On-demand WEBINAR | Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™

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Events & Webinars

Events & webinars

Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.

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Upcoming Events

IMC21 – International Microscopy Congress

A global microscopy event covering electron microscopy, imaging technologies, and nanoscale analysis.

SEMICON Taiwan Exhibition and Forum

Focused on semiconductor manufacturing, failure analysis, and advanced inspection technologies.

JASIS – Japan Analytical & Scientific Instruments Show

Covers analytical instrumentation, surface analysis, and materials characterization technologies.

TOSCA Conference

Focus on surface analysis, spectroscopy, and materials characterization techniques.

ELMINA Conference

Covers electron microscopy applications in materials science and nanotechnology.

The European Focused Ion Beam Network (EU-FIB.net) 2026 workshop

Focused on FIB-SEM technologies, sample preparation, and nanoscale fabrication workflows.

Polish-Japanese Microscopy Seminar

A joint academic event focused on microscopy, imaging techniques, and materials analysis.

Croatian Microscopy Congress

Regional microscopy conference covering SEM, TEM, and materials characterization.

Uni-Export Microscopy Event

Focused on electron microscopy solutions and applications for industrial and research users.

2026 Tescan SEM User Schools

Get more from your Tescan scanning electron microscope with our 2026 Tescan SEM User Schools - immersive, hands-on training programs led by Tescan application experts.

Metallography Conference Leoben

Focused on metallography, materials analysis, and microstructure characterization techniques.

EMSI Conference – Electron Microscope Society of India

A key microscopy event focused on electron microscopy techniques, materials characterization, and imaging workflows across academic and industrial research.

ISTFA 2026 (International Symposium for Testing and Failure Analysis)

Join us for the 52nd International Symposium for Testing and Failure Analysis (ISTFA) which is set to take place in San Antonio, Texas, from October 4-8, 2026.

13th Saxon TEM Preparation Meeting

Focused on TEM sample preparation techniques, workflows, and practical approaches for high-quality electron microscopy analysis.

IC User Symposium

A technical symposium for users working with microscopy and analytical systems, covering workflows, applications, and practical use cases in research and industry.

SIMS China Conference

Dedicated to secondary ion mass spectrometry (SIMS), surface analysis, and materials characterization, with applications in semiconductors and advanced materials.

Nano-BW Symposium – Nanotechnology Conference

Focus on nanotechnology research, nanoscale fabrication, and advanced materials, bringing together academia and industry experts.

TUSA SEM User School – G4

A hands-on training focused on SEM operation, imaging techniques, and practical workflows for materials characterization and microscopy users.

GnMEBA Pédagogique Workshop

A workshop focused on electron microscopy education, sample preparation, and analytical techniques for academic and research environments.

SEMT – Society of Electron Microscopy Technology

A microscopy-focused event covering electron microscopy techniques, imaging workflows, and applications in materials and life sciences.

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Upcoming Webinars

WEBINAR | Influence of In-Situ Heat Treatment on the Microstructure of Laser Powder Bed Fusion (LPBF) Processed PM23

Discover how in-situ heat treatment influences crack formation, porosity, and microstructural evolution in LPBF-processed PM23 high-speed steel through advanced materials characterization.

WEBINAR | SEE MORE. UNDERSTAND MORE.
Introducing the New Tescan CLARA™

Explore how the next-generation Tescan CLARA™ redefines ultra-high-resolution SEM with superior contrast, advanced detection capabilities, and faster, more intuitive workflows.

Discover more

Past Webinars

Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™

Access the on-demand webinar to discover how Tescan TENSOR™ enables low-dose cryo-STEM, cryo-EDS and cryo-4D-STEM analysis while helping preserve sensitive samples.

4D-STEM in SEM” – an event-based approach to accessible nano-scale materials characterization

Watch the on-demand webinar to discover how event-based 4D-STEM helps improve sample screening, validate lamella quality before TEM transfer, and support faster, more confident microscopy workflows.

Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

In this on-demand webinar, Professor William Rickard presents correlated microanalytical workflows combining Automated Mineralogy, TIMA, FIB-SEM and SIMS for comprehensive particle characterization and isotopic analysis.

FemtoChisel™: Redefining Ultrafast Laser Processing

In the fast-paced semiconductor industry, the "time-to-data" bottleneck often lies in the transition from defect localization to high-resolution analysis. Traditional sample preparation can be slow, messy, and prone to heat damage - until now.

Improved TEM Specimen Quality and Lab Throughput with New AMBER 2 Ga⁺ FIB-SEM

Watch the recording to learn how improved beam performance, automation, and integrated gentle ion beam polishing support more consistent TEM specimen preparation, lower damage, and higher lab throughput.

Tailored Cryo-EM and Correlative Workflows for Challenging Biological Projects

In this on-demand webinar, the team from the Electron Microscopy Core Facility at IMG (Institute of Molecular Genetics of the Academy of Sciences) Prague shows how they approach technically demanding projects that require more than routine sample preparation and imaging.

Dynamic-to-Detail Micro-CT with Tescan UniTOM® HR 2

Tescan specialists show how Tescan UniTOM® HR 2 enables Dynamic-to-Detail micro-CT, allowing you to capture fast structural evolution and then investigate the same region in higher resolution without removing the sample.

Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies

Diamond is rapidly emerging as a key material for quantum technologies, driven by nitrogen-vacancy (NV) centers that enable optical readout and spin control with long coherence times at room temperature.

Sample Preparation Perfected: Reproducible Ultra-Thin TEM Lamellae with AMBER 2 and fully FIB-SEM integrated Aura™ Gentle Ion Beam

This webinar demonstrates how Tescan AMBERTM 2 FIB-SEM, combined with the fully integrated Aura™ Gentle Ion Beam, enables automated, high-quality TEM lamella preparation with reduced amorphization and improved consistency.

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Core facilities support many departments on the same instruments, often without growing staff or budgets. This session brings together SpinLab Katowice and TU Graz to share practical approaches to running multi-user microscopy and micro-CT environments with faster time to data, efficient training, and consistent performance.

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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