Accelerate 4D-STEM Data Acquisition
Capture diffraction and EDS datasets in minutes with high-speed beam precession and Dectris Quadro detection.
Capture High-Quality 4D-STEM Datasets in a Single Scan Using Tescan TENSOR
Tescan TENSOR delivers precise strain mapping, phase orientation, and high-throughput compositional analysis in one integrated analytical STEM platform, with precession-assisted 4D-STEM for advanced semiconductor device characterization.
With sub-2 nm resolution of precession-assisted 4D-STEM, automated beam alignments, and real-time visualization of processed 4D-STEM data, TENSOR ensures clarity, speed, and reproducibility of analytical measurements, from quantitative 2D strain analysis to phase analysis and grain mapping in polycrystalline thin films.
- 4D-STEM, precession diffraction, and EDS in one scan
- Real-time mapping with Explore™ visualization
- Automated alignment and tilt-to-zone functions
- Near-UHV conditions for sample protection
- High throughput due to fast beam precession (72 kHz), hybrid-pixel diffraction detector (Dectris Quadro), and two large EDX sensors with 2.0 sr total collection solid angle
for Material Science?
Structural and Chemical Analysis of Encapsulated Nanoparticles in Carbon Nanotubes
Multimodal 4D-STEM and EDX characterization of metal particles at the nanoscale.
Improving 4D-STEM Phase Mapping with Correlated EDX Signals
Resolve structurally similar crystalline phases with Tescan TENSOR by combining synchronized 4D-STEM and EDX signals for precise and reliable phase mapping.
Nanoscale Orientation Mapping in Deformed Ni-Based Superalloys
Crystallographic analysis of deformation cells and kink bands using Tescan TENSOR.
Atomic Structure Determination Using Precession Electron Diffraction Tomography (PEDT)
Solve crystal structures including hydrogens at sub-Angstrom resolution with precession-assisted 3D-ED workflow on Tescan TENSOR.
Phase and Orientation Analysis of Cu-Rich Sulfide Ceramics Using 3D ED and 4D-STEM on a Single Lamella
This workflow combines 3D electron diffraction and 4D-STEM mapping to identify and validate a secondary phase in thermoelectric Cu-rich sulfide ceramics — all from the same sample lamella.
Streamline Analytical STEM Workflows for 4D‑STEM and Electron Diffraction
Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods.
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Phase and Orientation Mapping in Lithium-Ion Battery Electrodes
Revealing nanoscale structure–performance relationships in cathodes and anodes using Tescan TENSOR.
Explore™
The central interface for STEM imaging, EDScompositional analysis and mapping, precession electron diffraction, and 4D-STEMworkflows. Process acquired data on-the-fly and visualize results live duringthe microscope session. Reduce time from scan to insight with real-timeoverlays, pattern recognition, and mapping tools.
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“TENSOR makesadvanced STEM feel approachable. Explore™ gives us real-time data we used towait hours for, and our team is up and running in days, not months.”
Dr. A. Brown,
Materials Scientist,
University of Leeds
Materials Scientist,
University of Leeds
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