From Routine to Remarkable: Meet TESCAN MIRA XR

webinar MATERIALS SCIENCE tescan mira xr

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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Webinar description

Tescan MIRA XR combines ultra-high-resolution SEM-EDS with BrightBeam™ technology to deliver reliable results for researchers and quality control teams. This system provides consistent imaging performance across nanoscale research and industrial applications.

This webinar shows how MIRA XR streamlines analysis workflows while maintaining precision. You'll see real applications that demonstrate faster sample-to-results workflows and enhanced reproducibility.

Webinar Highlights

How MIRA's optimized BrightBeam™ technology delivers high-resolution imaging across diverse sample types
Real-world examples of accelerated analysis and improved measurement reproducibility
Integrated Dual Essence™ elemental mapping within the SEM interface for seamless workflows

Meet the speakers

Martin Sláma

Product Marketing Manager for FIB-SEM 3D characterization and TEM lamella preparation at TESCAN, brings eight years of experience with plasma FIB and Ga+ FIB-SEM solutions for materials characterization.

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MIRA XR Launch Webinar

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