WEBINAR | Correlated Microanalytical Workflows for Particle Analysis Using Automated Mineralogy, FIB-SEM and SIMS

High-throughput, artifact-free cross-sectioning with continuous visibility of the milling front, enabling accurate end-pointing, faster 3D tomography, and pristine results even at high FIB beam currents.

Tescan Rocking Stage

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The High beam currents offer fast milling, but in multiphase or multimaterial samples, they create severe curtaining and surface scratches; reducing the FIB beam current removes the artifacts but slows cross-sectioning and 3D tomography by 5–10×.

Tescan Rocking Stage solves this by enabling artifact-free FIB cross-sectioning and polishing at high beam currents, preserving speed while improving surface quality for failure analysis and advanced material characterization. By tilting the cross-section plane during milling, the Rocking Stage offsets curtaining caused by different sputtering rates, surface topography, and sample inhomogeneity.

At the same time, continuous SEM imaging provides live monitoring and precise end-pointing throughout the milling process. The design preserves full FIB-SEM versatility and is compatible with loadlocks, Beam Deceleration Mode (BDM), and the RSTEM detector, accommodating a variety of samples, including flat samples such as foils and rubber parts, as well as tall resin-embedded blocks.

  • High-current milling without artifacts thanks to controlled rocking of the cross-section plane, eliminating curtaining in multiphase and multimaterial samples.


  • Continuous SEM visibility of the milling front for precise end-pointing and real-time quality control; no need to stop, rotate, or switch positions.


  • True high-throughput 3D tomography by maintaining high beam currents throughout the entire tomography cycle, avoiding the 5–10× slowdown typical of lower-current polishing.


  • Consistent, pristine surface finish even on challenging geometries, variable milling rates, or embedded structures.


  • Full compatibility with standard FIB-SEM workflows without sacrificing chamber space, detectors, or automation options.

Where Tescan Rocking Stage Makes the Difference

High-current milling without the usual sample damage

Multiphase and multimaterial samples show milled surface damage (such as curtains, scratches) under high FIB beam currents, forcing users to switch to slow, low-current fine polishing. The Rocking Stage enables high-current milling while suppressing curtaining, preserving full milling speed without compromising on milled surface quality.  

Stable cross-sections for complex, real-world samples 

By continuously varying the milling angle, the Rocking Stage compensates for differences in sputtering rates, buried interfaces, and topographic steps. This produces uniform, artifact-free cross-sections even in samples that traditionally require long, gentle polishing cycles.

True high-throughput 3D tomography

High beam currents can be maintained throughout the entire FIB-SEM tomography acquisition, users achieve fast, clean, and repeatable slice series with pristine surface quality  even on challenging device architectures or multiphase materials science samples.

Continuous SEM feedback for precise control

Unlike other movable rocking techniques, Tescan rocking stage maintains a live SEM view directly into the evolving cross-section, allowing real-time quality assessment and precise end-pointing without interrupting the milling process by sample repositioning.

Advanced Performance

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AI-powered automated workflow

The AI-driven automated lamella preparation reduces human error, shortens training time, and enables reliable unattended operation. The automation is realized through the TEM AutoPrep™ Pro software module and the OptiLift™ nanomanipulator, forming a fully integrated system that delivers fast lamella preparation while ensuring consistent quality.

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Ultimate quality of TEM lamellae 

A fully integrated Aura™ Gentle Ion Beam enables precise final polishing and gentle low-keV Ar⁺ cleaning of TEM lamellae directly inside the AMBER 2 FIB-SEM, minimizing amorphous damage and surface Ga+ contamination.

This built-in solution provides direct, real-time control over the polishing process, ensuring the highest sample quality and optimal results in TEM lamellae preparation, even for the most challenging materials. 

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Tescan Rocking Stage

Technical highlights
Fully integrated control within Tescan Essence™ software

Compatible with loadlocks, Beam Deceleration Mode (BDM), and RSTEM detector

Supports large or flat samples including foils (up to 5 cm × 2 cm²), rubber parts, and resin-embedded metallographic samples

Fully integrated control within Tescan Essence™ software

Compatible with loadlocks, Beam Deceleration Mode (BDM), and RSTEM detector

Supports large or flat samples including foils (up to 5 cm × 2 cm²), rubber parts, and resin-embedded metallographic samples

rocking-stage

GET IN Touch

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Where you can find us:

Tescan Brno
Libušina třída 21
623 00 Brno
Czech Republic



info@Tescan.com 

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