Tescan MIRA XR provides high-resolution insight into SBA-15 particle shape and structure.
Mesoporous silica materials like SBA-15 are valued for their well-ordered pores, large surface area, and tunable pore size. But to evaluate them properly, especially in their native form, the imaging method needs to match the material’s sensitivity. Too much energy, and delicate details are lost.
This study demonstrates how Tescan MIRA XR, equipped for low-voltage, high-resolution SEM imaging, allows researchers to directly observe nanorod morphology and porosity in SBA-15 without charging, coating, or damage. This is especially beneficial when performing investigations of beam-sensitive nanoscale materials.
A versatile UHR-SEM system for beam-sensitive samples.
Reveal fine surface details with BrightBeam™ electron optics and efficient signal collection
Preserve delicate or uncoated samples through low-voltage imaging
Achieve sub-nanometer resolution with optimized in-column detection for nanoscale surface information
Tescan MIRA XR enables non-destructive imaging of fiber morphology and diameter across polymer meshes.
A hierarchical SEM approach to characterizing the Cu alloy and Fe phase interface.
Automated in situ EBSD reveals transient transformations during high-temperature treatment.
Use Tescan SEMs with Dual Essence™ EDS to perform integrated SEM-EDS analysis that resolves zonation and overlapping phases in complex geological samples.
Tescan CLARA with EBSD reveals crystallographic evolution in ECAP-processed aluminum.
High-resolution SEM reveals crack origin, propagation, and final failure in widely used titanium alloy.
