WEBINAR | Up to 40% Faster Automated TEM Lamella Preparation with new Ga⁺ FIB Column

Investigating Interfaces in Solid-State Batteries with Tescan FIB-SEM and ToF-SIMS

Cross-sectional imaging and elemental mapping reveal wetting behavior, lithium transport, and interface degradation in polymer-based solid-state lithium-ion cells.

hero
hero
Unlocked content

Solid-State Electrolytes Present New Challenges — and New Opportunities for High-Resolution Analysis

Solid-state lithium-ion batteries (SSBs) offer higher energy density and improved safety compared to conventional liquid-electrolyte designs. But their performance depends heavily on subtle material interactions, including electrolyte wetting, interfacial integrity, and ion distribution.

This study, conducted in collaboration with Dragonfly Energy Corp., demonstrates how Tescan AMBER X with ToF-SIMS and FIB-SEM workflows enable detailed analysis of polymer-based SSBs. By combining structural and chemical imaging, researchers gain a clearer view of battery behavior — including where solid-state electrolyte contacts break down, where lithium accumulates, and how cracking develops over time. 

Why Study Solid-State Battery Interfaces

with Tescan

01
Root of the Problem

Why Interfaces Matter in Solid-State Battery Development

The move from liquid to solid-state electrolytes removes flammability risks, but introduces new barriers to efficient ion transport. In solid-state batteries, the interface between electrolyte and electrode is no longer a liquid–solid boundary. It’s now a complex, often fragile junction where mechanical fit, chemical stability, and ion mobility must all align.

Poor contact leads to increased interfacial impedance, lithium trapping, and faster degradation. Understanding how materials behave at these junctions is essential for developing SSBs that are not only safer, but truly competitive in energy storage applications.

02
Materials and Methods

Multimodal Analysis Using FIB-SEM with Integrated ToF-SIMS

Samples of polymer-based SSBs developed by Dragonfly Energy® were prepared using plasma FIB milling on the TESCAN AMBER X. Cross sections revealed the internal architecture, including LFP cathode, polymer electrolyte, and graphite anode layers.

Regions of interest were analyzed using secondary and backscattered electron imaging, followed by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for elemental lithium mapping. Multiple areas were examined to compare well-bonded and poorly adhered zones and identify differences in interfacial chemistry and layer morphology.

03
Results and Discussion

Wetting Behavior, Cracking, and Lithium Mapping

Cross-sectional FIB-SEM images exposed both good contact areas and delaminated regions within the solid-state electrolyte layer. In poorly bonded zones, gaps between the polymer and electrode materials were clearly visible — correlating with expected increases in resistance. ToF-SIMS mapping confirmed heterogeneous lithium distribution, revealing regions of lithium accumulation and suspected trapping sites.

Cracking was observed in cathode materials, particularly after extended cycling. Some interfaces showed evidence of unwanted reactions, likely due to mismatch in chemical potential or electrolyte instability. These results demonstrate how combining imaging and mass spectrometry provides a complete picture of structural and functional performance, guiding formulation improvements and interface design.

GET IN Touch

Contact us

Get the most out of Tescan

This is more than information; it's an advantage. We've compiled our technical whitepapers, detailed product flyers, and on-demand webinars to provide you with the knowledge that makes a real difference. Sign up now to access the insights you need to make an impact.

Tescan Instruments & Technology

Used in This Workflow

Tescan AMBER X 2

Tescan AMBER X combines high-resolution SEM imaging, FIB milling, and multimodal analysis tools — making it ideal for interface characterization in advanced energy storage materials.

  • Plasma FIB for fast, clean sectioning of battery stacks

  • Field-free SEM for low-kV, high-contrast surface imaging

  • Integrated STEM and RSTEM modes for nanoscale lamella inspection

 

AMBER-X2

ToF-SIMS Module – Elemental Mapping at the Battery Interface

Integrated within the AMBER X platform, ToF-SIMS enables spatially resolved chemical analysis of lithium and electrolyte components across electrode interfaces.

  •  Maps lithium in 2D and 3D with high sensitivity

  • Highlights trapped regions and areas of poor adhesion

  • Ideal for studying cycling-induced chemical changes and solid-state electrolyte behavior

GET IN Touch

Contact us

map

Where can you find us: 

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic

info@Tescan.com