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FIB-SEM User Meeting 2026 

Hands-on Training. Expert Instruction. Practical Results.

Tescan will participate in the FIB-SEM User Meeting, taking place 8-9 April 2026 at Johns Hopkins University, Laurel, MD, USA. The meeting brings together researchers, industry experts, and technology specialists to exchange knowledge and explore the latest developments in focused ion beam–scanning electron microscopy (FIB-SEM). 

The programme includes user presentations, technology updates, and discussions covering advanced sample preparation, 3D tomography, automation, and high-resolution characterisation. 

08 - 09 April 2026
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Tescan at the Event

Tescan will join as both sponsor and speaker, contributing practical expertise in advanced microscopy workflows and engaging with the global FIB-SEM community.

Visit our team during the event to discuss:

  • FIB-SEM systems and applications 
  • High-throughput and automated sample preparation 
  • 3D tomography and nanoscale characterization 
  • Advanced solutions including Tescan QuiiN™ and Tescan FemtoChisel™

Featured Presentations

High Throughput Sample Preparation in Microscopy 4.0 

Dr. Sina Shahbazmohamadi (UConn / Tescan)
8 April 2026 | 9:40 AM (Plenary) 

This presentation explores intelligent, automated, and connected approaches to sample preparation in Microscopy 4.0, focusing on improving throughput, consistency, and workflow integration. 

Enhanced S/TEM Specimen Preparation Using FIB and Tescan EXLO™

Dr. Lucille Giannuzzi (Tescan)
9 April 2026 | 11:20 AM 

This session focuses on advanced FIB-based specimen preparation techniques for S/TEM, highlighting precision workflows and innovations supporting high-quality analytical results.

What to Expect 

  • Insights into the latest FIB-SEM technologies and workflows 
  • Real-world applications across materials science, semiconductors, and life sciences 
  • Discussions on automation, 3D tomography, and high-resolution analysis  characterisation 
  • Opportunities to connect with experts and peers in the FIB-SEM community 

Who Should Attend

  • FIB-SEM users and microscopy specialists
  • Researchers in materials science, semiconductors, and life sciences
  • Facility managers and lab engineers
  • Industry professionals exploring advanced microscopy solutions

Register using the form below to receive confirmation and further details about Tescan’s participation at the FIB-SEM User Meeting, including how to connect with our team during the event. 

Our Speakers

Sina-Shahbazmohamadi
Dr. Sina Shahbazmohamadi
Dr. Sina Shahbazmohamadi is Head of Technology at Tescan, focusing on translating advanced engineering developments into practical solutions for semiconductor and materials science applications. With expertise in high-precision processing technologies and product strategy, he works at the intersection of innovation, application development, and customer workflows. 
Lucille Giannuzzi
Dr. Lucille A. Giannuzzi

Dr. Lucille Giannuzzi is an internationally recognized expert in focused ion beam technology and electron microscopy. She invented the EXpressLO system, transforming TEM specimen preparation. A Fellow of AVS, MSA, and MAS, she has authored over 100 publications and continues to advance the field through innovation and teaching. 

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Tescan at SEMICON Korea 2026

Booth D904

COEX Convention & Exhibition Center
513 Yeongdong-daero,
Gangnam-gu, Seoul 06164,
South Korea
semicon-korea-floor-plan