This workflow combines 3D electron diffraction and 4D-STEM to identify and validate a secondary phase in thermoelectric Cu-rich sulfide ceramics — all from the same sample lamella.
Polycrystalline thermoelectric materials often exhibit complex nanoscale phase distributions and crystal orientations, factors that directly influence their transport properties. Yet most characterization methods capture either structure or spatial context, not both. Adding to the challenge, each technique typically requires a separate sample form.
Tescan TENSOR solves this with an integrated multimodal workflow that combines electron diffraction tomography (3D ED) and precession-assisted 4D-STEM — performed on the same FIB-prepared lamella. No additional sample prep. No instrument handoff.
In this study of Cu₂.₃Mn₀.₇GeS₄ ceramics, researchers identified and validated the crystal structure of a secondary phase, then mapped its spatial distribution and orientation. This is all within a single, uninterrupted session.
A fully integrated, multimodal, analytical STEM microscope combining high-speed diffraction imaging, orientation mapping, and automated precession workflows.
Identify structurally similar crystalline phases with Tescan TENSOR by combining synchronized 4D-STEM and EDX for precise and reliable phase mapping.
Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods.
Multimodal 4D-STEM and EDX characterization of metal particles at the nanoscale.
Use Tescan TENSOR™ with real-time precession and a hybrid-pixel detector to deliver precise, reproducible 4D-STEM diffraction data in complex nanoscale devices.
Crystallographic analysis of deformation cells and kink bands using TESCAN TENSOR.
Solve crystal structures including hydrogens at sub-Angstrom resolution with precession-assisted 3D-ED workflow on Tescan TENSOR.
