Field-free ultra-high-resolution imaging
BrightBeam™ delivers ultra-high resolution at low keV, while beam deceleration further improves resolution and signal quality
Tescan CLARA for materials science provides the widest selection of contrast methods for advanced surface characterization. It reveals fine details and hidden features across all material types, including nanomaterials, metals, and energy storage components.
Field-free ultra-high-resolution imaging
BrightBeam™ delivers ultra-high resolution at low keV, while beam deceleration further improves resolution and signal quality
Comprehensive contrast selection
Axial and MD In-Column detectors provide angular and energy-filtered contrasts, revealing hidden structures on complex surfaces.
Fast, reproducible results
In-Flight Beam Tracing™ and automated alignments enable users to optimize imaging and analysis quickly and consistently.
Seamless navigation
Wide Field Optics™ allows distortion-free navigation from 1× overview down to nanoscale features.
All-in-one analysis
A large chamber accommodates EBSD, EDS, Raman, and in-situ accessories for chemical, structural, and mechanical studies in a single tool.
Automation-ready workflows
VisualCoder and EM Expert PI provide both scripted and no-code automation options for routine tasks and custom experiments.
A hierarchical SEM approach to characterizing the Cu alloy and Fe phase interface.
Automated in situ EBSD reveals transient transformations during high-temperature treatment.
Tescan CLARA with EBSD reveals crystallographic evolution in ECAP-processed aluminum.
High-resolution SEM reveals crack origin, propagation, and final failure in widely used titanium alloy.
Automated SEM imaging with Tescan CLARA reveals morphology and size variation in Ni-based cathode materials.
Tescan CLARA delivers pore-level insight into beam-sensitive polymer membranes.
Essence™ is the central control environment for CLARA, integrating imaging, navigation, and analysis tools.
Customizable multi-user interface with task-focused layouts
Live 3D collision model for safe stage movements
Automated beam alignment and autofocus routines
Integrated workflows for imaging and analytical techniques
This is more than information; it's an advantage. We've compiled our technical whitepapers, detailed product flyers, and on-demand webinars to provide you with the knowledge that makes a real difference. Sign up now to access the insights you need to make an impact.
|
Electronoptics & imaging
|
BrightBeam™ FE-SEM column with beam deceleration |
|---|---|
|
Axial and MD In-Column detectors |
|
|
Resolution: 0.8 nm @ 30 keV (STEM), 0.9 nm @ 15 keV, 1.3 nm @ 1 keV, 1.2 nm with beam deceleration, 1.5 nm @ 500 eV |
|
|
Magnification: 1× to 2,000,000× |
|
|
High-speed beam blanker |
|
|
Vacuum system
|
High vacuum mode |
|
MultiVac™ low vacuum mode including N2 and H2O up to 500 Pa |
|
|
Automated aperture insertion |
|
|
Stage & chamber
|
5-axis motorized stage |
|
Max sample size: 335 × 280 × 133 mm |
|
|
Max load: up to 8 kg |
|
|
20 chamber ports for detector integration |
|
|
Navigation & protection
|
Wide Field Optics™ (navigation from 1×) |
|
Essence™ 3D Collision Model |
|
|
Software & automation
|
Tescan Essence™ interface with multi-user support |
|
Automated beam alignment and In-FlightBeam Tracing™ |
|
|
VisualCoder™ no-code automation* |
|
|
SEM Expert PI Python interface* |
|
|
Raman, tensile, and heating stage integration* |
|
|
*Optional features are available |
|
Electronoptics & imaging
|
|---|
|
BrightBeam™ FE-SEM column with beam deceleration |
|
Axial and MD In-Column detectors |
|
Resolution: 0.8 nm @ 30 keV (STEM), 0.9 nm @ 15 keV, 1.3 nm @ 1 keV, 1.2 nm with beam deceleration, 1.5 nm @ 500 eV |
|
Magnification: 1× to 2,000,000× |
|
High-speed beam blanker |
|
Vacuum system
|
|---|
|
High vacuum mode |
|
MultiVac™ low vacuum mode including N2 and H2O up to 500 Pa |
|
Automated aperture insertion |
|
Stage & chamber
|
|---|
|
5-axis motorized stage |
|
Max sample size: 335 × 280 × 133 mm |
|
Max load: up to 8 kg |
|
20 chamber ports for detector integration |
|
Navigation & protection
|
|---|
|
Wide Field Optics™ (navigation from 1×) |
|
Essence™ 3D Collision Model |
|
Software & automation
|
|---|
|
Tescan Essence™ interface with multi-user support |
|
Automated beam alignment and In-FlightBeam Tracing™ |
|
VisualCoder™ no-code automation* |
|
SEM Expert PI Python interface* |
|
Raman, tensile, and heating stage integration* |
|
*Optional features are available |
Tescan
Libušina třída 21
623 00 Brno
Czech Republic
No distributors found.