WEBINAR | From Infrastructure to Impact: EM & Micro-CT in Materials Core Facilities

REGISTER NOW

Streamline Analytical STEM Workflows for 4D‑STEM and Electron Diffraction with Tescan

Use Tescan TENSOR with integrated beam precession to perform analytical STEM measurements either with existing automated workflows or develop new workflows with own advanced methods. 

Get in touch
hero
hero
Unlocked content

Implement Custom Analytical STEM and Electron Diffraction Workflows with ExpertPI in Python

The demand for nanoscale material characterization is growing, yet most analytical STEM platforms struggle to balance routine usability with full analytical flexibility. Tescan TENSOR changes that situation.

Designed from the ground up for multimodal analytical STEM including precession-assisted 4D-STEM, TENSOR offers a unified solution that accommodates every user: from operators focused on fast, reproducible data to developers building next-generation measurement techniques.

Through the Explore™ and ExpertPI™ software suites, users gain intuitive access to automated workflows or full instrument control, with seamless data export and Python-based scripting. Whether for studying crystallinity, grain distributions, internal strain, or novel structures in new materials, Tescan TENSOR streamlines research workflows now and into the future.

Why Choose TENSOR

for 4D-STEM Research?

01
Root of the Problem

Advanced STEM Is Too Often Segmented

Many electron microscopes offer STEM capabilities, but few integrate them in a way that supports both routine operation and analytical methods development. Existing platforms often rely on fragmented software environments, limiting access to core functions and requiring complex coordination between hardware modules.

For emerging applications such as 4D-STEM, differential phase contrast, or ptychography, these limitations restrict method development and constrain the speed of data acquisition. Users are forced to choose between simplified tools or full but cumbersome access at highly experimental setups, an unsustainable compromise in multi-user and multi-application labs. 

02
Materials and Methods

Explore™ and ExpertPI™ in Action

Tescan TENSOR introduces a new model of an analytical STEM platform, featuring two distinct software environments:

Explore™: Designed for general users, this interface includes automatic microscope alignment, high-resolution ROI navigation, and pre-configured measurement modes (e.g., 4D-STEM Orientation/Phase Mapping, Strain Mapping, EDS Tomography). Data can be processed on-the-fly and exported in standard formats (e.g., HDF5) for compatibility with external tools and software packages.

ExpertPI™: Provides unrestricted access to all microscope functions via a customizable Python-based interface. Researchers can script and test new acquisition routines, integrate third-party data processing tools (such as LiberTEM, py4Dstem, or HyperSpy) and build new workflows for advanced STEM experiments 

03
Results and Discussion

Productivity Meets Precision

Tescan TENSOR successfully bridges the usability gap in electron diffraction STEM analysis. Labs benefit from faster dataset acquisition and reduced downtime, while expert users gain complete experimental freedom. The ability to switch optical modes within seconds means that multiple advanced measurements can be run on a single sample without reconfiguration. The open API environment allows for the integration of external Python functions and packages into custom analytical STEM workflows.

Outcomes include:

01

Higher experiment throughput in routine imaging environments

02
Reliable, reproducible datasets for orientation, strain, and phase mapping
03
Full compatibility with modern Python-based 4D-STEM analysis tools
04
Long-term adaptability through custom interface development

With Explore™ and ExpertPI™ working in parallel, TENSOR enables a complete STEM ecosystem, supporting today’s workflows while empowering tomorrow’s innovations.

GET IN Touch

Contact us

Get the most out of Tescan

This is more than information; it's an advantage. We've compiled our technical whitepapers, detailed product flyers, and on-demand webinars to provide you with the knowledge that makes a real difference. Sign up now to access the insights you need to make an impact.

Tescan Instruments & Technology

Used in This Workflow

Tescan TENSOR

A fully integrated analytical scanning transmission electron microscope that captures STEM imaging, electron diffraction, and EDS data simultaneously for multimodal nanoscale characterization.

  • Precession-assisted 4D-STEM for high-quality electron diffraction datasets

  • Seamlessly automated alignments and on-the-fly processing for interactive sample analysis

  • ExpertPI environment for new method development with complete microscope control and Python open API.
TENSOR_1

Explore more solutions

Improved Accuracy in Phase Attribution

Improving 4D-STEM Phase Mapping with Correlated EDX Signals

Identify structurally similar crystalline phases with Tescan TENSOR by combining synchronized 4D-STEM and EDX for precise and reliable phase mapping.

Read more
Resolve Composition and Crystallinity

Structural and Chemical Analysis of Encapsulated Nanoparticles in Carbon Nanotubes

 Multimodal 4D-STEM and EDX characterization of metal particles at the nanoscale.

Read more
Streamline 4D-STEM Workflows with Integrated Navigation and Processing

Enable High-Precision 4D-STEM Measurements with Beam Precession

Use Tescan TENSOR™ with real-time precession and a hybrid-pixel detector to deliver precise, reproducible 4D-STEM diffraction data in complex nanoscale devices.

Read more

Nanoscale Orientation Mapping in Deformed Ni-Based Superalloys

 Crystallographic analysis of deformation cells and kink bands using TESCAN TENSOR.

Read more
Analyze the Distribution of Unknown Phases

Phase and Orientation Analysis of Cu-Rich Sulfide Ceramics Using 3D ED and 4D-STEM on a Single Lamella

This workflow combines 3D electron diffraction and 4D-STEM to identify and validate a secondary phase in thermoelectric Cu-rich sulfide ceramics — all from the same sample lamella.

Read more

Atomic Structure Determination of Nanocrystals Using Precession Electron Diffraction Tomography (PEDT)

Solve crystal structures including hydrogens at sub-Angstrom resolution with precession-assisted 3D-ED workflow on Tescan TENSOR.

Read more

GET IN Touch

Contact us
map

Where can you find us:

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic

info@Tescan.com 

130405923 us US 37.09024 -95.712891 25.3575 29.349345 20.67957527 42.082797 39.91384763 -33.693421 13.93320106 3.039986586 31.997988 38.050985 47.579533 48.1485965 58.375799 54.663142 19.195447 56.975106 50.493053 45.868592 10.79556993 44.35660598 43.2371604 55.536415 14.557577179752773 32.100937 -6.116829 -6.212299277967318 23.7104 -33.471062 31.998740087 -23.69149395 43.462349 51.529848 49.1893523 49.197486 25.072375 31.075811 1.299027 40.676979 52.30150662 51.013813 35.684121 37.479653 52.246622 40.581349 39.911632 -26.1811371 41.818215 33.429928

No distributors found.