Compact analytical SEM for fast, high-quality imaging and EDS in materials science, QA/QC, and education.

Tescan VEGA Compact delivers high-resolution imaging and integrated EDS in a simplified, space-efficient system. With intuitive Tescan Essence™ software and a large chamber that accommodates industrial-scale samples, it’s the ideal choice for reliable, everyday materials analysis—today and in the future.

Key benefits

• Analyze large or multiple samples faster with a spacious chamber and true high vacuum for dependable EDS results.
• Quickly set optimal beam conditions with Tescan’s In-Flight Beam Tracing™.
• Correlate morphology and composition instantly using Essence™ EDS overlay tools in one intuitive interface.

Modular FEG-SEM platform for analytical research and failure analysis with scalable detector integration.

Tescan MIRA delivers high-current, high-resolution imaging with Schottky FEG optics and support for EDS, EBSD, CL, STEM, and nanoprototyping. Its modular design and upgrade options make it suitable for evolving lab needs in research and QA/QC.

Key benefits

• Accelerates analytical workflows with In-Flight Beam Tracing™ and Wide Field Optics™ for fast beam setup and navigation.
• Delivers high-throughput, stable performance for advanced EDS/EBSD mapping and compositional analysis.
• Adapts to growing requirements with support for correlative methods and customizable hardware expansion.

High-performance UHR SEM platform with integrated EDS for shared labs and quality control environments.

MIRA XR combines BrightBeam™ UHR optics, Wide Field Optics™, and Dual Essence™ EDS for seamless high-resolution imaging and live compositional analysis. Optimized for diverse users, it handles charging, non-conductive, and outgassing samples with confidence.

Key benefits

• Reduces rework and training time with macro-to-nano navigation and automated beam optimization.
• Delivers nanometer-scale detail at low keV using advanced SE/BSE detection and automated column alignments.
• Increases throughput and access to challenging samples using MultiVac™ and Auto LowVac Aperture.

Field-free UHR SEM platform for high-contrast imaging of delicate and non-conductive materials.

Tescan CLARA provides sub-nanometer resolution imaging with BrightBeam™ optics and customizable detection. Designed for sensitive materials, it supports flexible multimodal workflows and in-situ experiments with exceptional contrast at low keV.

Key benefits

• Enables artifact-free imaging of magnetic, charging, and beam-sensitive samples using field-free optics and low keV electron detection.
• Delivers selective topography and composition insights in a single scan with energy-filtered, in-column multi-detector design.
• Supports correlative and dynamic applications through modular hardware integration and open scripting workflows.

TriLens™ immersion SEM platform optimized for contrast-critical nanoscale imaging and STEM-in-SEM analysis.

Tescan MAGNA leverages TriLens™ immersion optics and energy-selective detectors to deliver crisp, unmixed contrast at high resolution—even at long working distances or on tilted surfaces. Designed for cross-sections, nanomaterials, and advanced failure analysis.

Key benefits

• Provides clearly defined SE/BSE contrast with TriSE™ and TriBE™ detectors—eliminating signal ambiguity.
• Maintains sub-nanometer resolution even at large working distances and angles—ideal for complex sample geometries.
• Enables STEM-in-SEM for advanced nanoscale characterization without switching platforms.

Automated mineralogy platform for quantitative particle-by-particle analysis in geoscience and mineral processing.

Tescan TIMA combines high-throughput SEM-EDS with automated mineral identification and textural analysis to deliver reproducible, quantitative mineralogical data at scale. With integrated correlative imaging (BSE, EDS, CL) and fully automated workflows, TIMA supports exploration, process optimization, and academic research—without manual interpretation or user bias.

Key benefits

• Delivers statistically robust phase, texture, and liberation data using four EDS detectors and spectral summing for trace and low-abundance mineral detection.
• Reduces user workload through unattended acquisition, automated classification, and offline data analysis—ideal for high-throughput mining and academic labs.
• Supports process optimization, exploration decisions, and geometallurgical modeling by linking compositional data with particle structure and spatial relationships.