About the Lehigh Microscopy School
The Lehigh Microscopy School is a well-established microscopy training program designed for researchers and technical professionals. The curriculum focuses on scanning electron microscopy (SEM), focused ion beam (FIB), and transmission electron microscopy (TEM), combining lectures with practical lab sessions.
Participants include professionals from national labs, government organizations, universities, and industry, creating a technically focused environment centered on applied microscopy and skill development.
Tescan at Lehigh Microscopy School 2026
Tescan participates as a sponsor and training contributor, supporting the program’s educational activities.
Tescan experts contribute directly to the training program:
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Dr. Lucille Giannuzzi (Tescan Business Development Manager) serves as a focused ion beam (FIB) instructor
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Jack Mershon (Tescan Applications Engineer) serves as a scanning electron microscopy (SEM) instructor
Their instruction includes practical guidance on instrument operation, sample preparation, and application-focused workflows.
Tescan will also present the Tescan VEGA scanning electron microscope, with a focus on routine SEM analysis, materials characterization, and imaging workflows.
Training Program Overview
The program is organized by Lehigh University and includes the following training modules:
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Focused Ion Beam (FIB): Instrumentation and Applications
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Introduction to SEM and EDS for the New Operator - 1 day only
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Main SEM & X-ray Microanalysis Course
What You Will Learn
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Fundamentals of SEM, FIB, and TEM operation
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Practical microscopy workflows for materials analysis
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Imaging techniques and contrast mechanisms
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Sample preparation strategies for electron microscopy
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Application of microscopy in research and industrial settings
Who Should Attend
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Researchers using electron microscopy techniques
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Materials scientists and engineers
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Lab technicians and microscopy operators
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Professionals from national labs, universities, and industry
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Users seeking hands-on SEM, FIB, or TEM training
Why Attend
This program offers structured, hands-on microscopy training combined with direct interaction with instrument specialists. Participants gain practical skills that can be applied immediately in SEM and FIB-based workflows.
Registration
Lehigh University manages registration. For full program details and enrollment, refer to the official Lehigh Microscopy School website.
