Tescan SOLARIS 2 | Automated FIB-SEM for TEM Lamella Preparation
Automated TEM Lamella Preparation for Consistent, High-Throughput Results
Fully automated TEM sample preparation for fast, consistent lamella production
AI-Driven TEM Sample Preparation -
Tescan TEM AutoPrep™ Pro
Prepare high-quality TEM samples with guided automation, AI-assisted workflows, and reliable, repeatable results across materials and users, and FIB-SEM experience levels.
Tescan TEM AutoPrep™ Pro brings automation and consistency to TEM sample preparation by guiding users through every critical step of the workflow, from site selection and trench milling to lift-out, thinning, and final low-keV cleaning. By reducing manual intervention and operator-dependent variability, it helps laboratories achieve reproducible lamella quality while making advanced FIB-SEM preparation workflows more accessible.
Fully integrated within Tescan Gallium and Plasma FIB-SEM platforms, TEM AutoPrep™ Pro enables both experienced users and newer operators to prepare high-quality TEM samples with greater confidence and efficiency. Advanced automation routines, supported by machine learning techniques and locally trained AI models, help streamline complex preparation tasks that traditionally required significant FIB-SEM expertise and training.
The latest TEM AutoPrep™ Pro capabilities now include automated preparation of inverted and plan-view TEM lamella geometries, expanding the range of accessible workflows for advanced materials characterization.
With support for unattended and overnight operation, the system helps increase microscope utilization, improve sample throughput, and reduce cost per sample.
In one glance
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End-to-end TEM preparation workflow: Automates key steps including trenching, lift-out, thinning, and final polishing.
- Automated advanced lamella geometries: Supports automated preparation of standard, inverted, and plan-view TEM lamellae.
- Consistent, reproducible results: Guided workflows help deliver uniform sample quality across users and experience levels.
- Reduced operator dependency: AI-assisted automation minimizes manual intervention and makes complex FIB-SEM workflows more accessible.
- Higher microscope utilization: Enables unattended or overnight preparation to increase throughput during nights and weekends.
- Integrated for Gallium and Plasma FIB-SEM platforms: Designed to support efficient sample preparation across TESCAN FIB-SEM systems.
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Tescan AMBER 2 | Advanced FIB-SEM for Automated TEM Prep and Nanoscale Characterization
Advanced FIB-SEM for Automated Sample Preparation, Nanoscale Characterization and Nanoprototyping
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