Targeted oxygen injection enhances surface contrast and reduces curtaining during high-resolution cross-sectioning of carbon materials.
Polymer nanocomposites incorporating MXene sheets offer promising properties for mechanical, electrical, and thermal applications. However, their internal structure is difficult to analyze using conventional FIB-SEM workflows. Xe⁺ plasma milling often produces curtaining artifacts and only limited material contrast, so introducing oxygen gas injection helps manage curtaining more effectively and enhances phase distinction between the carbon-rich polymer and MXene sheets.
This study presents a selective milling workflow using Tescan OptiGIS O2. Gas-assisted plasma milling improves surface quality, reduces curtaining, and reveals MXene sheet orientation inside the composite — offering more reliable insights into material behavior and dispersion.
Engineered for advanced sample preparation in beam-sensitive or compositionally complex materials, the AMBER X supports targeted contrast enhancement workflows with ultra-high-resolution imaging.
The OptiGIS O2 module enhances FIB-SEM workflows with controlled oxygen delivery, improving surface quality and imaging precision in carbon-based materials.
Enables faster material removal in carbon-rich polymers and composites, with reduced redeposition
Enhances SEM contrast and smoothness by minimizing curtaining artifacts
Allows fine-tuned milling in materials like silicon or aluminum, improving control over trench shape and depth
Correlative nanoscale analysis uncovers lithium distribution and chemical pathways that drive cathode performance loss.
Prepare deformation-free, large-area surfaces for reliable EBSD analysis, even in complex, multi-phase materials.
Accelerate your time-to-data with optimized plasma FIB milling, demonstrated on silicon carbide cross-sectioning.
Combined 3D imaging techniques reveal multiscale porosity patterns and their structural impact in HA-ZrO₂ fiber-reinforced ceramics.
Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods.
