WEBINAR | Dynamic-to-Detail Micro-CT in One Workflow: UniTOM HR 2

TESCAN AMBER X 2 for Batteries 

Amber X 2 hero image
Amber X 2 hero image

Deliver 2D and 3D insight into the internal structure and composition of battery materials with Tescan AMBER X 2, a high-throughput, ultra-high-resolution plasma FIB-SEM. Accelerate advanced battery research, quality assurance, and failure analysis with comprehensive multimodal characterization of both conventional and next-generation materials, ranging from the millimeter scale to the nanoscale.

  • Improve battery lifespan and charge–discharge rate by analyzing lithium trapping, distribution, intercalation processes, and SEI properties with Tescan’s integrated ToF-SIMS, EDS, and Raman spectroscopy. Drive battery performance and innovation through comprehensive structural and chemical characterization of electrodes, separators, and their interfaces using high-resolution 3D tomography and 3D chemical analysis. Identify subsurface cracks, voids, and interfacial instabilities with high-resolution SEM end-pointing

  • Prepare gallium-free TEM lamellae while preserving surface chemistry and protective layers

  • Deliver repeatable results across lithium-ion, solid-state, and next-generation battery materials

  • Increase analytical efficiency with automated alignments and high-current Xe+ beam processing

HOW TESCAN AMBER X 2 ADVANCES YOUR BATTERY MATERIALS RESEARCH

Reveal Subsurface Structures with Confidence

Obtain deep, clean cross-sections of electrodes and interfaces using Xe Plasma FIB with Rocking Stage and True X-Sectioning for artifact-free milling.

Map Lithium and SEI Chemistry in 3D

Correlate structural and chemical information through integrated ToF-SIMS, EDS, and Raman spectroscopy to visualize lithium distribution and SEI composition.

Preserve Sensitive Battery Materials

Protect air- and moisture-sensitive samples using inert gas transfer and cryogenic workflows to maintain true material chemistry during analysis.

Characterize Large Volumes at High Resolution

Access millimeter-scale cross-sections without compromising nanoscale detail through high-current Xe+ plasma milling and UHR SEM imaging.

Accelerate Throughput Across Workflows

Streamline repetitive tasks with automated alignment, milling, and imaging routines for efficient, reproducible 2D and 3D characterization.

Quantify Degradation Mechanisms Precisely

Identify cracks, delamination, and porosity changes within electrodes using correlative FIB-SEM and 3D tomography for accurate failure interpretation.

TEM AutoPrep™ / AutoPrep Pro™ SOFTWARE

Automated precision for TEM and STEM lamella preparation

TEM AutoPrep™ and AutoPrep Pro™ streamline the full workflow—from trenching to final polishing—using AI-driven control within the Essence™ interface.

 

  • Automates milling, lift-out, and polishing for consistent, high-quality lamellae

  • Offers predefined or customizable workflows for electrodes, electrolytes, and solid-state samples

  • Handles multiple samples automatically to maximize system uptime

 

In battery research, AutoPrep Pro™ delivers repeatable, contamination-free TEM specimens from delicate electrodes and interfaces, enabling faster, more reliable material evaluation.

TESCAN AMBER X 2 FOR BATTERY RESEARCH

Technical specification
Amber X 2

Ion column: Mistral™ Xe Plasma FIB for high-throughput large-volume cross-sectioning and artifact-free milling

Electron column: BrightBeam™ Field-Free UHR SEM for high-resolution imaging at low landing energies

Stage: 5-axis fully motorized Rocking Stage with True X-Sectioning for large-area sample preparation

Detectors: Multi-detector configuration for SE, BSE, STEM-in-SEM, and energy-filtered signal collection

Analytical integration: Supports EDS, EBSD, ToF-SIMS, and Raman spectroscopy for multimodal 2D and 3D analysis

Automation: AI-driven TEM AutoPrep™ / AutoPrep Pro™ for unattended TEM/STEM lamella preparation

Software platform: Essence™ GUI with advanced modules for tomography, automation, and correlative workflows

Sample environment: Cryogenic and inert gas transfer compatibility for air- and moisture-sensitive materials

Maximum sample size: Up to 100 mm diameter

Workstation: Ergonomic design with vibration-damped table for high stability during nanoscale analysis

Amber X 2

Ion column: Mistral™ Xe Plasma FIB for high-throughput large-volume cross-sectioning and artifact-free milling

Electron column: BrightBeam™ Field-Free UHR SEM for high-resolution imaging at low landing energies

Stage: 5-axis fully motorized Rocking Stage with True X-Sectioning for large-area sample preparation

Detectors: Multi-detector configuration for SE, BSE, STEM-in-SEM, and energy-filtered signal collection

Analytical integration: Supports EDS, EBSD, ToF-SIMS, and Raman spectroscopy for multimodal 2D and 3D analysis

Automation: AI-driven TEM AutoPrep™ / AutoPrep Pro™ for unattended TEM/STEM lamella preparation

Software platform: Essence™ GUI with advanced modules for tomography, automation, and correlative workflows

Sample environment: Cryogenic and inert gas transfer compatibility for air- and moisture-sensitive materials

Maximum sample size: Up to 100 mm diameter

Workstation: Ergonomic design with vibration-damped table for high stability during nanoscale analysis

AMBER-X 2

GET IN Touch

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Where can you find us:

Tescan
Libušina třída 21
623 00 Brno
Czech Republic

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 48.1485965 58.375799 54.663142 19.195447 56.975106 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.479653 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928 -12.08688

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