Field-Free UHR SEM Technology for Exceptional Contrast and Resolution

BrightBeam™

BrightBeam™ is Tescan's proprietary ultra-high-resolution electron column technology used in systems such as Tescan CLARA™, Tescan MIRA XR™, and Tescan AMBER™ 2. It combines a field-free electrostatic–magnetic objective lens, an in-column potential tube, advanced in-column electron detection, and In-Flight Beam Tracing® technology to deliver exceptional imaging performance at low landing energies. BrightBeam™ enables ultra-high-resolution field-free imaging, advanced contrast methods, and intuitive operation across a wide range of materials.

In-column potential tube
Field-free electrostatic–magnetic objective lens
Ultra-high-resolution imaging at low landing energies
Axial and angular secondary and backscattered electron detection
Energy-filtered backscattered electron imaging*
Selective signal filtering by electron energy and take-off angle*
In-Flight Beam Tracing® automated beam optimization
Wide Field Optics® for intuitive sample navigation

Why BrightBeam™

Modern materials characterization requires more than resolution alone. Researchers need to image sensitive samples, reveal nanoscale surface details, and distinguish material differences without compromising image quality.

BrightBeam™ addresses these challenges through a unique combination of field-free electron optics, selective signal detection, and intelligent beam optimization, helping users extract more information from every scan.

Key Benefits

Ultra-High Resolution at Low Voltages

BrightBeam™ delivers ultra-high-resolution imaging at low landing energies, enabling detailed observation of beam-sensitive, non-conductive, magnetic, and complex materials while helping reduce charging effects and preserve surface-sensitive information.

Field-Free Imaging

The BrightBeam™ column combines electrostatic and magnetic objective lens to provide field-free imaging conditions, supporting analysis of magnetic and sensitive materials while maximizing topographical information.

Exceptional Contrast Method Versatility*

Advanced in-column detectors selectively filter electrons according to both their energy and take-off angle, enabling enhanced topographical, compositional, and materials contrast from the same region of interest.

Simplified Operation with In-Flight Beam Tracing™

Integrated In-Flight Beam Tracing® continuously models and optimizes beam conditions in real time, enabling fast setup of imaging and analytical workflows without manual column adjustments.

Applications

BrightBeam™ is designed for advanced characterization of

Materials and metallurgy

Battery materials

Nanomaterials

Beam-sensitive samples

Magnetic materials

Semiconductor research

Failure analysis

Academic and industrial R&D

Unlocked content

Tescan Orage 2 APPLICATION EXAMPLES

[application examples in few words]

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4D-STEM detector

Technical specification

Detector type	Solid state, hybrid pixel detector
Technology	Timepix 3 chip by AdvaScope, Peltier cooled
Chip parameters	256 × 256 pixel matrix; pixel size 55 µm × 55 µm
Detection limit	5 keV
Readout throughput	High throughput, 40 million hits·s⁻¹·cm⁻²
Acquisition mode	Data-driven
Control	Fully integrated into Tescan Essence^TM, motorised
Image acquisition	Live imaging: up to 2 µs/pixel 2D imaging: Diffraction patterns and/or Kikuchi lines, Bright-Field and Dark-field imaging based on user-selectable virtual apertures 4D-STEM: data cubes
Protection	Integrated shutter and interlocks

Detector type	Solid state, hybrid pixel detector
Technology	Timepix 3 chip by AdvaScope, Peltier cooled
Chip parameters	256 × 256 pixel matrix; pixel size 55 µm × 55 µm
Detection limit	5 keV
Readout throughput	High throughput, 40 million hits·s⁻¹·cm⁻²
Acquisition mode	Data-driven
Control	Fully integrated into Tescan Essence^TM, motorised
Image acquisition	Live imaging: up to 2 µs/pixel 2D imaging: Diffraction patterns and/or Kikuchi lines, Bright-Field and Dark-field imaging based on user-selectable virtual apertures 4D-STEM: data cubes
Protection	Integrated shutter and interlocks

GET IN Touch

with specialist

Where you can find us:

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic 

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 48.1485965 58.375799 54.663142 19.195447 56.975106 47.916997 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 33.600194 -12.08688 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.566531 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928

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