Tescan AMBER X 2
Engineered for advanced sample preparation in beam-sensitive or compositionally complex materials, the AMBER X supports targeted contrast enhancement workflows with ultra-high-resolution imaging.
- Xe⁺ plasma FIB enables trenching and polishing of nanocomposites – without structural distortion
- Integrates with OptiGIS O2 module for improved imaging of carbon-rich materials
- Field-free SEM column delivers enhanced topographical and phase contrast at low kV






