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Expert Talk at TechnoBite During the UK FIB&Prep User Group Meeting        

Tescan expert Martin Sláma, FIB-SEM Product Marketing Manager, will give an expert talk at TechnoBite as part of the UK FIB&Prep User Group Meeting in Loughborough on 7 October 2026.

The event brings together professionals and users of focused ion beam (FIB), FIB-SEM, and sample preparation technologies to exchange practical experience, insights, and the latest developments in the field.

Oct 7, 2026

Tescan Expert Talk

The Best TEM Sample? Here's How to Be Sure

Date & Time: October 7, 2026 | 15:25–15:35
Speaker: Martin Sláma, FIB-SEM Product Marketing Manager, Tescan
Format: In-person onsite
Location: Loughborough, Hybrid

Martin Sláma will present The Best TEM Sample? Here's How to Be Sure, focusing on TEM sample preparation within the context of FIB and advanced microscopy workflows.

About the UK FIB&Prep User Group Meeting

The meeting provides an opportunity to connect with professionals working with focused ion beam and sample preparation technologies, discuss current challenges and applications, and learn from practical experience in FIB and sample preparation.

Join us at TechnoBite to exchange insights with fellow experts and explore developments in FIB-SEM and TEM sample preparation.

We look forward to seeing you at TechnoBite!


 

Book a Meeting

Tescan at SEMICON Korea 2026

Booth D904

COEX Convention & Exhibition Center
513 Yeongdong-daero,
Gangnam-gu, Seoul 06164,
South Korea

semicon-korea-floor-plan