Supports your Next
Breakthrough

Streamline development and quality control with Tescan’s FIB-SEM and STEM systems. Gain accurate, nanoscale insight into structures, interfaces, and defects to optimize fabrication processes and extend device performance.

• Defect localization and failure analysis
• Delayering and cross-sectioning
• Root cause analysis
• Circuit modification and nanoprototyping
• TEM lamella preparation

Reveal electrode structure, monitor interface degradation, and detect dendrite growth using Tescan’s SEM, FIB-SEM, and cryo workflows. Preserve fragile chemistries while gaining structural and compositional insight across ambient and cryogenic conditions.

• Lithium dendrite detection
• Electrode–electrolyte interface analysis
• Cryo-FIB sample preparation
• In situ and 3D imaging workflows
• Structural and chemical degradation studies

Visualize ultrastructure across cells, tissues, and organoids with imaging workflows designed to protect delicate biological samples. Tescan’s Cryo-FIB-SEM enables high-contrast imaging, precise sample preparation, and consistent results — all while preserving native structure.

• Cryo-FIB-SEM imaging
• Correlative light and electron microscopy (CLEM)
• Volume EM and 3D reconstruction
• Organoid and tissue-level analysis

Analyze rock cores, cuttings, and thin sections with workflows that reveal pore morphology, mineral composition, and structural variation. Tescan’s FIB-SEM and micro-CT systems support non-destructive 2D and 3D imaging for high-resolution insight across geological samples.

• Mineral mapping and compositional contrast
• Pore network and permeability analysis
• 3D petrography and core characterization
• Automated mineralogy and particle analysis
• Quantitative EDS and BSE workflows