Demos
Sample to insight—experience the power of Tescan workflows live.
at M&M 2026
Presentations
From breakthrough research to transformative technologies.
Meet and Greet
Your challenges. Our expertise. Let's connect.
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Laser
New: Tescan FemtoChisel™
Femtosecond Precision. Analysis-Ready Results.
Demo at Tescan Booth 430
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Demo description
Experience how FemtoChisel™ bridges the gap between sample localization and high-resolution analysis. Learn how femtosecond laser processing prepares samples for downstream FIB-SEM, TEM, and analytical microscopy workflows.
Located at TESCAN's Booth 430
PLASMA FIB-SEM
Tescan AMBER X™ 2 Plasma FIB-SEM
Powered by MISTRAL™, designed for clean, fast, precise prep
Demo at Tescan Booth 430
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Demo description
See how Tescan AMBER X™ 2 combines high-throughput Xe Plasma FIB milling with ultra-high-resolution SEM imaging to accelerate materials characterization, semiconductor failure analysis, and TEM sample preparation.
Discover:
- Large-volume 3D characterization
- Ga⁺-free TEM lamella preparation
- High-resolution imaging of challenging materials
- Correlative analysis with structural, chemical, and crystallographic insights
Join the live demo and explore faster pathways to nanoscale discovery.
Located at TESCAN's Booth 430
UHR SEM
Tescan CLARA™ UHR-SEM
Field-free UHR SEM for high-contrast imaging of sensitive materials.
Demo at Tescan Booth 430
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Demo description
Unlock new insights with Tescan CLARA.
Join our experts for a live demonstration of Tescan CLARA and learn how researchers are using ultra-high-resolution FE-SEM imaging to characterize materials, investigate biological structures, and analyze advanced devices. See real-world applications, explore key workflows, and discover how CLARA transforms complex scientific questions into actionable answers.
Located at Tescan's Booth 430
MICRO-CT
New: Tescan UniTOM™ HR 2 micro-CT
Uncompromised Discovery in Dynamic Micro-CT.
Demo at Tescan Booth 430
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Demo description
Discover Tescan UniTOM HR 2, the dynamic micro-CT system combining sub-micron resolution and 4D imaging for non-destructive characterization across life sciences, materials science, geoscience, and semiconductor research.
Located at TESCAN's Booth 430
STEM
Tescan TENSOR™ STEM
Novel Automated Platform for Analytical STEM and 4D-STEM Characterization
Visit the expert at Tescan Booth 430
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Discuss your application with a TENSOR expert and discover new approaches to semiconductor characterization, failure analysis, and materials research.
Located at TESCAN's Booth 430
DEMO/COMPETITION
Tescan EXLO™ Lift-Out
Competition: Open to all skill levels.
Tescan EXLO™ makes lift-out accessible, repeatable, and fun.
Visit Booth 430 to participate.
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Tescan EXLO is not simply a sample preparation tool—it is a workflow optimization platform that unlocks greater productivity, throughput, and return on investment from existing FIB-SEM infrastructure while improving specimen quality and accelerating scientific and industrial outcomes.
Hands-on Microscopy Workshops
Join focused sessions led by TESCAN experts and explore advanced imaging techniques in depth.
12:45 - 13:45
February 27, 2023
12:45 - 13:45
February 27, 2023
12:45 - 13:45
February 27, 2023
12:45 - 13:45
February 27, 2023
12:45 - 13:45
February 27, 2023
12:45 - 13:45
February 27, 2023
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February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
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February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
x
February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
x
February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
x
February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
x
February 27, 12:45 - 13:45, LL Copernicum, level 0
Fill the form to register for a workshop
M&M Scientific Program
Join focused sessions led by TESCAN experts and explore advanced imaging techniques in depth.
From Routine to Remarkable: MIRA XR – Analytical UHR-SEM Built for Throughput at Any Scale
12:45 PM - 01:45 PM
February 27, 2023
Application Specialist for FIB-SEM, TESCAN
Limited seats available
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From Routine to Remarkable: MIRA XR – Analytical UHR-SEM Built for Throughput at Any Scale
February 27, 12:45 PM - 01:45 PM, booth 123
Fill the form to register for a workshop
Workshop details
Introducing MIRA XR – the analytical SEM reimagined for speed, usability, and ultra-high-resolution imaging. Perfect for analytical workflows across materials science disciplines. Designed to deliver high throughput without compromising on resolution or automation. A productivity platform for every user, from QA labs to advanced research teams.
Located at TESCAN's Booth 1324
M&M Scientific Program
Explore cutting-edge microscopy research, imaging technologies, and analytical techniques shaping scientific discovery.
