Streamline Large-Area 2D and 3D Characterization
Use high-current Xe plasma FIB for efficient analysis of large regions with precision polishing, even in challenging materials.
Tescan AMBER X 2 FIB-SEM for Fast, Flexible 2D and 3D Materials Characterization
Tescan AMBER X 2 is designed to keep pace with the realities of modern materials research. Whether you’re characterizing large volumes of steel and alloys, fragile interfaces, or beam-sensitive materials, AMBER X 2 enables you to go further, faster, and with precision that scales across sample types.
Built around the high-performance Mistral™ plasma FIB and BrightBeam™ field-free SEM, this platform delivers high-resolution insights at every step of your workflow.
- Multimodal 2D/3D analysis across a wide array of materials, from metals, ceramics, and polymers to energy-related and other advanced materials
- Fast artifact-free cross-sectioning with high beam currents and optimized beam profiles
- Concurrent acquisition of EBSD or EDS, and ToF-SIMS data during 3D tomography for combined structural, chemical, and isotopic information
for 2D and 3D Materials Characterization?
Faster Large Area Study with Tescan AMBER X 2 for High-Throughput FIB-SEM cross-sectioning
Accelerate your time-to-data with optimized plasma FIB milling, demonstrated on silicon carbide cross-sectioning.
Low-Damage EBSD Sample Preparation with Plasma FIB-SEM and Low Angle Polishing
Prepare deformation-free, large-area surfaces for reliable EBSD analysis, even in complex, multi-phase materials.
Porosity Mapping in Fiber-Reinforced Ceramics with A Multiscale 3D Imaging Approach from Micro to Nano
Combined 3D imaging techniques reveal multiscale porosity patterns and their structural impact in HA-ZrO₂ fiber-reinforced ceramics.
Plasma FIB Sample Preparation for In-Situ Synchrotron Studies of Additively Manufactured Alloys
Ga+-free large-area sample preparation enables dynamic examination of precipitation expansion in Al-Mn-Cr-Zr alloys during material heat treatment
Smart Oxygen Injection for Selective Milling
Targeted oxygen injection enhances surface contrast and reduces curtaining during high-resolution cross-sectioning of carbon materials.
Essence™ 3D FIB-SEM Multimodal Tomography
This module synchronizes SEM, EDS, EBSD, and ToF-SIMS into a single acquisition routine, making full-volume, multi-channel analysis easier and more consistent.
TESCAN AutoSection™
Automate cross-sectioning workflows with precise control over milling depth, geometry, and sequence. Ideal for routine or multi-sample throughput.
Essence™ Low-Angle Polishing
Preserve structural integrity while polishing samples with fine features or sensitive interfaces. Designed to reduce curtaining and improve surface flatness for EBSD and STEM.
Each software module is fully integrated into the Essence™ environment, ensuring a smooth learning curve and reproducibility across users and applications.
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"Tescan AMBER X 2, our latest innovation in materials analysis technology. The AMBER X 2, with its advanced Plasma FIB-SEM capabilities, offers unmatched speed, precision, and versatility, setting a new standard in the field."
PETR KLIMEK
PRODUCT MARKETING DIRECTOR
MATERIAL & GEO SCIENCE
TESCAN
PRODUCT MARKETING DIRECTOR
MATERIAL & GEO SCIENCE
TESCAN
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Specifications for 2D/3D Materials Characterization
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