Reveal Subsurface Structures with Confidence
Obtain deep, clean cross-sections of electrodes and interfaces using Xe Plasma FIB with Rocking Stage and True X-Sectioning for artifact-free milling.
Deliver 2D and 3D insight into the internal structure and composition of battery materials with Tescan AMBER X 2, a high-throughput, ultra-high-resolution plasma FIB-SEM. Accelerate advanced battery research, quality assurance, and failure analysis with comprehensive multimodal characterization of both conventional and next-generation materials, ranging from the millimeter scale to the nanoscale.
Reveal Subsurface Structures with Confidence
Obtain deep, clean cross-sections of electrodes and interfaces using Xe Plasma FIB with Rocking Stage and True X-Sectioning for artifact-free milling.
Map Lithium and SEI Chemistry in 3D
Correlate structural and chemical information through integrated ToF-SIMS, EDS, and Raman spectroscopy to visualize lithium distribution and SEI composition.
Preserve Sensitive Battery Materials
Protect air- and moisture-sensitive samples using inert gas transfer and cryogenic workflows to maintain true material chemistry during analysis.
Characterize Large Volumes at High Resolution
Access millimeter-scale cross-sections without compromising nanoscale detail through high-current Xe+ plasma milling and UHR SEM imaging.
Accelerate Throughput Across Workflows
Streamline repetitive tasks with automated alignment, milling, and imaging routines for efficient, reproducible 2D and 3D characterization.
Quantify Degradation Mechanisms Precisely
Identify cracks, delamination, and porosity changes within electrodes using correlative FIB-SEM and 3D tomography for accurate failure interpretation.
Tescan Amber X2 and ToF-SIMS analysis of the SEI formation reveals how cycling protocols impact capacity retention and long-term battery performance.
Multimodal characterization using FIB-SEM integrated with ToF-SIMS and Raman spectroscopy reveals the microstructural and chemical mechanisms behind capacity loss and internal resistance growth.
Measure electrode porosity, pore connectivity, and accessibility in 3D using high-volume FIB-SEM tomography.
Cross-sectional imaging and elemental mapping reveal wetting behavior, lithium transport, and interface degradation in polymer-based solid-state lithium-ion cells.
TEM AutoPrep™ and AutoPrep Pro™ streamline the full workflow—from trenching to final polishing—using AI-driven control within the Essence™ interface.
Automates milling, lift-out, and polishing for consistent, high-quality lamellae
Offers predefined or customizable workflows for electrodes, electrolytes, and solid-state samples
Handles multiple samples automatically to maximize system uptime
In battery research, AutoPrep Pro™ delivers repeatable, contamination-free TEM specimens from delicate electrodes and interfaces, enabling faster, more reliable material evaluation.
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Amber X 2
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Ion column: Mistral™ Xe Plasma FIB for high-throughput large-volume cross-sectioning and artifact-free milling |
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Electron column: BrightBeam™ Field-Free UHR SEM for high-resolution imaging at low landing energies |
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Stage: 5-axis fully motorized Rocking Stage with True X-Sectioning for large-area sample preparation |
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Detectors: Multi-detector configuration for SE, BSE, STEM-in-SEM, and energy-filtered signal collection |
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Analytical integration: Supports EDS, EBSD, ToF-SIMS, and Raman spectroscopy for multimodal 2D and 3D analysis |
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Automation: AI-driven TEM AutoPrep™ / AutoPrep Pro™ for unattended TEM/STEM lamella preparation |
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Software platform: Essence™ GUI with advanced modules for tomography, automation, and correlative workflows |
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Sample environment: Cryogenic and inert gas transfer compatibility for air- and moisture-sensitive materials |
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Maximum sample size: Up to 100 mm diameter |
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Workstation: Ergonomic design with vibration-damped table for high stability during nanoscale analysis |
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Amber X 2
|
|---|
|
Ion column: Mistral™ Xe Plasma FIB for high-throughput large-volume cross-sectioning and artifact-free milling |
|
Electron column: BrightBeam™ Field-Free UHR SEM for high-resolution imaging at low landing energies |
|
Stage: 5-axis fully motorized Rocking Stage with True X-Sectioning for large-area sample preparation |
|
Detectors: Multi-detector configuration for SE, BSE, STEM-in-SEM, and energy-filtered signal collection |
|
Analytical integration: Supports EDS, EBSD, ToF-SIMS, and Raman spectroscopy for multimodal 2D and 3D analysis |
|
Automation: AI-driven TEM AutoPrep™ / AutoPrep Pro™ for unattended TEM/STEM lamella preparation |
|
Software platform: Essence™ GUI with advanced modules for tomography, automation, and correlative workflows |
|
Sample environment: Cryogenic and inert gas transfer compatibility for air- and moisture-sensitive materials |
|
Maximum sample size: Up to 100 mm diameter |
|
Workstation: Ergonomic design with vibration-damped table for high stability during nanoscale analysis |
Tescan
Libušina třída 21
623 00 Brno
Czech Republic
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