The B-MRS Meeting brings together scientists, engineers, and students from academia and industry to discuss recent advances and future directions in materials science and related technologies. The meeting provides a forum for exchanging ideas, developing collaborations, and exploring new approaches to materials research
Tescan at B-MRS 2026
As a sponsor and exhibitor, Tescan will showcase solutions for materials research, with a focus on CLARA, AMBER X 2, and UniTOM HR 2. Visit Booth 23 to speak with our team about how electron microscopy,FIB-SEM, and micro-CT can support your materials characterization workflows.
Scientific Presentation
The Latest Advances in 2D and 3D Characterization of Materials by SEM and Analytical STEM Microscopy
September 29, 2026 | 15:00–15:55
The presentation will explore advances in materials characterization from conventional 2D analysis to 3D and 4D-STEM techniques, including approaches for obtaining high-resolution morphological, chemical, and crystallographic information.
It will also examine the multimodal correlation of SEM, micro-CT, and 4D-STEM, integrating information acquired across different spatial scales to provide a more comprehensive understanding of the relationships between material structure, composition, morphology, and properties.
Technologies Featured
NEW! Tescan CLARA
Explore high-resolution SEM imaging for detailed characterization of materials, surfaces, structures, and composition.
Tescan AMBER X 2
Discover plasma FIB-SEM capabilities for materials characterization, large-volume analysis, site-specific sample preparation, and advanced 3D workflows.
Tescan UniTOM HR 2
Learn how high-resolution micro-CT enables non-destructive 3D characterization, allowing researchers to investigate internal structures while preserving the sample for further analysis.
What You Will Learn
- How SEM, FIB-SEM, and micro-CT can support materials research
- Approaches to high-resolution surface and microstructural characterization
- Methods for investigating materials in 2D and 3D
- How complementary imaging technologies can be integrated into materials characterization workflows
- Which Tescan platform may be appropriate for your research requirements
Who Should Attend
- Materials scientists and engineers
- Microscopy and characterization specialists
- Academic and industrial researchers
- Laboratory managers
- Graduate students working in materials science and related fields
Visit Tescan at Booth 23
Meet the Tescan team at Booth 23 to discuss your materials research and characterization challenges and explore how our portfolio of SEM, FIB-SEM, and micro-CT technologies can support your work.
Registration
Registration and additional information are available through the official XXIV B-MRS Meeting 2026 website. XXIV B-MRS Meeting - EventWeb
