On-demand WEBINAR | Cryo-EM solution for Beam-Sensitive Materials using Tescan TENSOR™

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On-demand WEBINAR | SEE MORE. UNDERSTAND MORE.

Introducing the New Tescan CLARA™

Watch the recording and discover how the next-generation Tescan CLARA™ helps researchers and engineers extract more information from every sample.

The new Tescan CLARA™ combines ultra-high-resolution imaging, advanced contrast methods, intelligent detection capabilities, and intuitive automation to deliver deeper insight, faster workflows, and greater confidence in every analysis. Built for today's most demanding materials characterization challenges, it enables users to move from imaging to understanding faster than ever before.  

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In this introductory webinar, you'll discover how the new Tescan CLARA™ helps you: 

  • Reveal more material information with advanced backscattered electron detection and filtering capabilities that enhance contrast and highlight details often hidden in conventional imaging.

  • Achieve ultra-high-resolution imaging at low landing energies, enabling detailed analysis of sensitive, charging, magnetic, and complex samples. 

  • Accelerate time-to-data through intuitive software, automated image optimization, and workflow-guided operation designed to simplify microscope use. 

  • Extract more information from every scan using simultaneous signal collection and advanced detector technologies that provide complementary topographic and compositional insights. 

  • Navigate samples faster and more confidently using advanced navigation capabilities and productivity-focused workflow tools. 

Why the New Tescan CLARA™? 

Modern laboratories need more than high-resolution images. They need actionable information, rapid workflows, and a system that performs consistently across a wide variety of samples and user skill levels.

The new Tescan CLARA™ is designed around a simple goal: 

Get Maximum Information from Every Sample

Powered by BrightBeam™ electron optics, advanced in-column detection, intelligent signal filtering, and Essence™ software, Tescan CLARA™ enables users to uncover nanoscale details while maintaining an efficient and intuitive workflow.

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See how the next-generation Tescan CLARA™ helps researchers move beyond imaging and gain a deeper understanding from every sample. 

Speakers

tomas boruvka
Tomas Boruvka

Senior expert in scanning electron microscopy (SEM)

Tescan

 

With extensive experience in electron beam imaging and SEM applications, Tomas works closely with researchers and industry professionals to help them achieve the highest quality analytical and imaging results.

Tomas has been deeply involved in the development and positioning of Tescan's new-generation CLARA™ field-free ultra-high-resolution SEM, bringing valuable insight into its technology, capabilities, and real-world applications.

In this webinar, he will share his expertise and discuss how the latest Tescan CLARA™ platform helps users gain deeper insights from their samples with greater ease and efficiency.

Learn How tescan CLARA 3 Reveals More From Every Sample
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SEE MORE. UNDERSTAND MORE. Introducing the New Tescan CLARA™

Watch the On-Demand Webinar Now

See More with CLARA™

Watch the on-demand webinar to discover how the new Tescan CLARA™ delivers ultra-high-resolution imaging, advanced contrast, and faster SEM workflows.

 

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