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October 25–30, 2026
Hosted by The Hong Kong University of Science and Technology (Guangzhou) (HKUST(GZ))
The 25th International Conference on Secondary Ion Mass Spectrometry (SIMS-25) will bring together researchers from academia, industry, and research organizations to exchange results and new ideas in secondary ion mass spectrometry (SIMS) and related techniques. The conference will cover developments from fundamental science to practical applications.
SIMS-25 provides a forum for the international SIMS community to discuss advances in SIMS, nanoscale characterization, and related analytical techniques. The event is locally hosted by HKUST(GZ) under the supervision of the international SIMS conference organizing committee.
Tescan at the Event
Tescan is a Silver Sponsor of SIMS-25 and will showcase Nanospace with ToF-SIMS, with a focus on multimodal FIB-ToF methodologies for nanoscale characterization in microelectronics.
At the 6 m² booth, Tescan will demonstrate how Nanospace combines FIB and SIMS capabilities to support the analysis of challenging samples. The platform enables correlative FIB-SIMS analysis for scientific research and nanoscale characterization.
What You Will Learn
- How combining FIB and SIMS can support multimodal nanoscale characterization.
- How correlative FIB-SIMS workflows can address analytical challenges that may be difficult to resolve using dedicated SIMS alone.
- How FIB-ToF methodologies can be applied to nanoscale characterization challenges in microelectronics.
Who Should Attend
- Researchers working with SIMS and related analytical techniques.
- Materials researchers interested in nanoscale characterization.
- Researchers and users applying SIMS to materials analysis.
- Technical users working with challenging samples that require complementary characterization methods.
Why Attend
SIMS-25 provides an opportunity to exchange research results and technical approaches with the international SIMS community. Visit the Tescan booth to discuss FIB-ToF and correlative FIB-SIMS approaches for nanoscale characterization and challenging sample analysis.
