Designed for advanced material nanocharacterization
The fully retractable,SEM chamber-integrated 4D-STEM detector enables ultra-high-resolution nanoscale characterization for advanced materials science applications.
Designed to significantly extend the analytical capabilities of conventional SEM, the 4D-STEM detector provides both spatial and diffraction information at the level required for analyses of individual nanoparticles and nanotubes, without the need of sample transfer to a dedicated TEM.
Subsequent post-processing of 4D-STEM datasets delivers detailed insight into material structure, orientation mapping, and phase composition, making advanced material characterization faster and more accessible.
Moreover, the acquired datasets support repeated analysis without the need for sample remeasurement and are fully compatible with open-source software, enabling users to develop their own analysis methodologies.
With an integrated 4D-STEM detector, the SEM Tescan MIRA™ and Tescan CLARA™ offer robust and versatile platforms for a wide range of materials science workflows and applications.
High-resolution imaging
STEM imaging mode enables sub-nanometer-resolution sample evaluation, providing accurate crystallographic information and supporting multidimensional analysis across a wide range of materials, including individual nanofibers, particles, or 2D materials.
In addition, SEMs operate at lower accelerating voltages (30 keV and below) than conventional TEMs, making them particularly well suited for beam-sensitive samples.
Extended analytical capabilities
The 4D-STEM detector enables advanced nanoscale characterization, including phase composition and crystal orientation, directly within the SEM, eliminating the need for sample transfer to a dedicated TEM.
Acquired 4D-STEM datasets can be reprocessed multiple times and are fully compatible with open-source analysis software such as LiberTEM, py4DSTEM, and pixStem. This offers flexibility in the development of new analysis methodologies and customized data-processing workflows for specific applications.
Flexible imaging contrast selection
Virtual apertures enable live-view acquisition and allow users to define custom bright-field and dark-field regions by selecting arbitrary angular ranges directly in Tescan Essence™ software, supporting flexible, application-specific contrast optimization and enhanced imaging capabilities.
Seamless integration
Full hardware and software integration of the retractable 4D-STEM detector in MIRA™ and CLARA™ platforms ensures intuitive, safe operation and seamless workflow control. Insertion and retraction of the detector are controlled with a single click in Tescan Essence™ software.
