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On-demand WEBINAR | Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™ 

Beam-sensitive materials can degrade during conventional analytical STEM workflows, making reliable structural and chemical characterization difficult.

In this on-demand webinar, Dr. Daniel Nemecek of Tescan and Prof. Andy Brown of the University of Leeds introduce the new cryo-EM solution for Tescan TENSOR™, which enables cryo-STEM, cryo-EDS, cryo-4D-STEM, and cryo-3D ED for the multimodal characterization of beam-sensitive samples.  

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Successful cryogenic analysis requires more than keeping a specimen cold. Sample transfer, electron dose, ice contamination, and acquisition conditions must all be carefully controlled to preserve material integrity and produce reliable data.

Controlling these factors is particularly important for scientists working with polymers, organic materials, nanoparticles, nanowires, zeolites, MOFs and COFs, perovskites, biomaterials, and other beam-sensitive samples.

In this on-demand webinar, you will explore the cryo workflow on Tescan TENSOR™, from holder cooling and sample loading to low-dose navigation and multimodal data acquisition. Learn how near-UHV column conditions and software-guided low-dose procedures help limit ice contamination and unnecessary beam exposure. Application examples demonstrate how imaging, compositional, and diffraction data can be acquired on a single integrated platform, providing complementary insights into beam-sensitive materials. 

Why This Matters

For beam-sensitive materials, cryogenic conditions can help preserve structural and chemical information that might otherwise be altered during analysis. However, this protection must be maintained throughout the complete workflow, from sample loading and transfer to navigation and data acquisition.

Tescan TENSOR™ addresses these challenges through software-guided low-dose procedures, near-UHV column conditions, and a streamlined cryo-holder workflow. Together, these capabilities help preserve sample integrity, limit unnecessary beam exposure and ice growth while supporting stable, long-duration analytical experiments. 

What You Will Learn

  • How the new cryo-EM solution brings cryo-STEM, cryo-EDS, cryo-4D-STEM, and cryo-3D ED to beam-sensitive materials on Tescan TENSOR™

  • How the cryo-holder is cooled, loaded, and transferred into the microscope while maintaining the sample at cryogenic temperature

  • How TENSOR™ simplifies cryo-holder insertion and reduces the risk of liquid nitrogen spillover during sample transfer

  • How software-guided low-dose procedures help minimize unnecessary beam exposure during analysis

  • How near-UHV column conditions help minimize ice growth and enable extended cryo-EDS and multimodal analysis

  • How cryo-STEM, cryo-EDS, and cryo-4D STEM are applied in case studies of iron and coated TiO₂ nanoparticles 

Register to access the on-demand webinar and explore how Tescan TENSOR™ can support low-dose cryo-STEM and cryo-4D STEM analysis of beam-sensitive materials and expand what is possible in materials science research. 

Speakers

Daniel_Němeček_ct_m-3-1
Daniel Nemecek, PhD

Product Marketing Manager – Analytical TEM/STEM, Tescan

Dr. Daniel Nemecek is Senior Product Marketing Manager of TENSOR™ at Tescan. With more than 20 years of experience in electron microscopy and spectroscopy across academia and industry, he combines strong scientific background with extensive knowledge of analytical TEM/STEM technologies.

In this webinar, he introduces the new cryo-EM solution for TENSOR™ and explains its cryogenic workflow, low-dose procedures, and analytical capabilities. 

 

Andy-Brown
Prof. Andy Brown

Professor of Materials Characterization, University of Leeds

Andy Brown is an expert in analytical transmission electron microscopy and materials characterization. His research focuses on developing methods for the accurate analysis of nanoparticles, soft materials, organic compounds, and other beam-sensitive samples.  

In the webinar, he shares practical application examples and insights from early experience investigating beam-sensitive samples under cryogenic conditions using Tescan TENSOR™. 

His focus is on aligning advanced hardware technologies, including detectors and optics, with intelligent software automation to deliver reliable, high‑performance instruments for applications in Mining, Batteries, and Materials Science.

Unlocked content
Cryo-EM for Beam-Sensitive Materials

Watch the On-Demand Webinar Now

Explore Beam-Sensitive Materials with Cryo-EM

Access the on-demand webinar to discover how Tescan TENSOR™ enables low-dose cryo-STEM, cryo-EDS and cryo-4D-STEM analysis while helping preserve sensitive samples.

 

Register for the webinar