Microscopy-Guided Machine Learning for Femtosecond-Laser Surface Engineering of Glass Microfluidic Lab-on-Chip Devices
03:00 PM - 05:30 PM
August 3, 2026
Head of AI & Advanced Solutions
SEM 3D Reconstruction: A Deep Learning Approach Using Adaptive Masking and Multi-Angle Disparity Fusion
03:00 PM - 05:30 PM
August 3, 2026
Head of Technology - Laser
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Advancing Electron Channeling Contrast Imaging (ECCI) based Crystallographic Defect Analysis in natural materials using AstroECP for electron channeling pattern (ECP) indexing
11:00 AM - 11:15 AM
August 4, 2026
Professor | University of British ColumbiiaDepartment of Materials Engineering
Characterization @ UBC – drawing together community across the University of British Columbia
11:45 AM - 12:00 PM
August 4, 2026
Professor | University of British ColumbiiaDepartment of Materials Engineering
The Role of Focused Ion Beam Probe Profiles on TEM Specimen Quality and Beam Damage
02:15 PM - 02:30 PM
August 4, 2026
Sr Product Marketing Manager - FIB
Laser-First Specimen Preparation for TEM and NanoCT
02:30 PM - 02:45 PM
August 4, 2026
Head of Technology - Laser
Seeing Beyond Grayscale: Spectral CT for Polymer Multi-Material Systems
03:00 PM - 05:30 PM
August 4, 2026
Micro-CT Application Engineer
CT-Guided Laser Access and Correlative Microscopy from Intact Smartphone Assemblies to Buried Advanced Packages
10:45 AM - 11:00 AM
August 5, 2026
Head of AI & Advanced Solutions
Large Volume pFIB-SEM 3D Analysis of Variants and Prior Austenite Grain Structures in Steels
11:00 AM - 11:15 AM
August 5, 2026
Professor | University of British Columbia | Department of Materials Engineering
Inspection-Ready Laser-Milled Access Holes for SEM and Confocal Microscopy in Microelectronics Failure Analysis
02:00 PM - 02:15 PM
August 5, 2026
Head of AI & Advanced Solutions
High-Throughput Laser Cross-Sectioning for Inspection-Grade Correlative Microscopy of Advanced Microelectronics Packages
02:15 PM - 02:30 PM
August 5, 2026
Head of Technology - Laser
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Microscopy-Guided Machine Learning for Femtosecond-Laser Surface Engineering of Glass Microfluidic Lab-on-Chip Devices
August 3, 03:00 PM - 05:30 PM, Exhibit Hall
Fill the form to register for a workshop
x
SEM 3D Reconstruction: A Deep Learning Approach Using Adaptive Masking and Multi-Angle Disparity Fusion
August 3, 03:00 PM - 05:30 PM, Exhibit Hall
Fill the form to register for a workshop
x
Advancing Electron Channeling Contrast Imaging (ECCI) based Crystallographic Defect Analysis in natural materials using AstroECP for electron channeling pattern (ECP) indexing
August 4, 11:00 AM - 11:15 AM
Fill the form to register for a workshop
x
Characterization @ UBC – drawing together community across the University of British Columbia
August 4, 11:45 AM - 12:00 PM
Fill the form to register for a workshop
x
The Role of Focused Ion Beam Probe Profiles on TEM Specimen Quality and Beam Damage
August 4, 02:15 PM - 02:30 PM
Fill the form to register for a workshop
x
Laser-First Specimen Preparation for TEM and NanoCT
August 4, 02:30 PM - 02:45 PM
Fill the form to register for a workshop
x
Seeing Beyond Grayscale: Spectral CT for Polymer Multi-Material Systems
August 4, 03:00 PM - 05:30 PM, Exhibit Hall
Fill the form to register for a workshop
x
CT-Guided Laser Access and Correlative Microscopy from Intact Smartphone Assemblies to Buried Advanced Packages
August 5, 10:45 AM - 11:00 AM, Room: S102 E
Fill the form to register for a workshop
x
Large Volume pFIB-SEM 3D Analysis of Variants and Prior Austenite Grain Structures in Steels
August 5, 11:00 AM - 11:15 AM
Fill the form to register for a workshop
x
Inspection-Ready Laser-Milled Access Holes for SEM and Confocal Microscopy in Microelectronics Failure Analysis
August 5, 02:00 PM - 02:15 PM, Room: S101 D
Fill the form to register for a workshop
x
High-Throughput Laser Cross-Sectioning for Inspection-Grade Correlative Microscopy of Advanced Microelectronics Packages
August 5, 02:15 PM - 02:30 PM, Room: S102 E
Fill the form to register for a workshop
Your challenges. Expert insights in microscopy, imaging, and analysis.
Malcolm Warrand
VP of Sales, Americas
Lucille Giannuzzi,
Ph.D.
FIB-SEM Solutions
Kathrin Rudolph,
Ph.D.
Life Science Solutions
Trevan Landin
Quantum Solutions
Michael Gray
Semiconductor Solutions
Thiago Vilas-Boas
Customer Service Director, Americas
