab Throughput with new AMBER 2 Ga+FIB-SEM
Watch this on-demand webinar on improving TEM specimen preparation with Tescan AMBER 2 Ga⁺ FIB-SEM, Orage 2, automation, and integrated gentle ion beam polishing for advanced materials characterization.
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FemtoChisel™: Redefining Ultrafast Laser Processing
Register for the FemtoChisel™ webinar to explore ultrafast laser processing, semiconductor sample preparation and a live product demonstration.
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Tailored Cryo-EM and Correlative Workflows for Challenging Biological Projects
Watch Tescan’s webinar on tailored cryo-EM and correlative workflows for challenging biological projects, featuring experts from IMG Prague.
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Professor Andy Brown on Beam-Sensitive Materials and 4D-STEM
Discover how 4D-STEM and TESCAN TENSOR enable dose-efficient analysis of beam-sensitive materials, advancing electron diffraction and structural research.
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Tescan UniTOM XL Dynamic CT Beam Time Competition Announced
Submit your proposal for one week of dynamic X-ray CT beam time on Tescan UniTOM XL in Warrendale, PA. Deadline: 31 March 2026.
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Micro-CT and Plasma FIB-SEM Workflows for Multiscale Characterization of Heterogeneous Materials
Discover how integrating micro-CT and plasma FIB-SEM enables multiscale 3D characterization of heterogeneous materials, linking structure, and performance.
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Practical Tip | Reduce EBL Stitching in Critical SEM Features
Learn how to reduce EBL stitching errors on a standard SEM using technological layers and smart write-field placement in a GDSII workflow.
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Newer, better, UniTOM HR
Watch the recording and learn how UniTOM HR 2 enables Dynamic-to-Detail micro-CT imaging and Panthera AI denoising in time-resolved experiments.
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Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies
Watch Tescan’s webinar on focused ion beam implantation for diamond engineering, NV center creation and quantum technology workflows.
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Practical Tip | Lamella Preparation with Precise Thickness Estimation
Learn practical methods to estimate lamella thickness for TEM, including FIB-SEM transparency, EELS-based measurement, and X-mark polishing techniques.
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Riley Tejcek | Team USA Bobsled Pilot, Marine and Author
An interview with Riley Tejcek on performance and safety, including how non-destructive X-ray CT supports materials inspection in demanding environments.
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From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials
Join Tescan’s core facilities webinar to learn how PFIB-SEM, SEM, and micro-CT enable high-impact materials research in shared infrastructures.
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Tescan Announces Agreement with Shimadzu Corporation
Carlyle and other shareholders have entered into an agreement with Shimadzu Corporation that may result in a change in Tescan’s shareholding structure, subject to approvals.
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Interview | Dr. Gorelik on 3D-ED Methods and Challenges
Dr. Tatiana Gorelik shares insights on 3D electron diffraction, data acquisition strategies, and how new instrumentation shapes crystallography research.
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Update on Agreement Signed between Carlyle and Shimadzu Corporation
Carlyle and Shimadzu Corporation have signed an agreement under which Tescan would become part of Shimadzu, subject to regulatory and customary approvals. The transaction has not yet closed.
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Tescan Announces Carlyle Agreement with Shimadzu Corporation
Tescan announces a definitive agreement between Carlyle, its co-shareholders, and Shimadzu Corporation for the sale of the company, pending regulatory approval.
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Tescan's First Micro-CT Installation in Czech Academia: UniTOM XL at the University of Defence
The University of Defence in Brno installs Tescan UNITOM XL microCT for ballistic protection, composite materials research, and advanced 3D material analysis.
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TEM Lamella Preparation with Tescan ORAGE 2
Discover how Tescan ORAGE 2 improves TEM lamella preparation with smarter automation, up to 40% faster processing, and reliable results for advanced semiconductor analysis.
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Tescan and Wirsam Host Successful Mineralogy Workshop for TIMA Users in South Africa
Tescan and Wirsam co-hosted a hands-on Mineralogy Workshop in Johannesburg, uniting TIMA users to share insights on automated mineralogy and data optimization.
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Enhances Construction Materials Research Through Tescan FIB-SEM Technology
Czech Technical University enhances construction materials research with the Tescan AMBER X FIB-SEM, unlocking advanced microstructure analysis and 3D tomography capabilities.
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Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2
Watch how plasma FIB-SEM on Tescan AMBER X 2 enables high-quality, artefact-free APT sample preparation and advanced nanoscale 3D characterization.
