WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

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Applications
Products and technology
Events & Webinars
News
Contacts
- About
- Careers
- Services
- OEM
- Distributors

Events & webinars

Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.

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Upcoming Events

Kasteel Vaalsbroek, Netherlands

PICO 2026 - 9th Conference on Frontiers of Aberration Corrected Electron Microscopy

Tescan is happy to be a part of the PICO conference, full of experts in the field! Our Team will be happy to meet you at the PICO event to introduce you to how Tescan solutions can help in the study of solids in condensed matter research and the life sciences by the application of advanced electron microscopy.

Luxembourg Microbiology Days 2026

Tescan will participate in Luxembourg Microbiology Days 2026, presenting microscopy and analytical solutions for microbiology and life sciences research. The event focuses on advanced imaging techniques for biological samples.

Brno, Lednice, Czechia

19th International Conference on Materials and Technologies for Defense and Security (MaTeDaS 2026)

Meet Tescan at the MaTeDaS Conference in Czechia. Explore materials engineering, micro-CT tomography, and advanced manufacturing technologies for defence and security applications.

CAM Workshop – Failure Analysis and Material Diagnostics of Electronic Components

Tescan participates in the CAM Workshop with a focus on semiconductor failure analysis, including Femto-based sample preparation, decapsulation, and cross-sectioning for microelectronics diagnostics.

InterPore - International Conference on Porous Media

Tescan will participate in Interpore 2026, presenting micro-CT and tomography solutions for porous media analysis, material characterization, and 3D imaging workflows.

Montreal, Canada

Microscopy Society of Canada / Société de Microscopie du Canada Annual Meeting 2026

Tescan will showcase its full portfolio of microscopy and microanalysis solutions, including FIB-SEM for nanoscale imaging and sample preparation, SEM for materials and life science applications, and micro-CT for nondestructive 3D imaging and tomography, all supported by integrated workflows for advanced analysis and sample preparation.

Japanese Society of Microscopy

Tescan will engage with the Japanese Society of Microscopy, focusing on electron microscopy, FIB-SEM techniques, and advanced imaging for materials and life sciences.

Denver, Colorado, USA

Tescan at EIPBN 2026

Tescan will participate in EIPBN, focusing on electron beam technologies, nanofabrication, and applications in semiconductor research and nanoscale patterning.

Daejeon, South Korea

Korean Society of Microscopy Membership

Tescan maintains active membership in the Korean Society of Microscopy, supporting collaboration in microscopy, materials science, and advanced analytical techniques.

Jacksonville, Florida, USA

2026 Tescan SEM User Schools

Get more from your Tescan scanning electron microscope with our 2026 Tescan SEM User Schools - immersive, hands-on training programs led by Tescan application experts.

Warrendale, Pennsylvania, USA

2026 Tescan SEM User Schools

Get more from your Tescan scanning electron microscope with our 2026 Tescan SEM User Schools - immersive, hands-on training programs led by Tescan application experts.

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Upcoming Webinars

Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

Micrometer-sized particles can reveal critical information in environmental, geological, and nuclear sciences. To fully characterize them, researchers often need more than one analytical method. This webinar explores how correlated workflows combine morphology, phase, chemistry, and isotopic data to build a more complete picture.

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Past Webinars

FemtoChisel™: Redefining Ultrafast Laser Processing

In the fast-paced semiconductor industry, the "time-to-data" bottleneck often lies in the transition from defect localization to high-resolution analysis. Traditional sample preparation can be slow, messy, and prone to heat damage - until now.

Improved TEM Specimen Quality and Lab Throughput with New AMBER 2 Ga⁺ FIB-SEM

Watch the recording to learn how improved beam performance, automation, and integrated gentle ion beam polishing support more consistent TEM specimen preparation, lower damage, and higher lab throughput.

Tailored Cryo-EM and Correlative Workflows for Challenging Biological Projects

In this on-demand webinar, the team from the Electron Microscopy Core Facility at IMG (Institute of Molecular Genetics of the Academy of Sciences) Prague shows how they approach technically demanding projects that require more than routine sample preparation and imaging.

Dynamic-to-Detail Micro-CT with Tescan UniTOM® HR 2

Tescan specialists show how Tescan UniTOM® HR 2 enables Dynamic-to-Detail micro-CT, allowing you to capture fast structural evolution and then investigate the same region in higher resolution without removing the sample.

Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies

Diamond is rapidly emerging as a key material for quantum technologies, driven by nitrogen-vacancy (NV) centers that enable optical readout and spin control with long coherence times at room temperature.

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Core facilities support many departments on the same instruments, often without growing staff or budgets. This session brings together SpinLab Katowice and TU Graz to share practical approaches to running multi-user microscopy and micro-CT environments with faster time to data, efficient training, and consistent performance.

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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