Events & webinars

Connect with microscopy experts and advance your research through Tescan events and webinars. Join hands-on training sessions, application workshops, and networking opportunities worldwide.

Upcoming Events Upcoming Webinars Past webinars

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Upcoming Events

Mar 15

San Diego, California, USA

Discover What’s Next in Materials Characterization at TMS 2026

Join Tescan at TMS 2026 - The Minerals, Metals & Materials Society Annual Meeting & Exhibition, taking place March 15–19, 2026, in San Diego, California, USA, and explore cutting-edge solutions for advanced materials characterization, preparation, and analysis.

Mar 31

Warrendale, Pennsylvania, USA

Tescan UniTOM XL Dynamic CT Beam Time

Tescan invites the micro-CT research community across North, Central, and South America to submit proposals for one week of dedicated dynamic X-ray CT beam time on the new UniTOM XL at the Tescan demo lab in Warrendale, Pennsylvania (USA).

Apr 21

Warrendale, Pennsylvania, USA

Tescan SEM User Schools 2026

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Upcoming Webinars

Mar 17

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Past Webinars

Feb 26

Engineering Diamond Material with Focused Ion Beam Implantation for Quantum Technologies

Diamond is rapidly emerging as a key material for quantum technologies, driven by nitrogen-vacancy (NV) centers that enable optical readout and spin control with long coherence times at room temperature.

Jan 28

From Infrastructure to Impact: The Full Potential of Electron Microscopy and Micro-CT Solutions in Core Facilities in Materials

Core facilities support many departments on the same instruments, often without growing staff or budgets. This session brings together SpinLab Katowice and TU Graz to share practical approaches to running multi-user microscopy and micro-CT environments with faster time to data, efficient training, and consistent performance.

Dec 16

Up to 40% Faster Automated TEM Lamella Preparation with the Orage™ 2 Gallium FIB Column

Advanced semiconductor nodes demand ultra-thin, site-specific TEM samples. Manual preparation is slow, complex, and highly dependent on expert operators.

Nov 28

Precision Redefined: Enhancing APT Workflows with Next-Generation Plasma FIB-SEM Tescan AMBER X 2

Modern materials research demands a multiscale understanding of materials from the large-scale datasets to the 3D nanoscale resolution enabled by the Atom Probe Tomography method.

Nov 20

Nanoscale Prototyping with Advanced SEM Capabilities

Turn your SEM into a nanofabrication powerhouse. Learn how researchers are patterning, depositing, and etching at the nanoscale–fast–using Tescan’s Nanoprototyping Toolbox and advanced SEM workflows.Shape

Oct 14

EXLO in Action: Fast, Reliable and Scalable TEM Specimen Preparation

Remove bottlenecks in TEM workflows by taking lift-out outside the FIB-SEM and into a dedicated EXLO station

Aug 28

Proven to Lead: Advancing TEM Sample Preparation with Tescan AMBER X 2 Plasma FIB-SEM

University of Sydney and Tescan demonstrate how plasma FIB-SEM delivers both high-volume 3D characterization and precise TEM specimen preparation in a single universal system.

Jul 15

TESCAN TIMA Integration with Geometallurgy Test Programs

Geometallurgy combines geological, mineralogical, and metallurgical data to predict how ore variability affects processing. This integrated approach improves resource modeling, reduces operational risk, and supports more efficient, sustainable, and profitable mining decisions.

Apr 15

From Routine to Remarkable: Meet TESCAN MIRA XR

Experience how MIRA XR's advanced capabilities transform your analysis workflows in real-time demonstrations. Connect with Tescan experts to discover practical applications that enhance your research and quality control processes.

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