WEBINAR | “4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization
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From Routine to Remarkable: Meet Tescan MIRA XR™

 

webinar MATERIALS SCIENCE Tescan mira xr

Experience how MIRA XR™'s advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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Webinar description

Tescan MIRA XR™ combines ultra-high-resolution SEM-EDS with BrightBeam™ technology to deliver reliable results for researchers and quality control teams. This system provides consistent imaging performance across nanoscale research and industrial applications.

This webinar shows how MIRA XR™ streamlines analysis workflows while maintaining precision. You'll see real applications that demonstrate faster sample-to-results workflows and enhanced reproducibility.

Webinar Highlights

  • How MIRA™'s optimized BrightBeam™ technology delivers high-resolution imaging across diverse sample types

  • Real-world examples of accelerated analysis and improved measurement reproducibility

  • Integrated Dual Essence™ elemental mapping within the SEM interface for seamless workflows

Meet the speakers

tomas boruvka
Tomáš Borůvka

Product Marketing Manager – SEM Solutions in Materials Science at Tescan. Drawing on his background in R&D, he brings together user perspective and technical understanding.

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