Tescan CLARA
Versatile UHR field emission SEM tailored for high-detail imaging and crystallographic workflows.
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In-chamber BSE detection for channeling contrast
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BrightBeam™ technology for high resolution field free analysis
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WideField OpticsTM for fast, high resolution EBSD mapping
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Scintilator BSE detector for efficient channeling contrast detection
EBSD Mapping: Accelerate Crystallographic Structure Determination
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Fast, high resolution EBSD data acquisition from large areas
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Delivers statistically relevant grain orientation data
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Delivers accurate orientation and boundary maps
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Ideal for evaluating deformation patterns and process outcomes




