FIB-SEM User Meeting 2026 

Invited Keynote speaker Dr. Sina Shahbazmohamadi’s presentation emphasized that as microscopy evolves toward increasingly complex, multi-scale analysis, sample preparation has become a critical determinant of data quality and reliability. He highlighted the transition from conventional preparation methods to advanced techniques such as FIB and femtosecond laser processing, which enable seamless workflows from the micron to the nanoscale.

Aligned with the principles of Microscopy 4.0, his talk underscored the shift toward intelligent, automated, and connected sample preparation-driving higher throughput, improved reproducibility, and better integration with multi-modal characterization approaches.

Dr. Lucille Giannuzzi’s presentation examined FIB-SEM as the established standard for S/TEM specimen preparation, with a comparison between Ga⁺ FIB and plasma FIB technologies. She noted that Ga⁺ FIB remains a mature and cost-effective solution, offering smaller probe sizes, while ion-induced damage can be mitigated through hybrid workflows combining integrated broad-beam Ar⁺ ion milling.

She also highlighted recent advances in best-in-class Xe⁺ plasma FIB systems with enhanced automation, and implementation of both automated in situ and ex situ lift-out (INLO, EXLO) techniques to improve specimen quality and preparation efficiency

Key takeaways from Tescan’s participation:  

• Strong emphasis on automation and workflow efficiency
• Continued innovation in high-resolution 3D imaging and large-volume analysis 
• Clear alignment with user needs around ease of use, reproducibility, and throughput  
• Reinforcement of Tescan’s positioning in enabling application-specific solutions  

Overall, the meeting underscored the growing demand for integrated, automated FIB-SEM solutions and highlighted Tescan’s role in advancing both technology and application methodologies. 

Interested in learning more about Tescan’s FIB-SEM solutions and advanced microscopy workflows?

Explore our product portfolio to discover technologies supporting high-resolution imaging, sample preparation, and multi-modal analysis.

For specific questions or to discuss your application, contact our team.