FIB-SEM cross-sectioning reveals the hidden structures that govern material performance. From grain boundaries to porosity, precise 3D characterization supports research, quality assurance, and failure analysis.
FIB-SEM studies are often limited by milling speed and time-consuming setup. Tescan plasma FIB streamlines large-volume cross-sectioning and tomography, delivering faster and more reproducible datasets.Accelerate sample preparation and 3D reconstruction
Preparing EBSD-ready surfaces across millimeter-scale regions is challenging when using conventional approaches. Tescan plasma FIB enables low-angle polishing over large areas while minimizing sample damage.
Complex materials demand more than structural imaging. Tescan FIB-SEM platforms integrate 3D tomography with EDS, EBSD, and ToF-SIMS for correlative insights into chemistry and crystallography.
Fiber-reinforced ceramics rely on porosity distribution for mechanical performance and bioactivity. Tescan’s multiscale imaging approach connects micro-CT with high-resolution FIB-SEM tomography.
Synchrotron experiments require site-specific preparation of large or irregular samples with minimal preparation damage. Tescan plasma FIB systems provide the control and volume capacity needed for beamline studies.
Selective milling of oxides, polymers, or other sensitive materials can be difficult with conventional FIB approaches. Tescan’s smart oxygen injection technology enables controlled and targeted removal of these materials mentioned above.
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High-throughput plasma FIB-SEM for EBSD-ready sample surfaces.
Plasma FIB-SEM systems for multimodal 3D battery material characterization.
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Smart oxygen injection system for enhanced plasma FIB-SEM performance.
