Move seamlessly from Dynamic to Detail
Multiple-detector workflows and volume-of-interest scanning allow users to transition directly from fast overview and/or dynamic imaging to sub-micron inspection within the same sample and hardware setup.
Tescan UniTOM HR 2: Uncompromised Discovery in Dynamic Micro-CT
In-Situ Continuity for Dynamic-to-Detail discovery
Tescan UniTOM HR 2 is a dynamic micro-CT platform designed around one core concept: In-Situ Continuity.
You capture fast evolution, then switch to a sub-micron region of interest (ROI) detail without removing the sample or dismantling the in-situ stage.
With Volume of Interest Scanning (VOIS) and detector switching, the dataset stays correlated from the dynamic moment to the high-resolution explanation of the micro-mechanism.
Tescan UniTOM HR 2 is a high-performance micro-CT platform designed around one core concept: In-Situ Continuity across scales and time.
Start with fast, large-field imaging to understand the whole sample, whether as a static overview or during an in-situ experiment, then move seamlessly to sub-micron region-of-interest detail without removing the sample or dismantling the experimental setup.
With Volume of Interest Scanning (VOIS) and seamless detector switching, datasets remain fully correlated as you transition from fast imaging to high-resolution inspection. The result is a continuous, reliable path from context to explanation, within the same sample, hardware configuration, and coordinate system.
Whether you are screening large samples, performing long in-situ studies, or capturing fast transient events, UniTOM HR 2 ensures that no insight is lost between overview and detail.
Shift the Metric in Dynamic Micro-CT: From “More Pixels” to the Complete Scientific Picture
High resolution matters, but it is only powerful when it arrives with the speed to capture the event and the field of view to keep context. UniTOM HR 2 is built to help you move beyond headline specifications and focus on what determines outcomes: a workflow that shows the whole sample, records the change, and then reveals the root cause mechanism, all in one connected experiment.
Film the movie, capture the photograph.
Tescan UniTOM HR 2 removes common friction points that slow research down: transferring samples between “fast” and “detail” systems, losing alignment between time points, manual filter swaps, and fast scans that are too noisy to trust. When configured with Panthera AI and the Automated Filter Changer, the workflow becomes more fluid and focused on results, not logistics.
Why In-Situ Continuity Changes What You Can Prove
Interrupted experiments break causality. In many workflows, teams run fast dynamic imaging in one configuration, then transfer the sample to a different setup for high-resolution inspection. That handoff introduces risk: the sample state can change, alignment is lost, and the chain of evidence weakens.
Tescan UniTOM HR 2 is built to keep the sample in the in-situ environment through the full cycle. You capture the event, then immediately document the micro-mechanism that caused it, with the experimental context still intact.
The continuous workflow, step by step:
- Scan the whole: Create a 3D overview so you understand macro context before you zoom.
- Watch the behavior and reduce the noise penalty: Run fast in-situ dynamic imaging to capture time-dependent change. When configured with Panthera AI, AI-enhanced 4D denoising leverages 3D plus time to separate signal from noise, improving SNR in high frame-rate data.
- Move to ROI detail with VOIS and detector switching: Using VOIS and detector switching, select the region that matters and transition to high-resolution ROI imaging. The workflow is designed to move from overview to sub-micron inspection without manual “needle in a haystack” searching.
- Preserve experimental state: The sample stays in the in-situ stage, so the detail scan remains directly connected to the dynamic moment that triggered it.
In one glance
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Dynamic-to-Detail workflow: observe a critical event during the experiment, then move straight to ROI detail without moving or risking the sample.
- Crystal-clear speed: when configured with Panthera AI, AI 4D denoising leverages 3D plus time (4D) to reduce the noise penalty in fast dynamic scans.
- Resolution without restriction: when configured with the High-Resolution sCMOS detector, achieve sub-micron ROI detail at practical working distances, including bulky in-situ stages.
- Unattended versatility: with the optional Automated Filter Changer, run mixed overnight queues without manual filter swaps.
- Invisible material contrast: the High-Resolution sCMOS detector improves signal-to-noise ratio (SNR) and phase-contrast performance for low-attenuation materials.
- No-compromise platform: configure up to three detectors for high speed, high resolution, and high contrast, with optional AI and automation to scale as your needs grow.
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Tescan Spectral CT in Electronics and Semiconductors
Non-destructive spectral imaging for material verification and internal inspection of advanced electronic assemblies.
TrueContrast™ multi-energy imaging for differentiating polymers, metals, and encapsulants
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K-edge detection for accurate identification of high-Z elements
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Non-destructive visualization of interfaces and buried defects in electronic packages
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Spectrum comparison tools for verifying material uniformity and contamination sources
Tescan Spectral CT delivers compositional insight where conventional micro-CT cannot. Engineers can distinguish packaging materials, solder alloys, and internal structures without sectioning or coating—supporting reliable failure analysis, design validation, and quality assurance across next-generation electronic devices.
Tescan Spectral CT in Materials Science
Multi-energy micro-CT for elemental and structural differentiation in complex, multi-phase materials.
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Elemental mapping for identifying fillers, dopants, or additives in polymer composites
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Spectral contrast for distinguishing polymers, ceramics, and metals with similar densities
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Non-destructive 3D analysis of internal interfaces and phase boundaries
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Integrated Spectral Suite for correlating elemental and structural data in one workflow
In materials research, Spectral CT enables scientists to explore the relationship between structure and composition without destroying samples. Researchers can visualize distribution of additives, analyze composite uniformity, and study degradation pathways—supporting more reliable material design and performance assessment.
Tescan Spectral CT in Geoscience and Mining
Full-spectrum micro-CT for 3D elemental and structural insight into geological samples.
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Non-destructive 3D elemental mapping of rocks, ores, and mineral inclusions
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K-edge detection for locating and identifying high-value or trace elements like gold or rare earth elements
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Enhanced contrast for complex mineral assemblages and pore networks
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Large-volume spectral scanning for full-core or fragment-scale analysis
For geoscientists and mining professionals, Spectral CT provides simultaneous elemental and structural data from intact samples. It supports mineral identification, ore classification, and recovery assessment—reducing dependency on destructive assays while preserving geological material for further study.
INTEGRATION THAT DRIVES INSIGHT
Tescan Spectral CT works seamlessly with SPECTRAL Suite and Acquila™ micro-CT control software to streamline spectral imaging from acquisition to analysis. Used as an add-on with the UniTOM XL platform, users can target volumes of interest, capture full-spectrum data, and visualize structural and elemental information in one workflow.
Researchers benefit from intuitive controls, guided reconstruction, and automated spectral processing. Spectral Suite handles spectrum matching, K-edge detection, and compositional mapping with minimal setup. This delivers consistent, reproducible results across samples and accelerates multi-energy micro-CT analysis.
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