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SGS in Chile Celebrates Installation of the 100th Tescan TIMA Mineral Analyzer in high throughput configuration
SGS celebrates the 100th TESCAN TIMA installation in Chile, advancing automated mineralogy and high-throughput mineral characterization.
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Accelerating Battery Innovation with Advanced Analytics
Tescan and Dragonfly Energy showcase how advanced microscopy and data analytics accelerate lithium-ion battery innovation and sustainable manufacturing.
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Nanoscale Prototyping with Advanced SEM Capabilities
Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.
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New Laboratory Opening at CTU Prague for Materials Science
Tescan supports the new Plasma FIB-SEM laboratory at CTU Prague, advancing materials science research and innovation in civil engineering.
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Tescan Expands Semiconductor Workflows with FemtoChisel Laser Technology
Tescan introduces the FemtoChisel femtosecond laser platform, delivering faster, more precise semiconductor sample preparation and integrated workflow performance.
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Tescan Expands Semiconductor Workflows with FemtoChisel Laser Technology
Discover how Tescan FemtoChisel laser technology improves semiconductor sample preparation with greater speed, precision and workflow efficiency.
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Green Algae Response to ZnO Nanoparticles with Tescan Cryo
Discover how Tescan’s cryo-electron microscopy workflow helped uncover algae’s adaptive response to ZnO nanoparticles in collaboration with Mendel University.
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Spectral CT for Battery Inspection
Use Spectral CT to visualize internal battery and electronics structures. Detect delamination, misalignment, and material separation - fully non-destructively.
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Tescan at the Cryo-Microscopy Group Meeting – University of Nottingham, 12 November 2025
Tescan will join the Cryo-Microscopy Group Meeting at the University of Nottingham to showcase its Cryo SOLARIS X² system and latest cryo-microscopy innovations for life sciences.
Read moreTESCAN TIMA Integration with Geometallurgy Test Programs
Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.
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Faster Automated TEM Lamella Prep with Tescan Ga⁺ FIB
Learn how the new Tescan Orage™ 2 Ga⁺ FIB column combines higher milling speed, beam stability, and superior low keV image clarity to turn challenging TEM lamella preparation into a simple, reliable routine.
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Highlights from the 3rd Tescan Collaboration Network Meeting at ER-C
Highlights from the 3rd Tescan Collaboration Network Meeting at ER-C
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EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation
Discover how Tescan EXLO™ improves TEM sample preparation with ex situ lift-out. Watch the on-demand webinar to increase throughput and reduce FIB time.
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AMBER X 2 TEM Sample Preparation
Explore real-world workflows using TESCAN AMBER X2 for semiconductor and battery research. Co-hosted with the University of Sydney.
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MIRA XR Launch Webinar
Join us for the global launch of the MIRA XR SEM. Discover new levels of high-throughput, AI-driven imaging with real-world applications across materials and life sciences.
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4D-STEM Workshop at the University of Leeds
University of Leeds and RMS hosted a 4D-STEM & 3D-ED workshop, featuring TENSOR demos, keynotes from global experts, and interactive scientific sessions.
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University of Sydney and Tescan Advance TEM Sample Preparation
Tescan Group today announced the acquisition of FemtoInnovations and the creation of a dedicated Laser Technology Business Unit (LT BU).
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EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation
Discover how Tescan EXLO streamlines TEM specimen preparation with faster lift-out, improved workflow efficiency, and scalable processing for materials science and semiconductor labs.
Read moreInterview with Jean-Charles Chen, CEO of Tescan Group: Unveiling a New Era of Discovery
Interview with Jean-Charles Chen, CEO of Tescan Group: Unveiling a New Era of Discovery
Read moreInterview | Tescan CEO Jean-Charles Chen on a New Era of Discovery
Discover how Tescan CEO Jean-Charles Chen explains the company’s rebranding, strategic priorities, and vision for the future of scientific discovery.
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AMBER X 2 Wins 2025 R&D 100 Award for Plasma FIB-SEM Innovation
TESCAN’s AMBER X 2 Plasma FIB-SEM wins the 2025 R&D 100 Award for combining high-throughput 3D analysis with nanometer-precision TEM specimen prep.
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Tescan and the University of Leeds to Host Exclusive Webinar on Low-Dose 4D-STEM for Soft Matter Analysis
TESCAN will co-host a collaborative webinar with the University of Leeds, presenting a low-dose 4D-STEM methodology for characterising beam-sensitive polymers and soft matter.
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