New CLARA™ SEM for Nanoscale Materials Characterization
Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
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Tescan launches the new CLARA™, an ultra-high-resolution SEM designed for nanoscale materials characterization and advanced imaging.
Tescan joins the Shimadzu Group, expanding innovation, global reach, and integrated solutions while maintaining its customer-focused approach.
Explore on-site demos at Tescan’s new scanning electron microscopy lab in Korea, supporting semiconductor, research, and university users with FIB-SEM expertise.
Carlyle and other shareholders agree to a potential sale of Tescan to Shimadzu Corporation, subject to regulatory approvals.
Discover how Tescan FemtoChisel laser technology improves semiconductor sample preparation with greater speed, precision and workflow efficiency.
Discover how Tescan CEO Jean-Charles Chen explains the company’s rebranding, strategic priorities, and vision for the future of scientific discovery.