November 26–27 | CEITEC BUT, Brno
Join Tescan at CEITEC BUT in Brno to explore advances in EBSD, electron microscopy, and multimodal 3D materials characterization.
Tescan is pleased to take part at this seminar organized by AMETEK, Gatan, and EDAX, bringing together experts and researchers to explore the latest advances in electron microscopy, EBSD, and multimodal materials characterization.
The two-day event will take place at CEITEC BUT in Brno and will feature technical presentations, applications, and discussions focused on advanced materials characterization techniques
During the seminar, Jiří Dluhoš will present:
Tescan AMBER X 2 for Multimodal 3D Materials Characterization
Discover how the Tescan AMBER X 2 enables advanced multimodal and 3D characterization of materials, combining complementary analytical techniques to provide deeper insights into complex material structures.
Don’t miss this opportunity to learn from industry experts, explore the latest characterization technologies, and connect with fellow materials science professionals.
Join us at CEITEC BUT in Brno for two days of technical presentations and discussions on EBSD, electron microscopy, and multimodal materials characterization.
Register to attend and explore the latest approaches in advanced materials analysis.
Jiří Dluhoš is a Principal Application Specialist at Tescan, working with advanced electron microscopy and materials characterization applications. At the EBSD Workshop, he will present the Tescan AMBER X 2 and its capabilities for multimodal 3D materials characterization.
