Lehigh Microscopy School 2026 | SEM, FIB & TEM Training       

Dr. Lucille Giannuzzi is an internationally recognized expert in focused ion beam (FIB) technology and electron microscopy. She is the inventor of the EXpressLO system, which significantly advanced TEM specimen preparation workflows. A Fellow of AVS, MSA, and MAS, she has authored more than 100 scientific publications and is widely respected for her contributions to FIB methodology, sample preparation, and microscopy education. At the Lehigh Microscopy School, she provides hands-on instruction in FIB techniques, bridging advanced theory with practical application.

Jack Mershon is an Applications Engineer at Tescan, specializing in scanning electron microscopy (SEM) and practical imaging workflows. He works closely with researchers and industry users to support instrument operation, method development, and application-driven microscopy solutions. At the Lehigh Microscopy School, he leads SEM training sessions, helping participants build confidence in imaging techniques, data interpretation, and real-world analytical workflows.