Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods.
The demand for nanoscale material characterization is growing, yet most analytical STEM platforms struggle to balance routine usability with full analytical flexibility. Tescan TENSOR changes that situation.
Designed from the ground up for multimodal analytical STEM including precession-assisted 4D-STEM, TENSOR offers a unified solution that accommodates every user: from operators focused on fast, reproducible data to developers building next-generation measurement techniques.
Through the Explore™ and ExpertPI™ software suites, users gain intuitive access to automated workflows or full instrument control, with seamless data export and Python-based scripting. Whether for studying crystallinity, grain distributions, internal strain, or novel structures in new materials, Tescan TENSOR streamlines research workflows now and into the future.
A fully integrated analytical scanning transmission electron microscope that captures STEM imaging, electron diffraction, and EDS data simultaneously for multimodal nanoscale characterization.
Identify structurally similar crystalline phases with Tescan TENSOR by combining synchronized 4D-STEM and EDX for precise and reliable phase mapping.
Multimodal 4D-STEM and EDX characterization of metal particles at the nanoscale.
Use Tescan TENSOR™ with real-time precession and a hybrid-pixel detector to deliver precise, reproducible 4D-STEM diffraction data in complex nanoscale devices.
Crystallographic analysis of deformation cells and kink bands using TESCAN TENSOR.
This workflow combines 3D electron diffraction and 4D-STEM to identify and validate a secondary phase in thermoelectric Cu-rich sulfide ceramics — all from the same sample lamella.
Solve crystal structures including hydrogens at sub-Angstrom resolution with precession-assisted 3D-ED workflow on Tescan TENSOR.
